Christian Boit
Christian Boit
Professor für Halbleiterbauelemente, TU Berlin
Bestätigte E-Mail-Adresse bei tu-berlin.de
Titel
Zitiert von
Zitiert von
Jahr
Cloning physically unclonable functions
C Helfmeier, C Boit, D Nedospasov, JP Seifert
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
2702013
Conducting atomic force microscopy for nanoscale electrical characterization of thin
A Olbrich, B Ebersberger, C Boit
Applied physics letters 73 (21), 3114-3116, 1998
2101998
Invasive PUF analysis
D Nedospasov, JP Seifert, C Helfmeier, C Boit
2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 30-38, 2013
1342013
Breaking and entering through the silicon
C Helfmeier, D Nedospasov, C Tarnovsky, JS Krissler, C Boit, JP Seifert
Proceedings of the 2013 ACM SIGSAC conference on Computer & communications …, 2013
1272013
Gallium gradients in Cu(In,Ga)Se2 thin‐film solar cells
W Witte, D Abou‐Ras, K Albe, GH Bauer, F Bertram, C Boit, ...
Progress in Photovoltaics: Research and Applications 23 (6), 717-733, 2015
1132015
Physical characterization of arbiter PUFs
S Tajik, E Dietz, S Frohmann, JP Seifert, D Nedospasov, C Helfmeier, ...
International Workshop on Cryptographic Hardware and Embedded Systems, 493-509, 2014
1102014
Quantitative emission microscopy
J Kölzer, C Boit, A Dallmann, G Deboy, J Otto, D Weinmann
Journal of Applied Physics 71 (11), R23-R41, 1992
1061992
Fundamentals of photon emission (PEM) in silicon-electroluminescence for analysis of electronic circuit and device functionality
C Boit
Microelectronics failure analysis: Desk reference 356, 368, 2004
822004
Gold diffusion in silicon by rapid optical annealing
C Boit, F Lau, R Sittig
Applied Physics A 50 (2), 197-205, 1990
791990
Laser fault attack on physically unclonable functions
S Tajik, H Lohrke, F Ganji, JP Seifert, C Boit
2015 workshop on fault diagnosis and tolerance in cryptography (FDTC), 85-96, 2015
762015
Microelectronic Failure Analysis. Desk Reference.
RJ Ross, C Boit, D Staab
ASM International, Member/Customer Service Center, Materials Park, OH 44073 …, 1999
721999
Principles of thermal laser stimulation techniques
F Beaudoin, R Desplats, P Perdu, C Boit
Microelectronic failure analysis desk reference, 417-425, 2004
662004
High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy
A Olbrich, B Ebersberger, C Boit, P Niedermann, W Hänni, J Vancea, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
611999
On the power of optical contactless probing: Attacking bitstream encryption of FPGAs
S Tajik, H Lohrke, JP Seifert, C Boit
Proceedings of the 2017 ACM SIGSAC Conference on Computer and Communications …, 2017
532017
Quantitative investigation of laser beam modulation in electrically active devices as used in laser voltage probing
U Kindereit, G Woods, J Tian, U Kerst, R Leihkauf, C Boit
IEEE Transactions on Device and Materials Reliability 7 (1), 19-30, 2007
522007
Oxide thickness mapping of ultrathin at nanometer scale with conducting atomic force microscopy
A Olbrich, B Ebersberger, C Boit, J Vancea, H Hoffmann, H Altmann, ...
Applied Physics Letters 78 (19), 2934-2936, 2001
412001
Physical vulnerabilities of physically unclonable functions
C Helfmeier, C Boit, D Nedospasov, S Tajik, JP Seifert
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
382014
Key extraction using thermal laser stimulation
H Lohrke, S Tajik, T Krachenfels, C Boit, JP Seifert
IACR Transactions on Cryptographic Hardware and Embedded Systems, 573-595, 2018
372018
No place to hide: Contactless probing of secret data on FPGAs
H Lohrke, S Tajik, C Boit, JP Seifert
International Conference on Cryptographic Hardware and Embedded Systems, 147-167, 2016
372016
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements
P Ivo, A Glowacki, E Bahat-Treidel, R Lossy, J Würfl, C Boit, G Tränkle
Microelectronics Reliability 51 (2), 217-223, 2011
362011
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