Kwang-Ting (Tim) Cheng
Kwang-Ting (Tim) Cheng
Chair Professor of ECE and CSE, HKUST
Bestätigte E-Mail-Adresse bei ust.hk - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Fast human detection using a cascade of histograms of oriented gradients
Q Zhu, MC Yeh, KT Cheng, S Avidan
2006 IEEE Computer Society Conference on Computer Vision and Pattern …, 2006
22692006
A partial scan method for sequential circuits with feedback
KT Cheng, VD Agrawal
IEEE Transactions on Computers 39 (4), 544-548, 1990
4431990
Delay fault testing for VLSI circuits
A Krstic, KTT Cheng
Springer Science & Business Media, 1998
4241998
Automatic functional test generation using the extended finite state machine model
KT Cheng, AS Krishnakumar
30th ACM/IEEE Design Automation Conference, 86-91, 1993
3891993
Path sensitization in critical path problem (logic circuit design)
HC Chen, DHC Du
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1993
3161993
Electronic design automation: synthesis, verification, and test
LT Wang, YW Chang, KTT Cheng
Morgan Kaufmann, 2009
2542009
Bi-real net: Enhancing the performance of 1-bit cnns with improved representational capability and advanced training algorithm
Z Liu, B Wu, W Luo, X Yang, W Liu, KT Cheng
Proceedings of the European conference on computer vision (ECCV), 722-737, 2018
2492018
Biocompatible and totally disintegrable semiconducting polymer for ultrathin and ultralightweight transient electronics
T Lei, M Guan, J Liu, HC Lin, R Pfattner, L Shaw, AF McGuire, TC Huang, ...
Proceedings of the National Academy of Sciences 114 (20), 5107-5112, 2017
2392017
Automatic generation of functional vectors using the extended finite state machine model
KT Cheng, AS Krishnakumar
ACM Transactions on Design Automation of Electronic Systems (TODAES) 1 (1 …, 1996
2131996
Formal equivalence checking and design debugging
SY Huang, KTT Cheng
Springer Science & Business Media, 2012
2102012
A BIST scheme for on-chip ADC and DAC testing
JL Huang, CK Ong, KT Cheng
Proceedings of the conference on Design, automation and test in Europe, 216-220, 2000
2102000
Classification and identification of nonrobust untestable path delay faults
KT Cheng, HC Chen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996
2071996
False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation
JJ Liou, A Krstic, LC Wang, KT Cheng
Proceedings of the 39th annual Design Automation Conference, 566-569, 2002
2052002
Delay testing for non-robust untestable circuits
KT Cheng, HC Chen
Proceedings of IEEE International Test Conference-(ITC), 954-961, 1993
1941993
Pseudo-CMOS: A design style for low-cost and robust flexible electronics
TC Huang, K Fukuda, CM Lo, YH Yeh, T Sekitani, T Someya, KT Cheng
IEEE Transactions on Electron Devices 58 (1), 141-150, 2010
1932010
Perturb and simplify: Multilevel boolean network optimizer
SC Chang, M Marek-Sadowska, KT Cheng
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996
1811996
Delay-fault test generation and synthesis for testability under a standard scan design methodology
KT Cheng, S Devadas, K Keutzer
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1993
1811993
Local difference binary for ultrafast and distinctive feature description
X Yang, KTT Cheng
IEEE transactions on pattern analysis and machine intelligence 36 (1), 188-194, 2013
1802013
Fast statistical timing analysis by probabilistic event propagation
JJ Liou, KT Cheng, S Kundu, A Krstic
Proceedings of the 38th Design Automation Conference (IEEE Cat. No …, 2001
1762001
Joint segment-level and pixel-wise losses for deep learning based retinal vessel segmentation
Z Yan, X Yang, KT Cheng
IEEE Transactions on Biomedical Engineering 65 (9), 1912-1923, 2018
1732018
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20