| Determination of fringe order in white-light interference microscopy P de Groot, XC de Lega, J Kramer, M Turzhitsky Applied optics 41 (22), 4571-4578, 2002 | 301 | 2002 |
| Signal modeling for low-coherence height-scanning interference microscopy P de Groot, XC de Lega Applied optics 43 (25), 4821-4830, 2004 | 230 | 2004 |
| Generating model signals for interferometry XC De Lega US Patent 7,619,746, 2009 | 190 | 2009 |
| Profiling complex surface structures using scanning interferometry PJ De Groot, R Stoner, XC De Lega US Patent 7,271,918, 2007 | 185 | 2007 |
| Interferometry method and system including spectral decomposition XC De Lega, P De Groot US Patent 7,636,168, 2009 | 169 | 2009 |
| Infrared scanning interferometry apparatus and method XC De Lega, P De Groot, LL Deck US Patent 6,195,168, 2001 | 131 | 2001 |
| Interferometric optical systems having simultaneously scanned optical path length and focus PJ De Groot, XC De Lega, S Balasubramaniam US Patent 7,012,700, 2006 | 121 | 2006 |
| Interferometric optical systems having simultaneously scanned optical path length and focus PJ De Groot, XC De Lega, S Balasubramaniam US Patent 7,012,700, 2006 | 121 | 2006 |
| Interpreting interferometric height measurements using the instrument transfer function P de Groot, XC de Lega Fringe 2005: The 5th International Workshop on Automatic Processing of …, 2006 | 120 | 2006 |
| Interferometer and method for measuring characteristics of optically unresolved surface features P De Groot, MJ Darwin, RT Stoner, GM Gallatin, XC De Lega US Patent 7,324,214, 2008 | 106 | 2008 |
| Scanning interferometry for thin film thickness and surface measurements PJ De Groot, XC De Lega US Patent 7,324,210, 2008 | 102 | 2008 |
| Interferometer for determining characteristics of an object surface, including processing and calibration XC De Lega, P De Groot US Patent 7,428,057, 2008 | 96 | 2008 |
| Optical systems for measuring form and geometric dimensions of precision engineered parts P De Groot, XC De Lega, D Grigg, J Biegen US Patent 6,822,745, 2004 | 93 | 2004 |
| Profiling complex surface structures using scanning interferometry PJ De Groot, R Stoner, XC De Lega US Patent 7,106,454, 2006 | 90 | 2006 |
| Profiling complex surface structures using scanning interferometry PJ De Groot, R Stoner, XC De Lega US Patent 7,106,454, 2006 | 90 | 2006 |
| Optical interferometry for measurement of the geometric dimensions of industrial parts P de Groot, J Biegen, J Clark, XC de Lega, D Grigg Applied Optics 41 (19), 3853-3860, 2002 | 86 | 2002 |
| Triangulation methods and systems for profiling surfaces through a thin film coating PJ De Groot, XC De Lega US Patent 7,292,346, 2007 | 83 | 2007 |
| Interferometer for determining characteristics of an object surface XC De Lega, P De Groot US Patent 7,446,882, 2008 | 80 | 2008 |
| Interferometer with multiple modes of operation for determining characteristics of an object surface XC De Lega, P De Groot US Patent 7,616,323, 2009 | 76 | 2009 |
| Measurement of complex surface shapes using a spherical wavefront PJ De Groot, XC De Lega US Patent 6,714,307, 2004 | 72 | 2004 |
