Christian Boit
Christian Boit
Professor für Halbleiterbauelemente, TU Berlin
Bestätigte E-Mail-Adresse bei tu-berlin.de
Titel
Zitiert von
Zitiert von
Jahr
Cloning physically unclonable functions
C Helfmeier, C Boit, D Nedospasov, JP Seifert
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
2552013
Conducting atomic force microscopy for nanoscale electrical characterization of thin
A Olbrich, B Ebersberger, C Boit
Applied physics letters 73 (21), 3114-3116, 1998
2091998
Invasive PUF analysis
D Nedospasov, JP Seifert, C Helfmeier, C Boit
2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 30-38, 2013
1232013
Breaking and entering through the silicon
C Helfmeier, D Nedospasov, C Tarnovsky, JS Krissler, C Boit, JP Seifert
Proceedings of the 2013 ACM SIGSAC conference on Computer & communications …, 2013
1162013
Gallium gradients in Cu(In,Ga)Se2 thin‐film solar cells
W Witte, D Abou‐Ras, K Albe, GH Bauer, F Bertram, C Boit, ...
Progress in Photovoltaics: Research and Applications 23 (6), 717-733, 2015
1092015
Quantitative emission microscopy
J Kölzer, C Boit, A Dallmann, G Deboy, J Otto, D Weinmann
Journal of Applied Physics 71 (11), R23-R41, 1992
1071992
Physical characterization of arbiter PUFs
S Tajik, E Dietz, S Frohmann, JP Seifert, D Nedospasov, C Helfmeier, ...
International Workshop on Cryptographic Hardware and Embedded Systems, 493-509, 2014
1022014
Gold diffusion in silicon by rapid optical annealing
C Boit, F Lau, R Sittig
Applied Physics A 50 (2), 197-205, 1990
791990
Fundamentals of photon emission (PEM) in silicon-electroluminescence for analysis of electronic circuit and device functionality
C Boit
Microelectronics failure analysis: Desk reference 356, 368, 2004
782004
Laser fault attack on physically unclonable functions
S Tajik, H Lohrke, F Ganji, JP Seifert, C Boit
2015 workshop on fault diagnosis and tolerance in cryptography (FDTC), 85-96, 2015
702015
Microelectronic Failure Analysis. Desk Reference.
RJ Ross, C Boit, D Staab
ASM International, Member/Customer Service Center, Materials Park, OH 44073 …, 1999
651999
Principles of thermal laser stimulation techniques
F Beaudoin, R Desplats, P Perdu, C Boit
Microelectronic failure analysis desk reference, 417-425, 2004
602004
High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy
A Olbrich, B Ebersberger, C Boit, P Niedermann, W Hänni, J Vancea, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
581999
Quantitative investigation of laser beam modulation in electrically active devices as used in laser voltage probing
U Kindereit, G Woods, J Tian, U Kerst, R Leihkauf, C Boit
IEEE Transactions on Device and Materials Reliability 7 (1), 19-30, 2007
502007
On the power of optical contactless probing: Attacking bitstream encryption of FPGAs
S Tajik, H Lohrke, JP Seifert, C Boit
Proceedings of the 2017 ACM SIGSAC Conference on Computer and Communications …, 2017
412017
Oxide thickness mapping of ultrathin at nanometer scale with conducting atomic force microscopy
A Olbrich, B Ebersberger, C Boit, J Vancea, H Hoffmann, H Altmann, ...
Applied Physics Letters 78 (19), 2934-2936, 2001
402001
Physical vulnerabilities of physically unclonable functions
C Helfmeier, C Boit, D Nedospasov, S Tajik, JP Seifert
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
342014
Influence of GaN cap on robustness of AlGaN/GaN HEMTs
P Ivo, A Glowacki, R Pazirandeh, E Bahat-Treidel, R Lossy, J Wurfl, C Boit, ...
2009 IEEE International Reliability Physics Symposium, 71-75, 2009
342009
Photonic side-channel analysis of arbiter PUFs
S Tajik, E Dietz, S Frohmann, H Dittrich, D Nedospasov, C Helfmeier, ...
Journal of Cryptology 30 (2), 550-571, 2017
332017
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements
P Ivo, A Glowacki, E Bahat-Treidel, R Lossy, J Würfl, C Boit, G Tränkle
Microelectronics Reliability 51 (2), 217-223, 2011
332011
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