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Hussam Amrouch
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Cited by
Year
Towards interdependencies of aging mechanisms
H Amrouch, VM van Santen, T Ebi, V Wenzel, J Henkel
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 478-485, 2014
832014
Reliability-aware design to suppress aging
H Amrouch, B Khaleghi, A Gerstlauer, J Henkel
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2016
822016
Improving mobile gaming performance through cooperative CPU-GPU thermal management
A Prakash, H Amrouch, M Shafique, T Mitra, J Henkel
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2016
682016
Negative capacitance transistor to address the fundamental limitations in technology scaling: Processor performance
H Amrouch, G Pahwa, AD Gaidhane, J Henkel, YS Chauhan
IEEE Access 6, 52754-52765, 2018
582018
Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies)
J Henkel, S Pagani, H Amrouch, L Bauer, F Samie
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
492017
Recent advances in EM and BTI induced reliability modeling, analysis and optimization
SXD Tan, H Amrouch, T Kim, Z Sun, C Cook, J Henkel
Integration 60, 132-152, 2018
432018
Towards aging-induced approximations
H Amrouch, B Khaleghi, A Gerstlauer, J Henkel
Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017
422017
A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction
S Mishra, H Amrouch, J Joe, CK Dabhi, K Thakor, YS Chauhan, J Henkel, ...
IEEE Transactions on Electron Devices 66 (1), 271-278, 2018
372018
Reliability in super-and near-threshold computing: A unified model of RTN, BTI, and PV
VM Van Santen, J Martin-Martinez, H Amrouch, MM Nafria, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 293-306, 2017
372017
Stress balancing to mitigate NBTI effects in register files
H Amrouch, T Ebi, J Henkel
2013 43rd Annual IEEE/IFIP international conference on Dependable Systems …, 2013
372013
Impact of BTI on dynamic and static power: From the physical to circuit level
H Amrouch, S Mishra, V van Santen, S Mahapatra, J Henkel
2017 IEEE International Reliability Physics Symposium (IRPS), CR-3.1-CR-3.6, 2017
362017
Aging-aware voltage scaling
VM van Santen, H Amrouch, N Parihar, S Mahapatra, J Henkel
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 576-581, 2016
332016
mDTM: Multi-objective dynamic thermal management for on-chip systems
H Khdr, T Ebi, M Shafique, H Amrouch
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
312014
Thermal management for dependable on-chip systems
J Henkel, T Ebi, H Amrouch, H Khdr
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 113-118, 2013
312013
Weight-oriented approximation for energy-efficient neural network inference accelerators
ZG Tasoulas, G Zervakis, I Anagnostopoulos, H Amrouch, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4670-4683, 2020
302020
Impact of variability on processor performance in negative capacitance finfet technology
H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020
292020
Designing guardbands for instantaneous aging effects
VM van Santen, H Amrouch, J Martin-Martinez, M Nafria, J Henkel
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
272016
Self-immunity technique to improve register file integrity against soft errors
H Amrouch, J Henkel
2011 24th Internatioal Conference on VLSI Design, 189-194, 2011
272011
Impact of extrinsic variation sources on the device-to-device variation in ferroelectric fet
K Ni, A Gupta, O Prakash, S Thomann, XS Hu, H Amrouch
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
262020
Design automation of approximate circuits with runtime reconfigurable accuracy
G Zervakis, H Amrouch, J Henkel
IEEE access 8, 53522-53538, 2020
252020
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Articles 1–20