| Improve performance of scanning probe microscopy by balancing tuning fork prongs BP Ng, Y Zhang, SW Kok, YC Soh Ultramicroscopy 109 (4), 291-295, 2009 | 33 | 2009 |
| Dispersion-compensation-free femtosecond Tm-doped all-fiber laser with a 248 MHz repetition rate B Sun, J Luo, BP Ng, X Yu Optics Letters 41 (17), 4052-4055, 2016 | 31 | 2016 |
| Near-field ellipsometry for thin film characterization Z Liu, Y Zhang, SW Kok, BP Ng, YC Soh Optics Express 18 (4), 3298-3310, 2010 | 21 | 2010 |
| Interactions of higher order tip effects in critical dimension-AFM linewidth metrology R Dixson, BP Ng, X Bonnaud, N Orji Journal of Vacuum Science & Technology B 33 (3), 2015 | 19 | 2015 |
| Roll-to-roll embossing of optical radial Fresnel lenses on polymer film for concentrator photovoltaics: a feasibility study R Huang, XQ Zhang, BP Ng, AS Kumar, K Liu International Journal of Precision Engineering and Manufacturing-Green …, 2021 | 18 | 2021 |
| Effects of lateral tip control in CD-AFM width metrology R Dixson, BP Ng, N Orji Measurement Science and Technology 25 (9), 094003, 2014 | 14 | 2014 |
| Reflection-based near-field ellipsometry for thin film characterization Z Liu, Y Zhang, SW Kok, BP Ng, YC Soh Ultramicroscopy 124, 26-34, 2013 | 13 | 2013 |
| Contour metrology using critical dimension atomic force microscopy NG Orji, RG Dixson, BP Ng, AE Vladár, MT Postek Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (4), 044006, 2016 | 9 | 2016 |
| Artifact reduction by intrinsic harmonics of tuning fork probe for scanning near-field optical microscopy Z Dong, Y Zhang, SW Kok, BP Ng, YC Soh Optics Express 18 (21), 22047-22060, 2010 | 7 | 2010 |
| An improved dynamic model of tuning fork probe for scanning probe microscopy BP Ng, Y Zhang, SW Kok, YC Soh Journal of microscopy 234 (2), 191-195, 2009 | 6 | 2009 |
| Nano-imaging collagen by atomic force, near-field and nonlinear microscope KC Lim, J Tang, H Li, BP Ng, SW Kok, Q Wang, Y Zhang Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XII …, 2015 | 1 | 2015 |
| Progress on CD-AFM tip width calibration standards R Dixson, BP Ng, CD McGray, NG Orji, J Geist Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense …, 2012 | 1 | 2012 |
| Shear-force atomic force microscope by using the second resonance regime of tuning fork probe Z Liu, Y Zhang, SW Kok, BP Ng, YC Soh Applied Physics Letters 97 (19), 2010 | 1 | 2010 |
| Interactions of Higher Order Tip Effects in CD-AFM Linewidth Metrology RG Dixson, BP Ng, X Bonnaud, NG Orji Ronald G. Dixson, Boon Ping Ng, Xavier Bonnaud, Ndubuisi G. Orji, 2015 | | 2015 |
| FABRICATION AND CHARACTERIZATION OF STANDARDS FOR ATOMIC FORCE MICROSCOPE TIP WIDTH CALIBRATION R Dixson, C McGray, BP Ng, NG Orji, J Geist Ronald G. Dixson, Craig D. McGray, Boon Ping Ng, Ndubuisi G. Orji, Jon C. Geist, 2013 | | 2013 |
| Weak signal detection for scanning near-field optical microscopy BP Ng | | 2010 |
| Loss Measurement of Photonic Integrated Waveguides by Scanning Near-field Optical Microscopy BP Ng, ZG Dong, SW Kok, Y Zhang, YC Soh Laser Science, JWA58, 2008 | | 2008 |
| Optical Detection Using Multi-Wavelength Modulation BP Ng, SH Luen, Y Zhang, YC Soh Key Engineering Materials 381, 325-328, 2008 | | 2008 |
| Phase locked-in loop design with pre-specified transient performance BP Ng, Y Zhang, YC Soh Photonic Devices and Algorithms for Computing VII 5907, 237-244, 2005 | | 2005 |
| Thin-film Characterization by SNOM Z Liu, BP Ng, SW Kok, Y Zhang, YC Soh | | |
