| A software-based self-test and hardware reconfiguration solution for VLIW processors T Koal, HT Vierhaus 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and …, 2010 | 34 | 2010 |
| A concept for logic self repair T Koal, HT Vierhaus, D Scheit 2009 12th Euromicro Conference on Digital System Design, Architectures …, 2009 | 26 | 2009 |
| A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors M Ulbricht, M Schölzel, T Koal, HT Vierhaus 14th IEEE International Symposium on Design and Diagnostics of Electronic …, 2011 | 25 | 2011 |
| Optimal spare utilization for reliability and mean lifetime improvement of logic built-in self-repair T Koal, HT Vierhaus 14th IEEE International Symposium on Design and Diagnostics of Electronic …, 2011 | 23 | 2011 |
| Reconfigurable high performance architectures: How much are they ready for safety-critical applications? D Sabena, L Sterpone, M Schölzel, T Koal, HT Vierhaus, S Wong, R Glein, ... 2014 19th IEEE European Test Symposium (ETS), 1-8, 2014 | 21 | 2014 |
| Towards an automatic generation of diagnostic in-field sbst for processor components M Schölzel, T Koal, S Röder, HT Vierhaus 2013 14th Latin American Test Workshop-LATW, 1-6, 2013 | 20 | 2013 |
| Towards an automatic generation of diagnostic in-field sbst for processor components M Schölzel, T Koal, S Röder, HT Vierhaus 2013 14th Latin American Test Workshop-LATW, 1-6, 2013 | 20 | 2013 |
| An adaptive self-test routine for in-field diagnosis of permanent faults in simple risc cores M Schölzel, T Koal, HT Vierhaus 2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012 | 20 | 2012 |
| Virtual TMR schemes combining fault tolerance and self repair T Koal, M Ulbricht, HT Vierhaus 2013 Euromicro Conference on Digital System Design, 235-242, 2013 | 19 | 2013 |
| On the feasibility of built-in self repair for logic circuits T Koal, D Scheit, M Schölzel, HT Vierhaus 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011 | 19 | 2011 |
| On the feasibility of combining on-line-test and self repair for logic circuits T Koal, M Ulbricht, P Engelke, HT Vierhaus 2013 IEEE 16th International Symposium on Design and Diagnostics of …, 2013 | 17 | 2013 |
| Systematic generation of diagnostic software-based self-test routines for processor components M Schölzel, T Koal, HT Vierhaus 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 15 | 2014 |
| Combining fault tolerance and self repair at minimum cost in power and hardware T Koal, M Schölzel, HT Vierhaus 17th International Symposium on Design and Diagnostics of Electronic …, 2014 | 15 | 2014 |
| Basic architecture for logic self repair T Koal, HT Vierhaus 2008 14th IEEE International On-Line Testing Symposium, 177-178, 2008 | 14 | 2008 |
| Combining de-stressing and self repair for long-term dependable systems T Koal, HT Vierhaus 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and …, 2010 | 11 | 2010 |
| A comprehensive scheme for logic self repair T Koal, D Scheit, HT Vierhaus Signal Processing Algorithms, Architectures, Arrangements, and Applications …, 2009 | 10 | 2009 |
| A comprehensive software-based self-test and self-repair method for statically scheduled superscalar processors M Schölzel, T Koal, S Müller, S Scharoba, S Röder, HT Vierhaus 2016 17th Latin-American Test Symposium (LATS), 33-38, 2016 | 9 | 2016 |
| Diagnostic self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults M Schölzel, T Koal, HT Vierhaus 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014 | 9 | 2014 |
| Combining on-line fault detection and logic self repair T Koal, M Ulbricht, HT Vierhaus 2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012 | 8 | 2012 |
| Effective logic self repair based on extracted logic clusters C Gleichner, T Koal, HT Vierhaus Signal Processing Algorithms, Architectures, Arrangements, and Applications …, 2010 | 8 | 2010 |
