| Coexistence of clusters, GPB zones, S ″-, S′-and S-phases in an Al–0.9% Cu–1.4% Mg alloy A Charai, T Walther, C Alfonso, AM Zahra, CY Zahra Acta materialia 48 (10), 2751-2764, 2000 | 221 | 2000 |
| The meandering of steps and the terrace width distribution on clean Si (111): An in-situ experiment using reflection electron microscopy C Alfonso, JM Bermond, JC Heyraud, JJ Métois Surface science 262 (3), 371-381, 1992 | 211 | 1992 |
| About the sublimation of Si surfaces vicinal of {111} C Alfonso, JC Heyraud, JJ Metois Surface Science Letters 291 (1-2), L745-L749, 1993 | 92 | 1993 |
| Comments on “cluster hardening in an aged Al-Cu-Mg alloy” AM Zahra, CY Zahra, C Alfonso, A Charaı Scripta Materialia 39 (11), 1553-1558, 1998 | 77 | 1998 |
| Three-dimensional X-ray Fourier transform holography: The Bragg case V Chamard, J Stangl, G Carbone, A Diaz, G Chen, C Alfonso, C Mocuta, ... Physical review letters 104 (16), 165501, 2010 | 45 | 2010 |
| Transmission electron microscopy investigation of tin sub‐oxide nucleation upon SnO2 deposition on silicon C Alfonso, A Charaï, A Armigliato, D Narducci Applied physics letters 68 (9), 1207-1208, 1996 | 29 | 1996 |
| Reflection electron microscopy studies of the step meandering and evaporation on vicinal surfaces of silicon JM Bermond, JJ Métois, JC Heyraud, C Alfonso Surface science 331, 855-864, 1995 | 26 | 1995 |
| Stress affected transformation in low alloy steels–factors limiting prediction of plastic strains U Ahrens, HJ Maier, AELM Maksoud Journal de Physique IV (Proceedings) 120, 615-623, 2004 | 21 | 2004 |
| to be increased up to N= 5 or 6 to get a good Surf C Alfonso, JM Bermond, JC Heyraud, JJ Métois Sci 262, 371, 1992 | 16 | 1992 |
| Ferromagnetic MnCoGe thin films produced via magnetron sputtering and non-diffusive reaction A Portavoce, E Assaf, C Alvarez, M Bertoglio, R Clérac, K Hoummada, ... Applied Surface Science 437, 336-346, 2018 | 15 | 2018 |
| Structural and optoelectronical characterization of Si–SiO2/SiO2 multilayers with applications in all Si tandem solar cells D Maestre, O Palais, D Barakel, M Pasquinelli, C Alfonso, F Gourbilleau, ... Journal of Applied Physics 107 (6), 2010 | 11 | 2010 |
| Simple approach for the fabrication of PEDOT-coated Si nanowires M Zhu, M Eyraud, J Le Rouzo, NA Ahmed, F Boulc’h, C Alfonso, P Knauth, ... Beilstein Journal of Nanotechnology 6 (1), 640-650, 2015 | 10 | 2015 |
| HOLZ lines splitting on SiGe/Si relaxed samples: Analytical solutions for the kinematical equation C Alfonso, L Alexandre, C Leroux, G Jurczak, W Saikaly, A Charai, ... Ultramicroscopy 110 (4), 285-296, 2010 | 10 | 2010 |
| Microstructure and residual stresses in (111) AuNi multilayers S Labat, B Pichaud, O Thomas, C Alfonso, A Charai, L Barrallier, B Gilles, ... Thin solid films 275 (1-2), 29-34, 1996 | 10 | 1996 |
| On the mechanism ruling the morphology of silicon nanowires obtained by one-pot metal-assisted chemical etching S Magagna, D Narducci, C Alfonso, E Dimaggio, G Pennelli, A Charaï Nanotechnology 31 (40), 404002, 2020 | 9 | 2020 |
| Mechanical and microstructural studies of (111) Au/Ni multilayers S Labat, O Thomas, P Gergaud, A Charai, C Alfonso, L Barrallier, B Gilles, ... Le Journal de Physique IV 6 (C7), C7-135-C7-142, 1996 | 9 | 1996 |
| Gold coverage and faceting of MBE grown silicon nanowires T David, L Roussel, T Neisius, M Cabie, M Gailhanou, C Alfonso Journal of crystal growth 383, 151-157, 2013 | 8 | 2013 |
| Dislocation nucleation in heteroepitaxial semiconducting films B Pichaud, N Burle, M Texier, C Alfonso, M Gailhanou, ... physica status solidi c 6 (8), 1827-1835, 2009 | 8 | 2009 |
| Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction L Alexandre, K Rousseau, C Alfonso, W Saikaly, L Fares, C Grosjean, ... Micron 39 (3), 294-301, 2008 | 8 | 2008 |
| A reflection electron microscopy investigation of the divergence of the mean correlated difference of step displacements on a Si (111) vicinal surface JC Heyraud, JM Bermond, C Alfonso, JJ Métois Journal de Physique I 5 (4), 443-449, 1995 | 7 | 1995 |
