Robert Chivas
Robert Chivas
Varioscale Inc
Bestätigte E-Mail-Adresse bei varioscale.com
Titel
Zitiert von
Zitiert von
Jahr
Visible Light LVP on Bulk Silicon Devices.
J Beutler, JJ Clement, EI Cole, J Stevens, VC Hodges, S Silverman, ...
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2015
172015
Synthesis and photoluminescence of ultra-pure germanium nanoparticles
R Chivas, S Yerci, R Li, L Dal Negro, TF Morse
Optical Materials 33 (11), 1829-1832, 2011
142011
Steps toward automated deprocessing of integrated circuits
EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ...
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing …, 2017
132017
High definition scintillation detector for medicine, homeland security and non-destructive evaluation
TF Morse, R Gupta, CB Roberts, RD Chivas
US Patent 8,477,906, 2013
112013
Contactless fault isolation for FinFET technologies with visible light and GaP SIL
H Lohrke, P Scholz, A Beyreuther, U Ganesh, E Uhlmann, S Kühne, ...
Proceedings of the 42nd International Symposium for Testing and Failure Analysis, 2016
102016
Adaptive grinding and polishing of silicon integrated circuits to ultrathin remaining thickness
R Chivas, S Silverman, M DiBattista
41st International Symposium for Testing and Failure Analysis. ASM, 2015
92015
Plasma FIB deprocessing of integrated circuits from the backside
EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ...
FICS Research Annual Conference on Cybersecurity, 2017
82017
Laser-Assisted Chemical Polishing of Silicon (112) Wafers
N Dandekar, R Chivas, S Silverman, X Kou, M Goorsky
Journal of electronic materials 41 (10), 2790-2794, 2012
42012
Adaptive grinding and polishing of packaged integrated circuits
R Chivas, S Silverman
2014 IEEE International Reliability Physics Symposium, FA. 4.1-FA. 4.6, 2014
32014
Preparation of Wafer Level Packaged Integrated Circuits using Pulsed Laser Assisted Chemical Etching
R Chivas, N Dandekar, S Silverman, R Cruz, M DiBattista
Proceedings for the 38th International Symposium for Testing and Failure …, 2012
32012
Electrical Invasiveness of Grinding and Polishing Silicon Integrated Circuits down to 1 um Remaining Silicon Thickness
R Chivas, S Silverman, M DiBattista, U Kindereit
42nd International Symposium for Testing and Failure Analysis, 178-183, 2016
22016
Fast, Full Chip Image Stitching of Nanoscale Integrated Circuits
D Zhang, G van der Wal, P Miller, D Stoker, E Matlin, N Marri, G Gan, ...
SRI International Princeton United States, 2019
12019
Pulsed Laser Assisted Chemical Etch for analytic surface preparation
R Chivas, S Silverman, N Dandekar
2012 IEEE International Reliability Physics Symposium (IRPS), 2D. 6.1-2D. 6.8, 2012
12012
Steps Toward Computational Guided Deprocessing of Integrated Circuits
EL Principe, R Chivas, M DiBattista, S Silverman, N Asadizanjani, D Forte, ...
Synchrotron Research, Incorporated Melbourne Beach United States, 2018
2018
Photo: What a difference a micron makes.
J Beutler, KD Greth, S Silverman, R Chivas
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2015
2015
Visible Light LVP on Bulk Silicon Substrates.
J Beutler, EI Cole, JJ Clement, J Stevens, VC Hodges, S Silverman, ...
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2015
2015
Aerosol deposition process for synthesizing optically active nano-scale materials
RD Chivas
Dissertation Abstracts International 68 (04), 2007
2007
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