| Cloning physically unclonable functions C Helfmeier, C Boit, D Nedospasov, JP Seifert 2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013 | 310 | 2013 |
| Conducting atomic force microscopy for nanoscale electrical characterization of thin A Olbrich, B Ebersberger, C Boit Applied physics letters 73 (21), 3114-3116, 1998 | 219 | 1998 |
| Invasive PUF analysis D Nedospasov, JP Seifert, C Helfmeier, C Boit 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 30-38, 2013 | 152 | 2013 |
| Breaking and entering through the silicon C Helfmeier, D Nedospasov, C Tarnovsky, JS Krissler, C Boit, JP Seifert Proceedings of the 2013 ACM SIGSAC conference on Computer & communications …, 2013 | 146 | 2013 |
| Physical characterization of arbiter PUFs S Tajik, E Dietz, S Frohmann, JP Seifert, D Nedospasov, C Helfmeier, ... International Workshop on Cryptographic Hardware and Embedded Systems, 493-509, 2014 | 128 | 2014 |
| Gallium gradients in Cu(In,Ga)Se2 thin‐film solar cells W Witte, D Abou‐Ras, K Albe, GH Bauer, F Bertram, C Boit, ... Progress in Photovoltaics: Research and Applications 23 (6), 717-733, 2015 | 127 | 2015 |
| Quantitative emission microscopy J Kölzer, C Boit, A Dallmann, G Deboy, J Otto, D Weinmann Journal of Applied Physics 71 (11), R23-R41, 1992 | 121 | 1992 |
| Fundamentals of photon emission (PEM) in silicon-electroluminescence for analysis of electronic circuit and device functionality C Boit Microelectronics failure analysis: Desk reference 356, 368, 2004 | 95 | 2004 |
| Laser fault attack on physically unclonable functions S Tajik, H Lohrke, F Ganji, JP Seifert, C Boit 2015 workshop on fault diagnosis and tolerance in cryptography (FDTC), 85-96, 2015 | 93 | 2015 |
| Microelectronic Failure Analysis. Desk Reference. RJ Ross, C Boit, D Staab ASM International, Member/Customer Service Center, Materials Park, OH 44073 …, 1999 | 89 | 1999 |
| Gold diffusion in silicon by rapid optical annealing C Boit, F Lau, R Sittig Applied Physics A 50 (2), 197-205, 1990 | 86 | 1990 |
| On the power of optical contactless probing: Attacking bitstream encryption of FPGAs S Tajik, H Lohrke, JP Seifert, C Boit Proceedings of the 2017 ACM SIGSAC Conference on Computer and Communications …, 2017 | 79 | 2017 |
| Principles of thermal laser stimulation techniques F Beaudoin, R Desplats, P Perdu, C Boit Microelectronic failure analysis desk reference, 417-425, 2004 | 74 | 2004 |
| Quantitative investigation of laser beam modulation in electrically active devices as used in laser voltage probing U Kindereit, G Woods, J Tian, U Kerst, R Leihkauf, C Boit IEEE Transactions on Device and Materials Reliability 7 (1), 19-30, 2007 | 72 | 2007 |
| High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy A Olbrich, B Ebersberger, C Boit, P Niedermann, W Hänni, J Vancea, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999 | 65 | 1999 |
| Key extraction using thermal laser stimulation: A case study on Xilinx Ultrascale FPGAs H Lohrke, S Tajik, T Krachenfels, C Boit, JP Seifert IACR Transactions on Cryptographic Hardware and Embedded Systems, 573-595, 2018 | 61 | 2018 |
| Photonic side-channel analysis of arbiter PUFs S Tajik, E Dietz, S Frohmann, H Dittrich, D Nedospasov, C Helfmeier, ... Journal of Cryptology 30 (2), 550-571, 2017 | 57 | 2017 |
| No place to hide: Contactless probing of secret data on FPGAs H Lohrke, S Tajik, C Boit, JP Seifert International Conference on Cryptographic Hardware and Embedded Systems, 147-167, 2016 | 50 | 2016 |
| Physical vulnerabilities of physically unclonable functions C Helfmeier, C Boit, D Nedospasov, S Tajik, JP Seifert 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014 | 44 | 2014 |
| Oxide thickness mapping of ultrathin at nanometer scale with conducting atomic force microscopy A Olbrich, B Ebersberger, C Boit, J Vancea, H Hoffmann, H Altmann, ... Applied Physics Letters 78 (19), 2934-2936, 2001 | 43 | 2001 |
Jean-Pierre SeifertProfessor for Computer & Communication Security, TU Berlin & T-LabsVerified email at tu-berlin.de
