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Co-authors
- Jianping YaoProfessor of Electrical Engineering, University of OttawaVerified email at uottawa.ca
- Zheng LiuUniversity of British Columbia (Okanagan)Verified email at ubc.ca
- Tuan GuoProfessor, Jinan University, ChinaVerified email at jnu.edu.cn
- Jacques AlbertProfessor of Electrical Engineering, Carleton UniversityVerified email at carleton.ca
- Rony AmayaCarleton UniversityVerified email at carleton.ca
- Jiaren LiuNational Research Council of Canada, University of Toronto, University of Texas A&M UniversityVerified email at nrc-cnrc.gc.ca
- Martin E. R. ShanahanProfessor, University of BordeauxVerified email at u-bordeaux.fr
- Wenjie MaiJinan UniversityVerified email at email.jnu.edu.cn
- Nasibeh RahimiIntelVerified email at intel.com
- Yahia AntarProfessor of Electrical and Computer EngineeringVerified email at rmc.ca
- Chang-qing XuProfessorVerified email at mcmaster.ca