Sani Nassif
Sani Nassif
Radyalis LLC
Bestätigte E-Mail-Adresse bei radyalis.com - Startseite
Titel
Zitiert von
Zitiert von
Jahr
High-performance CMOS variability in the 65-nm regime and beyond
K Bernstein, DJ Frank, AE Gattiker, W Haensch, BL Ji, SR Nassif, ...
IBM journal of research and development 50 (4.5), 433-449, 2006
6672006
Modeling and analysis of manufacturing variations
SR Nassif
Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No …, 2001
5422001
Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events
R Kanj, R Joshi, S Nassif
2006 43rd ACM/IEEE Design Automation Conference, 69-72, 2006
3872006
Full chip leakage estimation considering power supply and temperature variations
H Su, F Liu, A Devgan, E Acar, S Nassif
Proceedings of the 2003 international symposium on Low power electronics and …, 2003
3422003
A multigrid-like technique for power grid analysis
JN Kozhaya, SR Nassif, FN Najm
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2002
3272002
Delay variability: sources, impacts and trends
S Nassif
2000 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2000
3022000
Design for variability in DSM technologies [deep submicron technologies]
SR Nassif
Proceedings IEEE 2000 First International Symposium on Quality Electronic …, 2000
2922000
Design for manufacturability and statistical design: a constructive approach
M Orshansky, S Nassif, D Boning
Springer Science & Business Media, 2007
2742007
Models of process variations in device and interconnect
D Boning, S Nassif
Design of high performance microprocessor circuits, 6, 2000
2422000
Fast power grid simulation
SR Nassif, JN Kozhaya
Proceedings of the 37th Annual Design Automation Conference, 156-161, 2000
2392000
Optimal decoupling capacitor sizing and placement for standard-cell layout designs
H Su, SS Sapatnekar, SR Nassif
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2003
233*2003
Power grid analysis benchmarks
SR Nassif
2008 Asia and South Pacific Design Automation Conference, 376-381, 2008
2232008
Reliable on-chip systems in the nano-era: Lessons learnt and future trends
J Henkel, L Bauer, N Dutt, P Gupta, S Nassif, M Shafique, M Tahoori, ...
2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 1-10, 2013
2202013
Random walks in a supply network
H Qian, SR Nassif, SS Sapatnekar
Proceedings of the 40th Annual Design Automation Conference, 93-98, 2003
2102003
Benefits and costs of power-gating technique
H Jiang, M Marek-Sadowska, SR Nassif
2005 International conference on computer design, 559-566, 2005
2092005
Power grid analysis using random walks
H Qian, SR Nassif, SS Sapatnekar
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005
1952005
Statistical analysis of SRAM cell stability
K Agarwal, S Nassif
Proceedings of the 43rd annual Design Automation Conference, 57-62, 2006
1892006
FABRICS II: A statistically based IC fabrication process simulator
SR Nassif, AJ Strojwas, SW Director
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1984
1801984
Characterizing process variation in nanometer CMOS
K Agarwal, S Nassif
Proceedings of the 44th annual Design Automation Conference, 396-399, 2007
1762007
Impact of interconnect variations on the clock skew of a gigahertz microprocessor
Y Liu, SR Nassif, LT Pileggi, AJ Strojwas
Proceedings of the 37th Annual Design Automation Conference, 168-171, 2000
1762000
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20