| Al2O3-TiO2 Nanolaminates for Conductive Silicon Surface Passivation I Dirnstorfer, T Chohan, PM Jordan, M Knaut, DK Simon, JW Bartha, ... IEEE Journal of Photovoltaics 6 (1), 86-91, 2015 | 20 | 2015 |
| Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO2-Based FeFETs for In-Memory-Computing Applications Y Raffel, S De, M Lederer, RR Olivo, R Hoffmann, S Thunder, L Pirro, ... ACS Applied Electronic Materials 4 (11), 5292-5300, 2022 | 19 | 2022 |
| Interfacial layer engineering to enhance noise immunity of fefets for imc applications Y Raffel, S Thunder, M Lederer, R Olivo, R Hoffmann, L Pirro, S Beyer, ... 2022 International Conference on IC Design and Technology (ICICDT), 8-11, 2022 | 16 | 2022 |
| ALD Al2O3 based nanolaminates for solar cell applications DK Simon, PM Jordan, M Knaut, T Chohan, T Mikolajick, I Dirnstorfer 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 1-6, 2015 | 12 | 2015 |
| Impact of hot carrier stress on small-signal parameters of FD-SOI NMOSFETs T Chohan, S Slesazeck, J Trommer, M Pesic, S Lehmann, A Pakfar, ... 2017 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2017 | 9 | 2017 |
| Off-state impact on FDSOI ring oscillator degradation under high voltage stress J Trommer, V Havel, T Chohan, F Mehmood, S Slesazeck, G Krause, ... 2018 International Integrated Reliability Workshop (IIRW), 1-5, 2018 | 8 | 2018 |
| Demonstration of Large Polarization in Si-doped HfO2 Metal–Ferroelectric–Insulator-Semiconductor Capacitors with Good Endurance and Retention JH Hsuen, M Lederer, L Kerkhofs, Y Raffel, L Pirro, T Chohan, K Seidel, ... 2023 International VLSI Symposium on Technology, Systems and Applications …, 2023 | 7 | 2023 |
| Three level charge pumping on dielectric hafnium oxide gate Y Raffel, M Drescher, R Olivo, M Lederer, R Hoffmann, L Pirro, T Chohan, ... 2022 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2022 | 7 | 2022 |
| 22FDSOI device towards RF and mmWave applications Z Zhao, S Lehmann, WL Oo, AK Sahoo, S Syed, QH Le, DK Huynh, ... 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021 | 7 | 2021 |
| Implication of self-heating effect on device reliability characterization of multi-finger n-MOSFETs on 22FDSOI T Chohan, Z Zhao, S Lehmann, W Arfaoui, G Bossu, J Trommer, ... IEEE Transactions on Device and Materials Reliability 22 (3), 387-395, 2022 | 6 | 2022 |
| 1f-1t array: Current limiting transistor cascoded fefet memory array for variation tolerant vector-matrix multiplication operation MR Sk, S Thunder, F Müller, N Laleni, Y Raffel, M Lederer, L Pirro, ... IEEE Transactions on Nanotechnology, 2023 | 4 | 2023 |
| Impact of BTI stress on RF small signal parameters of FDSOI MOSFETs T Chohan, S Slesazeck, J Trommer, G Krause, G Bossu, S Lehmann, ... 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | 4 | 2019 |
| IPCEI subcontracts contributing to 22-FDX Add-On Functionalities at GF S Kolodinski, C Mart, W Weinreich, V Sessi, J Trommer, T Chohan, ... ESSDERC 2019-49th European Solid-State Device Research Conference (ESSDERC …, 2019 | 3 | 2019 |
| SOTF-BTI-an S-Parameters based on-the-fly Bias Temperature Instability Characterization Method T Chohan, S Slesazeck, G Krause, J Trommer, S Lehmann, T Mikolajick 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | 2 | 2020 |
| Design of Variation-Tolerant 1F-1T Memory Array for Neuromorphic Computing MSK Rana, S Thunder, F Müller, N Laleni, Y Raffel, M Lederer, L Pirro, ... Authorea Preprints, 2023 | 1 | 2023 |
| RF small-signal modeling of HCI degradation in FDSOI NMOSFET using BSIM-IMG FAV Gonzalez, A Lange, T Chohan, T Mikolajick 2021 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2021 | 1 | 2021 |
| Impact of High-K Deposition Process on the Noise Immunity of FeFETs and their Applicability Towards In-Memory-Computing Y Raffel, R Olivo, M Lederer, L Pirro, V Parmar, T Chohan, D Lehninger, ... 2023 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2023 | | 2023 |
| Reliability Investigations of MOSFETs using RF Small Signal Characterization T Chohan | | 2023 |
| 2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22 B Arunachalam, RN Asli, L Atzeni, T Aytug, H Aziza, N Bagga, Y Ban, ... IEEE Transactions on Device and Materials Reliability 22 (4), 2022 | | 2022 |
| IIRW 2019 Discussion Group II: Reliability for aerospace applications JY Scharlotta, G Bersuker, S Tyagnoy, C Young, G Haase, G Rzepa, ... 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | | 2019 |
