John S Fletcher
John S Fletcher
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Titel
Zitiert von
Zitiert von
Jahr
TOF-SIMS 3D biomolecular imaging of Xenopus laevis oocytes using buckminsterfullerene (C60) primary ions
JS Fletcher, NP Lockyer, S Vaidyanathan, JC Vickerman
Analytical Chemistry 79 (6), 2199-2206, 2007
3072007
A new dynamic in mass spectral imaging of single biological cells
JS Fletcher, S Rabbani, A Henderson, P Blenkinsopp, SP Thompson, ...
Analytical Chemistry 80 (23), 9058-9064, 2008
2602008
TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+
S Rabbani, AM Barber, JS Fletcher, NP Lockyer, JC Vickerman
Analytical chemistry 83 (10), 3793-3800, 2011
1822011
Developments in molecular SIMS depth profiling and 3D imaging of biological systems using polyatomic primary ions
JS Fletcher, NP Lockyer, JC Vickerman
Mass spectrometry reviews 30 (1), 142-174, 2011
1362011
Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions
JS Fletcher, JC Vickerman
Analytical chemistry 85 (2), 610-639, 2013
1332013
The inherent problem of transflection-mode infrared spectroscopic microscopy and the ramifications for biomedical single point and imaging applications
P Bassan, J Lee, A Sachdeva, J Pissardini, KM Dorling, JS Fletcher, ...
Analyst 138 (1), 144-157, 2013
1252013
Three‐dimensional mass spectral imaging of HeLa‐M cells–sample preparation, data interpretation and visualisation
JS Fletcher, S Rabbani, A Henderson, NP Lockyer, JC Vickerman
Rapid Communications in Mass Spectrometry 25 (7), 925-932, 2011
1152011
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage
JS Fletcher, XA Conlan, EA Jones, G Biddulph, NP Lockyer, ...
Analytical chemistry 78 (6), 1827-1831, 2006
962006
A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems
JS Fletcher, JC Vickerman
Analytical and bioanalytical chemistry 396 (1), 85-104, 2010
952010
Cellular imaging with secondary ion mass spectrometry
JS Fletcher
Analyst 134 (11), 2204-2215, 2009
922009
Label free biochemical 2D and 3D imaging using secondary ion mass spectrometry
JS Fletcher, JC Vickerman, N Winograd
Current opinion in chemical biology 15 (5), 733-740, 2011
812011
Enhancing secondary ion yields in time of flight-secondary ion mass spectrometry using water cluster primary beams
S Sheraz née Rabbani, A Barber, JS Fletcher, NP Lockyer, JC Vickerman
Analytical chemistry 85 (12), 5654-5658, 2013
772013
High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry
TB Angerer, P Blenkinsopp, JS Fletcher
International Journal of Mass Spectrometry 377, 591-598, 2015
732015
A new time‐of‐flight SIMS instrument for 3D imaging and analysis
R Hill, P Blenkinsopp, S Thompson, J Vickerman, JS Fletcher
Surface and interface analysis 43 (1‐2), 506-509, 2011
702011
A comparison of PCA and MAF for ToF‐SIMS image interpretation
A Henderson, JS Fletcher, JC Vickerman
Surface and Interface Analysis: An International Journal devoted to the …, 2009
632009
Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, SJ Spencer, IS Gilmore, MR Alexander, ...
The Journal of Physical Chemistry B 119 (33), 10784-10797, 2015
532015
Subsurface biomolecular imaging of Streptomyces coelicolor using secondary ion mass spectrometry
S Vaidyanathan, JS Fletcher, R Goodacre, NP Lockyer, J Micklefield, ...
Analytical chemistry 80 (6), 1942-1951, 2008
532008
Lipid heterogeneity resulting from fatty acid processing in the human breast cancer microenvironment identified by GCIB-ToF-SIMS imaging
TB Angerer, Y Magnusson, G Landberg, JS Fletcher
Analytical chemistry 88 (23), 11946-11954, 2016
502016
Improved molecular imaging in rodent brain with time-of-flight-secondary ion mass spectrometry using gas cluster ion beams and reactive vapor exposure
TB Angerer, M Dowlatshahi Pour, P Malmberg, JS Fletcher
Analytical chemistry 87 (8), 4305-4313, 2015
502015
ToF-SIMS analysis of bio-systems: Are polyatomic primary ions the solution?
EA Jones, JS Fletcher, CE Thompson, DA Jackson, NP Lockyer, ...
Applied surface science 252 (19), 6844-6854, 2006
502006
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