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Martin Wünsche
Martin Wünsche
University of Jena, Indigo Optical Systems GmbH
Verified email at uni-jena.de - Homepage
Title
Cited by
Cited by
Year
Perfect X-ray focusing via fitting corrective glasses to aberrated optics
F Seiboth, A Schropp, M Scholz, F Wittwer, C Rödel, M Wünsche, ...
Nature Communications 8 (1), 14623, 2017
1482017
Interference carpets in above-threshold ionization: from the Coulomb-free to the Coulomb-dominated regime
PA Korneev, SV Popruzhenko, SP Goreslavski, TM Yan, D Bauer, ...
Physical Review Letters 108 (22), 223601, 2012
1072012
Optical coherence tomography with nanoscale axial resolution using a laser-driven high-harmonic source
S Fuchs, M Wünsche, J Nathanael, JJ Abel, C Rödel, J Biedermann, ...
Optica 4 (8), 903-906, 2017
432017
Optical coherence tomography using broad-bandwidth XUV and soft X-ray radiation
S Fuchs, A Blinne, C Rödel, U Zastrau, V Hilbert, M Wünsche, J Bierbach, ...
Applied Physics B 106, 789-795, 2012
382012
Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft x-ray radiation
S Fuchs, C Rödel, A Blinne, U Zastrau, M Wünsche, V Hilbert, L Glaser, ...
Scientific reports 6 (1), 20658, 2016
302016
Quasi-supercontinuum source in the extreme ultraviolet using multiple frequency combs from high-harmonic generation
M Wünsche, S Fuchs, S Aull, J Nathanael, M Möller, C Rödel, GG Paulus
Optics Express 25 (6), 6936-6944, 2017
242017
Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
S Fuchs, C Rödel, M Krebs, S Hädrich, J Bierbach, AE Paz, S Kuschel, ...
Review of Scientific Instruments 84 (2), 2013
242013
Note: A large aperture four-mirror reflective wave-plate for high-intensity short-pulse laser experiments
B Aurand, C Rödel, H Zhao, S Kuschel, M Wünsche, O Jäckel, M Heyer, ...
Review of scientific instruments 83 (3), 2012
172012
Material-specific imaging of nanolayers using extreme ultraviolet coherence tomography
F Wiesner, M Wünsche, J Reinhard, JJ Abel, J Nathanael, S Skruszewicz, ...
Optica 8 (2), 230-238, 2021
162021
Near-monochromatic high-harmonic radiation from relativistic laser–plasma interactions with blazed grating surfaces
M Yeung, B Dromey, C Rödel, J Bierbach, M Wünsche, G Paulus, T Hahn, ...
New Journal of Physics 15 (2), 025042, 2013
162013
A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis
M Wünsche, S Fuchs, T Weber, J Nathanael, JJ Abel, J Reinhard, ...
Review of Scientific Instruments 90 (2), 2019
152019
An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers
V Hilbert, A Blinne, S Fuchs, T Feigl, T Kämpfer, C Rödel, I Uschmann, ...
Review of scientific instruments 84 (9), 2013
152013
Vinzenz Hilbert, Leif Glaser,“Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft x-ray radiation.,”
S Fuchs, C Rödel, A Blinne, U Zastrau, M Wünsche
Scientific reports 6 (1), 1-6, 2016
132016
A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution
U Zastrau, C Rödel, M Nakatsutsumi, T Feigl, K Appel, B Chen, T Döppner, ...
Review of Scientific Instruments 89 (2), 2018
102018
Coherence tomography with broad bandwidth extreme ultraviolet and soft X-ray radiation
S Skruszewicz, S Fuchs, JJ Abel, J Nathanael, J Reinhard, C Rödel, ...
Applied Physics B 127, 1-10, 2021
92021
Laboratory setup for extreme ultraviolet coherence tomography driven by a high-harmonic source
J Nathanael, M Wünsche, S Fuchs, T Weber, JJ Abel, J Reinhard, ...
Review of Scientific Instruments 90 (11), 2019
92019
New design of a multi-jet target for quasi phase matching
A Hage, B Landgraf, M Taylor, M Wünsche, T Gangolf, H Höppner, ...
Review of Scientific Instruments 85 (10), 2014
92014
Photon counting of extreme ultraviolet high harmonics using a superconducting nanowire single-photon detector
S Fuchs, JJ Abel, J Nathanael, J Reinhard, F Wiesner, M Wünsche, ...
Applied Physics B 128 (2), 26, 2022
62022
Absolute EUV reflectivity measurements using a broadband high-harmonic source and an in situ single exposure reference scheme
JJ Abel, F Wiesner, J Nathanael, J Reinhard, M Wünsche, G Schmidl, ...
Optics Express 30 (20), 35671-35683, 2022
32022
Aberration correction for hard x-ray focusing at the nanoscale
F Seiboth, A Schropp, M Scholz, F Wittwer, C Rödel, M Wünsche, ...
Advances in X-Ray/EUV Optics and Components XII 10386, 41-50, 2017
32017
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