| Repairing defects on photomasks using a charged particle beam and topographical data from a scanning probe microscope D Ferranti, V Ray, G Smith, C Musil US Patent App. 10/636,309, 2004 | 44 | 2004 |
| FREUD Applications of FIB: Invasive Attacks and Countermeasures in Hardware Security Devices V Ray http://www.fibsem.net/web_documents/2009Presentations/FIB_FREUD_DC_Ray.pdf, 2009 | 15 | 2009 |
| Development of void-free focused ion beam-assisted metal deposition process for subhalf-micrometer high aspect ratio vias V Ray, N Antoniou, N Bassom, A Krechmer, A Saxonis Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003 | 11 | 2003 |
| Determining end points during charged particle beam processing V Ray, L Scipioni, N Bassom US Patent App. 10/777,672, 2005 | 10 | 2005 |
| Gas delivery and virtual process chamber concept for gas-assisted material processing in a focused ion beam system V Ray Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004 | 8 | 2004 |
| Advanced sub 0.13um Cu Devices - Failure Analysis and Circuit Edit with Improved FIB Chemical Processes and Beam Characteristics D Casey, MM Clive Chandler, T Gannon, A Krechmer, D Monforte, ... Proceedings of International Conference for Testing and Failure Analysis 28 …, 2002 | 8 | 2002 |
| Reconstructing focused ion beam current density profile by iterative simulation methodology E Chang, K Toula, V Ray Journal of Vacuum Science and Technology B 34 (6), 06KO01-1, 2016 | 6 | 2016 |
| Fluorocarbon precursor for high aspect ratio via milling in focused ion beam modification of integrated circuits V Ray ISTFA 2004, 534-537, 2004 | 5 | 2004 |
| Small via high aspect ratio circuit edit: challenges, techniques and developments V Ray, N Antoniou, R Balasubramanian, N Bassom, M Clabby, T Gannon, ... ISTFA 2003, 355-361, 2003 | 5 | 2003 |
| Further inquiry into Xe primary ion species for circuit edit application V Ray, A Hadjikhani, J Favata, S Ahmadi, S Shahbazmohamadi ISTFA 2017: Conference Proceedings from the 43rd International Symposium for …, 2017 | 3 | 2017 |
| Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers J Taillon, V Ray, L Salamanca-Riba Microscopy and Microanalysis 1 (6), https://doi.org/10.1017/S143192761700054, 2017 | 3 | 2017 |
| Optimizing Gas Assisted Processes for Ga+ and Xe+ FIB Circuit Edit Application V Ray, JV Oboña, S Sharma, L Rotkina, E Chang, K Toula International Symposium for Testing and Failure Analysis, 2016 | 3 | 2016 |
| Methodology for Studying Nanoscale Details of Focused Ion Beam Gas-Assisted Etching and Deposition by TEM and Numerical Modeling V Ray, E Chang, K Toula, SC Liou, WA Chiou Microscopy and Microanalysis 21 (S3), 1843-1844, 2015 | 3 | 2015 |
| Improvements of Secondary Electron Imaging and Endpoint Detection in Focused Ion Beam Circuit Modification V Ray, N Antoniou, A Krechmer, A Saxonis INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 338-342, 2003 | 3 | 2003 |
| FIB at Glancing Angle of Incidence V Ray FIB User Group ISTFA, 2013 | 2 | 2013 |
| Stage Current Monitoring and Endpointing in FIB V Ray, N Antoniou, N Bassom, A Soskov Presentation on 7th European FIB User Group Meeting, 2003 | 2 | 2003 |
| Real-time direct measurement of mechanical properties in-situ of scanning beam microscope J Favata, S Shahbazmohamadi, V Ray, A Hadjikhani US Patent 11,557,456, 2023 | 1 | 2023 |
| Anomalous enhancement of focused ion beam etching by single raster propagating toward ion beam at glancing incidence J Favata, V Ray, S Shahbazmohamadi Journal of Vacuum Science & Technology B 38 (6), 2020 | 1 | 2020 |
| Correlative 3D X-Ray, Laser Ablation, and SEM/EDS Mapping Establishing Access Point for FIB Tomography of Defects in Multi-Layer Ceramic Capacitors J Favata, V Ray, S Shahbazmohamadi Microscopy and Microanalysis 25 (S2), 344-345, 2019 | 1 | 2019 |
| Eliminating ESD Damage During FIB Operation V Ray https://www.researchgate.net/publication …, 2014 | 1 | 2014 |
Nicholas AntoniouPrimeNanoBestätigte E-Mail-Adresse bei antoniou.us
