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Anil Koyuncu
Anil Koyuncu
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Titel
Zitiert von
Zitiert von
Jahr
TBar: Revisiting template-based automated program repair
K Liu, A Koyuncu, D Kim, TF Bissyandé
Proceedings of the 28th ACM SIGSOFT international symposium on software …, 2019
3672019
Fixminer: Mining relevant fix patterns for automated program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon
Empirical Software Engineering 25, 1980-2024, 2020
2602020
Avatar: Fixing semantic bugs with fix patterns of static analysis violations
K Liu, A Koyuncu, D Kim, TF Bissyandé
2019 IEEE 26th International Conference on Software Analysis, Evolution and …, 2019
2212019
You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems
K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon
2019 12th IEEE conference on software testing, validation and verification …, 2019
1902019
On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs
K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ...
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
1742020
Learning to spot and refactor inconsistent method names
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019
1412019
Evaluating representation learning of code changes for predicting patch correctness in program repair
H Tian, K Liu, AK Kaboré, A Koyuncu, L Li, J Klein, TF Bissyandé
Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020
1262020
iFixR: Bug report driven program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, M Monperrus, J Klein, Y Le Traon
Proceedings of the 2019 27th ACM joint meeting on european software …, 2019
1182019
A critical review on the evaluation of automated program repair systems
K Liu, L Li, A Koyuncu, D Kim, Z Liu, J Klein, TF Bissyandé
Journal of Systems and Software 171, 110817, 2021
962021
LSRepair: Live search of fix ingredients for automated program repair
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018
862018
A closer look at real-world patches
K Liu, D Kim, A Koyuncu, L Li, TF Bissyandé, Y Le Traon
2018 IEEE International Conference on Software Maintenance and Evolution …, 2018
652018
D&c: A divide-and-conquer approach to ir-based bug localization
A Koyuncu, TF Bissyandé, D Kim, K Liu, J Klein, M Monperrus, YL Traon
arXiv preprint arXiv:1902.02703, 2019
352019
Where were the repair ingredients for defects4j bugs? exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems
D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ...
Empirical Software Engineering 26, 1-33, 2021
302021
The best of both worlds: Combining learned embeddings with engineered features for accurate prediction of correct patches
H Tian, K Liu, Y Li, AK Kaboré, A Koyuncu, A Habib, L Li, J Wen, J Klein, ...
ACM Transactions on Software Engineering and Methodology 32 (4), 1-34, 2023
292023
iBiR: Bug-report-driven Fault Injection
A Khanfir, A Koyuncu, M Papadakis, M Cordy, TF Bissyandé, J Klein, ...
ACM Transactions on Software Engineering and Methodology 32 (2), 1-31, 2023
282023
Impact of tool support in patch construction
A Koyuncu, TF Bissyandé, D Kim, J Klein, M Monperrus, YL Traon
International Symposium on Software Testing and Analysis (ISSTA), 2017
262017
Learning to spot and refactor inconsistent method names. In 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE)
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
IEEE, 1ś12, 2019
202019
Reliable fix patterns inferred from static checkers for automated program repair
K Liu, J Zhang, L Li, A Koyuncu, D Kim, C Ge, Z Liu, J Klein, TF Bissyandé
ACM Transactions on Software Engineering and Methodology 32 (4), 1-38, 2023
92023
Flexirepair: Transparent program repair with generic patches
A Koyuncu, TF Bissyandé, J Klein, YL Traon
arXiv preprint arXiv:2011.13280, 2020
92020
Large-scale, Independent and Comprehensive study of the power of LLMs for test case generation
WC Ouédraogo, K Kaboré, H Tian, Y Song, A Koyuncu, J Klein, D Lo, ...
arXiv preprint arXiv:2407.00225, 2024
62024
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