| Using benchmarks for radiation testing of microprocessors and FPGAs H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ... IEEE transactions on nuclear science 62 (6), 2547-2554, 2015 | 114 | 2015 |
| Alternative standard cell placement strategies for single-event multiple-transient mitigation BT Kiddie, WH Robinson 2014 IEEE Computer Society Annual Symposium on VLSI, 589-594, 2014 | 29 | 2014 |
| Stealth assessment of hardware Trojans in a microcontroller T Reece, DB Limbrick, X Wang, BT Kiddie, WH Robinson 2012 IEEE 30th International Conference on Computer Design (ICCD), 139-142, 2012 | 22 | 2012 |
| Single-event multiple-transient characterization and mitigation via alternative standard cell placement methods BT Kiddie, WH Robinson, DB Limbrick ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (4 …, 2015 | 15 | 2015 |
| Single-event multiple-transients (SEMT): Circuit characterization and analysis BT Kiddie, WH Robinson, DB Limbrick IEEE Workshop Silicon Errors in Logic-System Effects (SELSE), 2013 | 15 | 2013 |
| Relative logic cell placement for mitigation of charge sharing-induced transients BT Kiddie, WH Robinson Semiconductor Science and Technology 31 (10), 104002, 2016 | 5 | 2016 |
| The use of benchmarks for high-reliability systems HM Quinn, W Robinson, P Rech, A Barnard, M Aguirre, M Desogus, ... Los Alamos National Laboratory (LANL), Los Alamos, NM (United States), 2015 | 3 | 2015 |
| Layout-based fault injection for combinational logic in nanometer technologies BT Kiddie | 3 | 2012 |
| Applying Residue Arithmetic Codes to Combinational Logic to Reduce Single Event Upsets MD Sika, A Yazdanbakhsh, B Kiddie, JR Ahlbin, M Bajura, M Fritze, ... | 2 | 2013 |
| Design-based variability in simulating single event transients WH Robinson, DB Limbrick, BT Kiddie, AI Abdul-Rahman, BT Lin, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 1 | 2016 |
| Identification of Trojans in an FPGA using low-precision equipment T Reece, BT Kiddie, WH Robinson 2014 IEEE 57th International Midwest Symposium on Circuits and Systems …, 2014 | 1 | 2014 |
| Low Energy Hardening of Combinatorial Logic using Standard Cells and Residue Codes MD Sika, A Yazdanbakhsh, B Kiddie, J Ahlbin, M Bajura, M Fritze, ... | 1 | 2014 |
| Single-Event Multiple-Transient Characterization and Mitigation via Standard Cell Placement Methods BT Kiddie Vanderbilt University, 2016 | | 2016 |
| The Effects of EDA Placement Modification for Mitigating Radiation-Induced Multiple Transients BT Kiddie, WH Robinson Silicon Errors in Logic - System Effects, 2015 | | 2015 |
| SEMTherm 2017: International Conference on Microtechnology & Thermal Problems in Electronics (MICROTHERM2017) and BT Kiddie, WH Robinson, Z Lisik, E Raj | | |
