Veit Kleeberger
Title
Cited by
Cited by
Year
Predicting future product performance: Modeling and evaluation of standard cells in FinFET technologies
VB Kleeberger, H Graeb, U Schlichtmann
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
542013
A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits
VB Kleeberger, M Barke, C Werner, D Schmitt-Landsiedel, ...
Microelectronics Reliability 54 (6-7), 1083-1089, 2014
442014
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience
A Herkersdorf, H Aliee, M Engel, M Glaß, C Gimmler-Dumont, J Henkel, ...
Microelectronics Reliability 54 (6-7), 1066-1074, 2014
372014
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience
V Kleeberger, C Gimmler-Dumont, C Weis, A Herkersdorf, ...
IEEE Micro 33 (4), 46-55, 2013
292013
Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling
A Masrur, P Kindt, M Becker, S Chakraborty, V Kleeberger, M Barke, ...
IEEE International Conference on Embedded and Real-Time Computing Systems …, 2012
232012
Workload-and instruction-aware timing analysis-the missing link between technology and system-level resilience
VB Kleeberger, PR Maier, U Schlichtmann
2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2014
222014
Goldilocks Failures: Not Too Soft, Not Too Hard
SR Nassif, VB Kleeberger, U Schlichtmann
IEEE International Reliability Physics Symposium (IRPS), 2012
222012
Cross-Layer Dependability Modeling and Abstraction in System on Chip
A Herkersdorf, M Engel, M Glaß, J Henkel, V Kleeberger, M Kochte, ...
Silicon Errors in Logic - System Effects, 2013
162013
Technology-aware system failure analysis in the presence of soft errors by mixture importance sampling
VB Kleeberger, D Mueller-Gritschneder, U Schlichtmann
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2013
132013
Connecting different worlds—Technology abstraction for reliability-aware design and Test
U Schlichtmann, VB Kleeberger, JA Abraham, A Evans, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-8, 2014
122014
FinFET-based product performance: Modeling and evaluation of standard cells in FinFET technologies
S Karapetyan, V Kleeberger, U Schlichtmann
Microelectronics Reliability 61, 30-34, 2016
112016
Design & verification of automotive SoC firmware
VB Kleeberger, S Rutkowski, R Coppens
Proceedings of the 52nd Annual Design Automation Conference, 1-6, 2015
102015
Fast and waveform independent characterization of current source models
C Knoth, VB Kleeberger, P Nordholz, U Schlichtmann
2009 IEEE Behavioral Modeling and Simulation Workshop, 90-95, 2009
102009
Embedded software reliability testing by unit-level fault injection
PR Maier, D Mueller-Gritschneder, U Schlichtmann, VB Kleeberger
2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC), 410-416, 2016
82016
Analysis of Aging Mitigation Techniques for Digital Circuits Considering Recovery Effects
M Barke, V Kleeberger, C Werner, D Schmitt-Landsiedel, U Schlichtmann
edaWorkshop 13, 19-24, 2013
62013
Fault Injection for Test-driven Development of Robust SoC Firmware
PR Maier, VB Kleeberger, D Mueller-Gritschneder, U Schlichtmann
ACM Transactions on Embedded Computing Systems (TECS) 17, 2017
52017
Program-aware circuit level timing analysis
VB Kleeberger, S Kiesel, U Schlichtmann, S Chakraborty
2011 International Symposium on Integrated Circuits, 102-105, 2011
42011
Fault Injection at Host-Compiled Level with Static Fault Set Reduction for SoC Firmware Robustness Testing
PR Maier, V Kleeberger, D Mueller-Gritschneder, U Schlichtmann
Hardware/Software Codesign and System Synthesis (CODES+ ISSS), 2016 …, 2016
32016
Application-aware cross-layer reliability analysis and optimization
M Glaß, H Aliee, L Chen, M Ebrahimi, F Khosravi, VB Kleeberger, A Listl, ...
it-Information Technology 57 (3), 159-169, 2015
32015
Circuit resilience roadmap
VB Kleeberger, C Weis, U Schlichtmann, N Wehn
Circuit Design for Reliability, 121-143, 2015
32015
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Articles 1–20