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HISATO YABUTA
Title
Cited by
Cited by
Year
Field effect transistor manufacturing method
H Yabuta, M Sano, T Iwasaki, H Hosono, T Kamiya, K Nomura
US Patent 7,829,444, 2010
37632010
Oxide semiconductor thin film transistor and method of manufacturing the same
H Yabuta
US Patent App. 11/511,263, 2007
37132007
Method of fabricating oxide semiconductor device
N Kaji, H Yabuta
US Patent 7,468,304, 2008
37102008
High-mobility thin-film transistor with amorphous channel fabricated by room temperature rf-magnetron sputtering
H Yabuta, M Sano, K Abe, T Aiba, T Den, H Kumomi, K Nomura, T Kamiya, ...
Applied physics letters 89 (11), 112123, 2006
14272006
42.1: Invited Paper: Improved Amorphous In‐Ga‐Zn‐O TFTs
R Hayashi, A Sato, M Ofuji, K Abe, H Yabuta, M Sano, H Kumomi, ...
SID Symposium Digest of Technical Papers 39 (1), 621-624, 2008
6832008
Oxide semiconductor device including insulating layer and display apparatus using the same
A Sato, R Hayashi, H Yabuta, T Watanabe
US Patent 8,502,217, 2013
2972013
Bottom gate type thin film transistor, method of manufacturing the same, and display apparatus
R Hayashi, N Kaji, H Yabuta
US Patent 8,148,721, 2012
2902012
Method for manufacturing thin film transistor using oxide semiconductor and display apparatus
H Omura, R Hayashi, N Kaji, H Yabuta
US Patent 8,143,115, 2012
2602012
Sputtering formation of -type SnO thin-film transistors on glass toward oxide complimentary circuits
H Yabuta, N Kaji, R Hayashi, H Kumomi, K Nomura, T Kamiya, M Hirano, ...
Applied Physics Letters 97 (7), 072111, 2010
2532010
Thin-film transistor and method of manufacturing same
N Kaji, R Hayashi, H Yabuta, K Abe
US Patent 9,153,703, 2015
2222015
Bottom gate type thin film transistor, method of manufacturing the same, and display apparatus
R Hayashi, N Kaji, H Yabuta
US Patent App. 13/419,417, 2012
1862012
(Ba+Sr)/Ti ratio dependence of the dielectric properties for (Ba0.5Sr0.5)TiO3 thin films prepared by ion beam sputtering
S Yamamichi, H Yabuta, T Sakuma, Y Miyasaka
Applied physics letters 64 (13), 1644-1646, 1994
1731994
Method for manufacturing field-effect transistor
R Hayashi, H Yabuta, Y Tateishi, N Kaji
US Patent 8,110,436, 2012
1702012
Circuits using uniform TFTs based on amorphous In‐Ga‐Zn‐O
R Hayashi, M Ofuji, N Kaji, K Takahashi, K Abe, H Yabuta, M Sano, ...
Journal of the Society for Information Display 15 (11), 915-921, 2007
1392007
Thin film transistor and method of manufacturing the same
A Sato, R Hayashi, H Yabuta, M Sano
US Patent 8,445,902, 2013
1352013
Thin film transistor, method of manufacturing the same, and display apparatus
R Hayashi, N Kaji, H Yabuta
US Patent 9,905,699, 2018
1132018
Top gate thin film transistor and display apparatus including the same
A Sato, H Kumomi, H Yabuta, R Hayashi, Y Takai
US Patent 8,624,240, 2014
962014
Structural, dielectric, and piezoelectric properties of Mn-doped BaTiO3–Bi (Mg1/2Ti1/2) O3–BiFeO3 ceramics
I Fujii, R Mitsui, K Nakashima, N Kumada, M Shimada, T Watanabe, ...
Japanese journal of applied physics 50 (9S2), 09ND07, 2011
962011
Materials, devices, and circuits of transparent amorphous-oxide semiconductor
H Kumomi, S Yaginuma, H Omura, A Goyal, A Sato, M Watanabe, ...
Journal of Display Technology 5 (12), 531-540, 2009
892009
A stacked capacitor technology with ECR plasma MOCVD (Ba, Sr) TiO/sub 3/and RuO/sub 2//Ru/TiN/TiSi/sub x/storage nodes for Gb-scale DRAMs
S Yamamichi, P Lesaicherre, H Yamaguchi, K Takemura, S Sone, ...
IEEE Transactions on Electron Devices 44 (7), 1076-1083, 1997
711997
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