Folgen
Rong Su
Titel
Zitiert von
Zitiert von
Jahr
Perspectives of mid-infrared optical coherence tomography for inspection and micrometrology of industrial ceramics
R Su, M Kirillin, EW Chang, E Sergeeva, SH Yun, L Mattsson
Optics express 22 (13), 15804-15819, 2014
1132014
On tilt and curvature dependent errors and the calibration of coherence scanning interferometry
R Su, Y Wang, J Coupland, R Leach
Optics Express 25 (4), 3297-3310, 2017
952017
Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry
C Gomez, R Su, A Thompson, J DiSciacca, S Lawes, RK Leach
Optical Engineering 56 (11), 111714, 2017
882017
Metrological characteristics for the calibration of surface topography measuring instruments: a review
R Leach, H Haitjema, R Su, A Thompson
Measurement Science and Technology 32 (3), 032001, 2020
612020
Mid-infrared Fourier-domain optical coherence tomography with a pyroelectric linear array
I Zorin, R Su, A Prylepa, J Kilgus, M Brandstetter, B Heise
Optics express 26 (25), 33428-33439, 2018
522018
Lens aberration compensation in interference microscopy
R Su, M Thomas, M Liu, J Drs, Y Bellouard, C Pruss, J Coupland, R Leach
Optics and Lasers in Engineering 128, 106015, 2020
452020
Scattering and three-dimensional imaging in surface topography measuring interference microscopy
R Su, J Coupland, C Sheppard, R Leach
JOSA A 38 (2), A27-A42, 2021
442021
Noise reduction in coherence scanning interferometry for surface topography measurement
C Gomez, R Su, P De Groot, R Leach
Nanomanufacturing and Metrology 3, 68-76, 2020
422020
On-machine surface defect detection using light scattering and deep learning
M Liu, CF Cheung, N Senin, S Wang, R Su, R Leach
JOSA A 37 (9), B53-B59, 2020
402020
Effects of defocus on the transfer function of coherence scanning interferometry
R Su, M Thomas, R Leach, J Coupland
Optics Letters 43 (1), 82-85, 2018
382018
Physics-based virtual coherence scanning interferometer for surface measurement
R Su, R Leach
Light: Advanced Manufacturing 2 (1), 1-16, 2021
372021
Modeling of interference microscopy beyond the linear regime
M Thomas, R Su, N Nikolaev, J Coupland, RK Leach
Optical Engineering 59 (3), 034110, 2020
362020
Crystallographic texture can be rapidly determined by electrochemical surface analytics
A Speidel, R Su, J Mitchell-Smith, P Dryburgh, I Bisterov, D Pieris, W Li, ...
Acta Materialia 159, 89-101, 2018
362018
High-precision lateral distortion measurement and correction in coherence scanning interferometry using an arbitrary surface
P Ekberg, R Su, R Leach
Optics express 25 (16), 18703-18712, 2017
362017
Optical coherence tomography for quality assessment of embedded microchannels in alumina ceramic
R Su, M Kirillin, P Ekberg, A Roos, E Sergeeva, L Mattsson
Optics express 20 (4), 4603-4618, 2012
362012
Residual flatness and scale calibration for a point autofocus surface topography measuring instrument
G Maculotti, X Feng, R Su, M Galetto, RK Leach
Measurement Science and Technology 30, 075005, 2019
322019
Optical measurement of surface topographies with transparent coatings
X Feng, N Senin, R Su, S Ramasamy, R Leach
Optics and Lasers in Engineering 121, 261-270, 2019
312019
Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing
X Feng, R Su, T Happonen, J Liu, R Leach
Optics express 26 (11), 13927-13937, 2018
232018
Correlative infrared optical coherence tomography and hyperspectral chemical imaging
I Zorin, R Su, B Heise, B Lendl, M Brandstetter
JOSA A 37 (9), B19-B26, 2020
222020
A Gaussian process and image registration based stitching method for high dynamic range measurement of precision surfaces
MY Liu, CF Cheung, CH Cheng, R Su, RK Leach
Precision Engineering 50, 99-106, 2017
222017
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20