| Mutation testing advances: an analysis and survey M Papadakis, M Kintis, J Zhang, Y Jia, Y Le Traon, M Harman Advances in Computers 112, 275-378, 2019 | 408 | 2019 |
| Static analysis of android apps: A systematic literature review L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ... Information and Software Technology 88, 67-95, 2017 | 346 | 2017 |
| Metallaxis‐FL: mutation‐based fault localization M Papadakis, Y Le Traon Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015 | 284 | 2015 |
| Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon IEEE Transactions on Software Engineering, 1-1, 2014 | 262* | 2014 |
| Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique M Papadakis, Y Jia, M Harman, Y Le Traon 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 221 | 2015 |
| PIT a Practical Mutation Testing Tool for Java (Demo) H Coles, T Laurent, C Henard, M Papadakis, A Ventresque International Symposium on Software Testing and Analysis (ISSTA …, 2016 | 220* | 2016 |
| Combining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines C Henard, M Papadakis, M Harman, Y Le Traon 37th International Conference on Software Engineering (ICSE), 2015 | 215 | 2015 |
| Comparing White-box and Black-box Test Prioritization C Henard, M Papadakis, M Harman, Y Jia, Y Le Traon ICSE, 2016 | 202 | 2016 |
| Automatic mutation test case generation via dynamic symbolic execution M Papadakis, N Malevris 2010 IEEE 21st International Symposium on Software Reliability Engineering …, 2010 | 154 | 2010 |
| An empirical study on mutation, statement and branch coverage fault revelation that avoids the unreliable clean program assumption TT Chekam, M Papadakis, Y Le Traon, M Harman 2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE …, 2017 | 149 | 2017 |
| Multi-objective test generation for software product lines C Henard, M Papadakis, G Perrouin, J Klein, YL Traon Proceedings of the 17th International Software Product Line Conference, 62-71, 2013 | 141 | 2013 |
| An empirical evaluation of the first and second order mutation testing strategies M Papadakis, N Malevris 2010 Third International Conference on Software Testing, Verification, and …, 2010 | 141 | 2010 |
| Threats to the validity of mutation-based test assessment M Papadakis, C Henard, M Harman, Y Jia, Y Le Traon Proceedings of the 25th International Symposium on Software Testing and …, 2016 | 137 | 2016 |
| Semantic fuzzing with zest R Padhye, C Lemieux, K Sen, M Papadakis, Y Le Traon Proceedings of the 28th ACM SIGSOFT International Symposium on Software …, 2019 | 123 | 2019 |
| Evaluating mutation testing alternatives: A collateral experiment M Kintis, M Papadakis, N Malevris 2010 Asia Pacific Software Engineering Conference, 300-309, 2010 | 120 | 2010 |
| Using mutants to locate" unknown" faults M Papadakis, Y Le Traon 2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012 | 113 | 2012 |
| Are mutation scores correlated with real fault detection? a large scale empirical study on the relationship between mutants and real faults M Papadakis, D Shin, S Yoo, DH Bae Proceedings of the 40th International Conference on Software Engineering …, 2018 | 107 | 2018 |
| A replicable comparison study of NER software: StanfordNLP, NLTK, OpenNLP, SpaCy, Gate X Schmitt, S Kubler, J Robert, M Papadakis, Y LeTraon 2019 Sixth International Conference on Social Networks Analysis, Management …, 2019 | 102 | 2019 |
| How effective are mutation testing tools? An empirical analysis of Java mutation testing tools with manual analysis and real faults M Kintis, M Papadakis, A Papadopoulos, E Valvis, N Malevris, Y Le Traon Empirical Software Engineering 23 (4), 2426-2463, 2018 | 98* | 2018 |
| Assessing Software Product Line Testing via Model-based Mutation: An Application to Similarity Testing C Henard, M Papadakis, G Perrouin, J Klein, Y Le Traon | 96 | 2013 |
Yves Le TraonProfessor of Computer Science, University of LuxembourgVerified email at uni.lu
