Folgen
Thibaud Denneulin
Thibaud Denneulin
Bestätigte E-Mail-Adresse bei fz-juelich.de
Titel
Zitiert von
Zitiert von
Jahr
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
JL Rouviere, A Béché, Y Martin, T Denneulin, D Cooper
Applied Physics Letters 103 (24), 2013
1372013
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
D Cooper, T Denneulin, N Bernier, A Béché, JL Rouvière
Micron 80, 145-165, 2016
1322016
Advanced GeSn/SiGeSn group IV heterostructure lasers
N von den Driesch, D Stange, D Rainko, I Povstugar, P Zaumseil, ...
Advanced science 5 (6), 1700955, 2018
802018
Room-temperature skyrmions at zero field in exchange-biased ultrathin films
KG Rana, A Finco, F Fabre, S Chouaieb, A Haykal, LD Buda-Prejbeanu, ...
Physical review applied 13 (4), 044079, 2020
462020
Temperature-independent giant dielectric response in transitional BaTiO3 thin films
AS Everhardt, T Denneulin, A Grünebohm, YT Shao, P Ondrejkovic, ...
Applied physics reviews 7 (1), 2020
442020
Excitons in InGaAs quantum dots without electron wetting layer states
MC Löbl, S Scholz, I Söllner, J Ritzmann, T Denneulin, A Kovács, ...
Communications Physics 2 (1), 93, 2019
422019
Skyrmionic spin structures in layered Fe5GeTe2 up to room temperature
M Schmitt, T Denneulin, A Kovács, TG Saunderson, P Rüßmann, ...
Communications Physics 5 (1), 254, 2022
332022
Readout of an antiferromagnetic spintronics system by strong exchange coupling of Mn2Au and Permalloy
SP Bommanaboyena, D Backes, LSI Veiga, SS Dhesi, YR Niu, B Sarpi, ...
Nature Communications 12, 6539, 2021
332021
Control of structure and spin texture in the van der Waals layered magnet CrSBr
J Klein, T Pham, JD Thomsen, JB Curtis, T Denneulin, M Lorke, M Florian, ...
Nature Communications 13 (1), 5420, 2022
292022
Characterization and modeling of structural properties of SiGe/Si superlattices upon annealing
M Py, JP Barnes, P Rivallin, A Pakfar, T Denneulin, D Cooper, ...
Journal of Applied Physics 110 (4), 2011
272011
Electron microscopy by specimen design: application to strain measurements
N Cherkashin, T Denneulin, MJ Hÿtch
Scientific reports 7 (1), 12394, 2017
252017
Ultrathin (5 nm) SiGe-On-Insulator with high compressive strain (− 2 GPa): From fabrication (Ge enrichment process) to in-depth characterizations
F Glowacki, C Le Royer, Y Morand, JM Pédini, T Denneulin, D Cooper, ...
Solid-state electronics 97, 82-87, 2014
232014
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy
D Cooper, T Denneulin, JP Barnes, JM Hartmann, L Hutin, C Le Royer, ...
Journal of Applied Physics 112 (12), 2012
232012
Differential phase-contrast dark-field electron holography for strain mapping
T Denneulin, F Houdellier, M Hÿtch
Ultramicroscopy 160, 98-109, 2016
212016
Strong bulk spin–orbit torques quantified in the van der Waals ferromagnet Fe3GeTe2
F Martin, K Lee, M Schmitt, A Liedtke, A Shahee, HT Simensen, T Scholz, ...
Materials Research Letters 11 (1), 84-89, 2023
202023
Microstructural insights into the coercivity enhancement of grain-boundary-diffusion-processed Tb-treated Nd-Fe-B sintered magnets beyond the core-shell formation mechanism
KŽ Soderžnik, KŽ Rožman, M Komelj, A Kovács, P Diehle, T Denneulin, ...
Journal of Alloys and Compounds 864, 158915, 2021
202021
Direct observation of altermagnetic band splitting in CrSb thin films
S Reimers, L Odenbreit, L Šmejkal, VN Strocov, P Constantinou, ...
Nature Communications 15 (1), 2116, 2024
182024
Room-temperature yellow-orange (In, Ga, Al) P–GaP laser diodes grown on (n11) GaAs substrates
NN Ledentsov, VA Shchukin, YM Shernyakov, MM Kulagina, AS Payusov, ...
Optics express 26 (11), 13985-13994, 2018
182018
The addition of strain in uniaxially strained transistors by both SiN contact etch stop layers and recessed SiGe sources and drains
T Denneulin, D Cooper, JM Hartmann, JL Rouviere
Journal of Applied Physics 112 (9), 2012
162012
Realization of a tilted reference wave for electron holography by means of a condenser biprism
F Röder, F Houdellier, T Denneulin, E Snoeck, M Hÿtch
Ultramicroscopy 161, 23-40, 2016
132016
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20