Thomas Philippe
Thomas Philippe
CNRS researcher, PMC, Ecole Polytechnique
Bestätigte E-Mail-Adresse bei polytechnique.edu
Titel
Zitiert von
Zitiert von
Jahr
Ostwald ripening in multicomponent alloys
T Philippe, PW Voorhees
Acta Materialia 61 (11), 4237-4244, 2013
1162013
Clustering and nearest neighbour distances in atom-probe tomography
T Philippe, F De Geuser, S Duguay, W Lefebvre, O Cojocaru-Mirédin, ...
Ultramicroscopy 109 (10), 1304-1309, 2009
962009
Direct imaging of boron segregation to extended defects in silicon
S Duguay, T Philippe, F Cristiano, D Blavette
Applied Physics Letters 97 (24), 242104, 2010
532010
Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography
W Lefebvre, T Philippe, F Vurpillot
Ultramicroscopy 111 (3), 200-206, 2011
402011
Clustering and local magnification effects in atom probe tomography: a statistical approach
T Philippe, M Gruber, F Vurpillot, D Blavette
Microscopy and Microanalysis 16 (5), 643, 2010
302010
Clustering and pair correlation function in atom probe tomography
T Philippe, S Duguay, D Blavette
Ultramicroscopy 110 (7), 862-865, 2010
262010
Modeling of precipitation kinetics in multicomponent systems: Application to model superalloys
M Bonvalet, T Philippe, X Sauvage, D Blavette
Acta Materialia 100, 169-177, 2015
232015
Nucleation pathway in coherent precipitation
T Philippe, D Blavette
Philosophical Magazine 91 (36), 4606-4622, 2011
212011
Minimum free-energy pathway of nucleation
T Philippe, D Blavette
The Journal of chemical physics 135 (13), 134508, 2011
212011
Evidence of atomic-scale arsenic clustering in highly doped silicon
S Duguay, F Vurpillot, T Philippe, E Cadel, R Lardé, B Deconihout, ...
Journal of Applied Physics 106 (10), 106102, 2009
182009
Atomic scale evidence of the suppression of boron clustering in implanted silicon by carbon coimplantation
T Philippe, S Duguay, D Mathiot, D Blavette
Journal of Applied Physics 109 (2), 023501, 2011
172011
Atom-scale compositional distribution in InAlAsSb-based triple junction solar cells by atom probe tomography
J Hernández-Saz, M Herrera, FJ Delgado, S Duguay, T Philippe, ...
Nanotechnology 27 (30), 305402, 2016
152016
Critical nucleus composition in a multicomponent system
T Philippe, D Blavette, PW Voorhees
The Journal of chemical physics 141 (12), 124306, 2014
152014
Point process statistics in atom probe tomography
T Philippe, S Duguay, G Grancher, D Blavette
Ultramicroscopy 132, 114-120, 2013
122013
Kinetics pathway of precipitation in model Co-Al-W superalloy
A Azzam, T Philippe, A Hauet, F Danoix, D Locq, P Caron, D Blavette
Acta Materialia 145, 377-387, 2018
112018
Thermal stability of amorphous Zn-In-Sn-O films
DE Proffit, T Philippe, JD Emery, Q Ma, BD Buchholz, PW Voorhees, ...
Journal of Electroceramics 34 (2-3), 167-174, 2015
112015
Modeling interface-controlled phase transformation kinetics in thin films
EL Pang, NQ Vo, T Philippe, PW Voorhees
Journal of Applied Physics 117 (17), 175304, 2015
102015
Clustering and nearest neighbour distances in atom probe tomography: The influence of the interfaces
T Philippe, O Cojocaru‐Mirédin, S Duguay, D Blavette
Journal of microscopy 239 (1), 72-77, 2010
92010
Simulation of phase transformation kinetics in thin films under a constant nucleation rate
MM Moghadam, EL Pang, T Philippe, PW Voorhees
Thin Solid Films 612, 437-444, 2016
82016
A phase-field study of the aluminizing of nickel
T Philippe, D Erdeniz, DC Dunand, PW Voorhees
Philosophical Magazine 95 (9), 935-947, 2015
82015
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