| Visible Light LVP on Bulk Silicon Devices. J Beutler, JJ Clement, EI Cole, J Stevens, VC Hodges, S Silverman, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2015 | 17 | 2015 |
| Synthesis and photoluminescence of ultra-pure germanium nanoparticles R Chivas, S Yerci, R Li, L Dal Negro, TF Morse Optical Materials 33 (11), 1829-1832, 2011 | 14 | 2011 |
| Steps toward automated deprocessing of integrated circuits EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ... ISTFA 2017: Proceedings from the 43rd International Symposium for Testing …, 2017 | 13 | 2017 |
| High definition scintillation detector for medicine, homeland security and non-destructive evaluation TF Morse, R Gupta, CB Roberts, RD Chivas US Patent 8,477,906, 2013 | 11 | 2013 |
| Contactless fault isolation for FinFET technologies with visible light and GaP SIL H Lohrke, P Scholz, A Beyreuther, U Ganesh, E Uhlmann, S Kühne, ... Proceedings of the 42nd International Symposium for Testing and Failure Analysis, 2016 | 10 | 2016 |
| Adaptive grinding and polishing of silicon integrated circuits to ultrathin remaining thickness R Chivas, S Silverman, M DiBattista 41st International Symposium for Testing and Failure Analysis. ASM, 2015 | 9 | 2015 |
| Plasma FIB deprocessing of integrated circuits from the backside EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ... FICS Research Annual Conference on Cybersecurity, 2017 | 8 | 2017 |
| Laser-Assisted Chemical Polishing of Silicon (112) Wafers N Dandekar, R Chivas, S Silverman, X Kou, M Goorsky Journal of electronic materials 41 (10), 2790-2794, 2012 | 4 | 2012 |
| Adaptive grinding and polishing of packaged integrated circuits R Chivas, S Silverman 2014 IEEE International Reliability Physics Symposium, FA. 4.1-FA. 4.6, 2014 | 3 | 2014 |
| Preparation of Wafer Level Packaged Integrated Circuits using Pulsed Laser Assisted Chemical Etching R Chivas, N Dandekar, S Silverman, R Cruz, M DiBattista Proceedings for the 38th International Symposium for Testing and Failure …, 2012 | 3 | 2012 |
| Electrical Invasiveness of Grinding and Polishing Silicon Integrated Circuits down to 1 um Remaining Silicon Thickness R Chivas, S Silverman, M DiBattista, U Kindereit 42nd International Symposium for Testing and Failure Analysis, 178-183, 2016 | 2 | 2016 |
| Fast, Full Chip Image Stitching of Nanoscale Integrated Circuits D Zhang, G van der Wal, P Miller, D Stoker, E Matlin, N Marri, G Gan, ... SRI International Princeton United States, 2019 | 1 | 2019 |
| Pulsed Laser Assisted Chemical Etch for analytic surface preparation R Chivas, S Silverman, N Dandekar 2012 IEEE International Reliability Physics Symposium (IRPS), 2D. 6.1-2D. 6.8, 2012 | 1 | 2012 |
| Steps Toward Computational Guided Deprocessing of Integrated Circuits EL Principe, R Chivas, M DiBattista, S Silverman, N Asadizanjani, D Forte, ... Synchrotron Research, Incorporated Melbourne Beach United States, 2018 | | 2018 |
| Photo: What a difference a micron makes. J Beutler, KD Greth, S Silverman, R Chivas Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2015 | | 2015 |
| Visible Light LVP on Bulk Silicon Substrates. J Beutler, EI Cole, JJ Clement, J Stevens, VC Hodges, S Silverman, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2015 | | 2015 |
| Aerosol deposition process for synthesizing optically active nano-scale materials RD Chivas Dissertation Abstracts International 68 (04), 2007 | | 2007 |
