Martin C. Schubert
Martin C. Schubert
Head of Department Quality Assurance, Characterization and Simulation, Fraunhofer ISE
Bestätigte E-Mail-Adresse bei
Zitiert von
Zitiert von
Photoluminescence imaging of silicon wafers
T Trupke, RA Bardos, MC Schubert, W Warta
Applied Physics Letters 89 (4), 044107, 2006
Lock-in thermography: Basics and use for evaluating electronic devices and materials
O Breitenstein, W Warta, M Langenkamp
Springer, 2010
UV degradation and recovery of perovskite solar cells
SW Lee, S Kim, S Bae, K Cho, T Chung, LE Mundt, S Lee, S Park, H Park, ...
Scientific reports 6 (1), 1-10, 2016
Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
JA Giesecke, MC Schubert, B Michl, F Schindler, W Warta
Solar Energy Materials and Solar Cells 95 (3), 1011-1018, 2011
High-efficiency n-type HP mc silicon solar cells
J Benick, A Richter, R Müller, H Hauser, F Feldmann, P Krenckel, S Riepe, ...
IEEE journal of photovoltaics 7 (5), 1171-1175, 2017
Degradation of crystalline silicon due to boron–oxygen defects
T Niewelt, J Schoen, W Warta, SW Glunz, MC Schubert
IEEE Journal of Photovoltaics 7 (1), 383-398, 2016
Understanding junction breakdown in multicrystalline solar cells
O Breitenstein, J Bauer, K Bothe, W Kwapil, D Lausch, U Rau, J Schmidt, ...
Journal of applied physics 109 (7), 5, 2011
Effective passivation of black silicon surfaces by atomic layer deposition
P Repo, A Haarahiltunen, L Sainiemi, M Yli-Koski, H Talvitie, ...
IEEE Journal of Photovoltaics 3 (1), 90-94, 2012
Trapping artifacts in quasi-steady-state photoluminescence and photoconductance lifetime measurements on silicon wafers
RA Bardos, T Trupke, MC Schubert, T Roth
Applied Physics Letters 88 (5), 053504, 2006
Impact of the firing temperature profile on light induced degradation of multicrystalline silicon
R Eberle, W Kwapil, F Schindler, MC Schubert, SW Glunz
physica status solidi (RRL)–Rapid Research Letters 10 (12), 861-865, 2016
The concept of skins for silicon solar cell modeling
A Fell, J Schön, MC Schubert, SW Glunz
Solar Energy Materials and Solar Cells 173, 128-133, 2017
Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon
T Niewelt, M Selinger, NE Grant, W Kwapil, JD Murphy, MC Schubert
Journal of Applied Physics 121 (18), 185702, 2017
Understanding the light‐induced degradation at elevated temperatures: Similarities between multicrystalline and floatzone p‐type silicon
T Niewelt, F Schindler, W Kwapil, R Eberle, J Schön, MC Schubert
Progress in Photovoltaics: Research and Applications 26 (8), 533-542, 2018
Identifying the impact of surface recombination at electrodes in organic solar cells by means of electroluminescence and modeling
J Reinhardt, M Grein, C Bühler, M Schubert, U Würfel
Advanced Energy Materials 4 (11), 1400081, 2014
Analysing the effect of crystal size and structure in highly efficient CH 3 NH 3 PbI 3 perovskite solar cells by spatially resolved photo-and electroluminescence imaging
S Mastroianni, FD Heinz, JH Im, W Veurman, M Padilla, MC Schubert, ...
Nanoscale 7 (46), 19653-19662, 2015
Efficiency limiting bulk recombination in multicrystalline silicon solar cells
B Michl, M Rüdiger, JA Giesecke, M Hermle, W Warta, MC Schubert
Solar Energy Materials and Solar Cells 98, 441-447, 2012
Can luminescence imaging replace lock-in thermography on solar cells?
O Breitenstein, J Bauer, K Bothe, D Hinken, J Müller, W Kwapil, ...
IEEE Journal of Photovoltaics 1 (2), 159-167, 2011
Short-circuit current density mapping for solar cells
M Padilla, B Michl, B Thaidigsmann, W Warta, MC Schubert
Solar energy materials and solar cells 120, 282-288, 2014
Kinetics of carrier-induced degradation at elevated temperature in multicrystalline silicon solar cells
W Kwapil, T Niewelt, MC Schubert
Solar Energy Materials and Solar Cells 173, 80-84, 2017
N-type black silicon solar cells
P Repo, J Benick, V Vähänissi, J Schön, G von Gastrow, B Steinhauser, ...
Energy Procedia 38, 866-871, 2013
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20