Riccardo Cantoro
Riccardo Cantoro
Verified email at polito.it
Title
Cited by
Cited by
Year
Development flow for on-line core self-test of automotive microcontrollers
P Bernardi, R Cantoro, S De Luca, E Sánchez, A Sansonetti
IEEE Transactions on Computers 65 (3), 744-754, 2015
392015
A suite of IEEE 1687 benchmark networks
A Tšertov, A Jutman, S Devadze, MS Reorda, E Larsson, FG Zadegan, ...
2016 IEEE International Test Conference (ITC), 1-10, 2016
332016
A flexible framework for the automatic generation of sbst programs
A Riefert, R Cantoro, M Sauer, MS Reorda, B Becker
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (10 …, 2016
312016
On the testability of IEEE 1687 networks
R Cantoro, M Montazeri, MS Reorda, FG Zadegan, E Larsson
2015 IEEE 24th Asian Test Symposium (ATS), 211-216, 2015
262015
On the automatic generation of SBST test programs for in-field test
A Riefert, R Cantoro, M Sauer, MS Reorda, B Becker
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
232015
On the in-field functional testing of decode units in pipelined RISC processors
P Bernardi, R Cantoro, L Ciganda, E Sánchez, MS Reorda, S De Luca, ...
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014
232014
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors
P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ...
2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013
172013
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications
R Cantoro, A Firrincieli, D Piumatti, M Restifo, E Sánchez, MS Reorda
2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018
122018
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks
R Cantoro, M Montazeri, M Sonza, FG Zadegan, E Larsson
2016 IEEE 22nd International Symposium on On-Line Testing and Robust System …, 2016
122016
Software-based self-test techniques of computational modules in dual issue embedded processors
P Bernardi, C Bovi, R Cantoro, S De Luca, R Meregalli, D Piumatti, ...
2015 20th IEEE European Test Symposium (ETS), 1-2, 2015
112015
Test time minimization in reconfigurable scan networks
R Cantoro, M Palena, P Pasini, MS Reorda
2016 IEEE 25th Asian Test Symposium (ATS), 119-124, 2016
102016
On the functional test of the cache coherency logic in multi-core systems
JP Acle, R Cantoro, E Sánchez, MS Reorda
2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2015
102015
An analysis of test solutions for COTS-based systems in space applications
R Cantoro, S Carbonara, A Floridia, E Sánchez, MS Reorda, JG Mess
2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018
82018
Test of reconfigurable modules in scan networks
R Cantoro, FG Zadegan, M Palena, P Pasini, E Larsson, MS Reorda
IEEE Transactions on Computers 67 (12), 1806-1817, 2018
82018
An evolutionary technique for reducing the duration of reconfigurable scan network test
R Cantoro, L San Paolo, MS Reorda, G Squillero
2018 IEEE 21st International Symposium on Design and Diagnostics of …, 2018
72018
Software-based self-test techniques for dual-issue embedded processors
P Bernardi, R Cantoro, S De Luca, E Sanchez, A Sansonetti, G Squillero
IEEE Transactions on Emerging Topics in Computing, 2017
72017
In-field functional test programs development flow for embedded FPUs
R Cantoro, D Piumatti, P Bernardi, S De Luca, A Sansonetti
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016
72016
A new technique to generate test sequences for reconfigurable scan networks
R Cantoro, A Damljanovic, MS Reorda, G Squillero
2018 IEEE International Test Conference (ITC), 1-9, 2018
62018
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
P Bernardi, R Cantoro, L Gianotto, M Restifo, E Sánchez, F Venini, ...
2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017
62017
Effective generation and evaluation of diagnostic SBST programs
A Riefert, R Cantoro, M Sauer, MS Reorda, B Becker
2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016
52016
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