| Preparation and Precise Structural Determination of a Second Ga84 Cluster Compound. A First Hint for Cluster Doping and Its Fundamental Consequences in the … A Schnepf, B Jee, H Schnöckel, E Weckert, A Meents, D Lübbert, ... Inorganic chemistry 42 (24), 7731-7733, 2003 | 122 | 2003 |
| μm-resolved high resolution X-ray diffraction imaging for semiconductor quality control D Lübbert, T Baumbach, J Härtwig, E Boller, E Pernot Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2000 | 120 | 2000 |
| Accurate rocking-curve measurements on protein crystals grown in a homogeneous magnetic field of 2.4 T D Lübbert, A Meents, E Weckert Acta Crystallographica Section D: Biological Crystallography 60 (6), 987-998, 2004 | 63 | 2004 |
| Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers V Holý, AA Darhuber, J Stangl, S Zerlauth, F Schäffler, G Bauer, ... Physical Review B 58 (12), 7934, 1998 | 60 | 1998 |
| Spatial resolution in Bragg‐magnified X‐ray images as determined by Fourier analysis P Modregger, D Lübbert, P Schäfer, R Köhler physica status solidi (a) 204 (8), 2746-2752, 2007 | 59 | 2007 |
| CO2-Bilanzen verschiedener Energieträger im Vergleich D Lübbert Deutscher Bundestag, 2007 | 40* | 2007 |
| Structure of Superconducting [BaCuOx]2/[CaCuO2]n Superlattices on SrTiO3(001) Investigated by X‐ray Scattering C Aruta, J Zegenhagen, B Cowie, G Balestrino, G Pasquini, PG Medaglia, ... physica status solidi (a) 183 (2), 353-364, 2001 | 34 | 2001 |
| Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction T Baumbach, D Lübbert, M Gailhanou Journal of Applied Physics 87 (8), 3744-3758, 2000 | 33 | 2000 |
| Magnified x-ray phase imaging using asymmetric Bragg reflection: Experiment and theory P Modregger, D Lübbert, P Schäfer, R Köhler Physical Review B 74 (5), 054107, 2006 | 32 | 2006 |
| Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging D Lübbert, C Ferrari, P Mikulík, P Pernot, L Helfen, N Verdi, D Korytár, ... Journal of applied crystallography 38 (1), 91-96, 2005 | 32 | 2005 |
| Dislocation strain field in ultrathin bonded silicon wafers studied by grazing incidence x-ray diffraction J Eymery, D Buttard, F Fournel, H Moriceau, GT Baumbach, D Lübbert Physical Review B 65 (16), 165337, 2002 | 31 | 2002 |
| Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping P Mikulík, D Lübbert, D Korytár, P Pernot, T Baumbach Journal of Physics D: Applied Physics 36 (10A), A74, 2003 | 28 | 2003 |
| Grazing incidence diffraction by laterally patterned semiconductor nanostructures T Baumbach, D Lübbert Journal of Physics D: Applied Physics 32 (6), 726, 1999 | 28 | 1999 |
| Fresnel diffraction in the case of an inclined image plane P Modregger, D Lübbert, P Schäfer, R Köhler, T Weitkamp, M Hanke, ... Optics express 16 (7), 5141-5149, 2008 | 26 | 2008 |
| Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice V Holý, J Stangl, S Zerlauth, G Bauer, N Darowski, D Lübbert, U Pietsch Journal of Physics D: Applied Physics 32 (10A), A234, 1999 | 25 | 1999 |
| Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis V Holý, T Baumbach, D Lübbert, L Helfen, M Ellyan, P Mikulík, S Keller, ... Physical Review B 77 (9), 094102, 2008 | 24 | 2008 |
| Two dimensional diffraction enhanced imaging algorithm P Modregger, D Lübbert, P Schäfer, R Köhler Applied physics letters 90 (19), 193501, 2007 | 24 | 2007 |
| X-ray analysis of temperature induced defect structures in boron implanted silicon M Sztucki, TH Metzger, I Kegel, A Tilke, JL Rouvière, D Lübbert, J Arthur, ... Journal of applied physics 92 (7), 3694-3703, 2002 | 24 | 2002 |
| Direktmandatsorientierte Proporzanpassung: eine mit der Personenwahl verbundene Verhältniswahl ohne negative Stimmgewichte R Peifer, D Lübbert, KF Oelbermann, F Pukelsheim | 23 | 2012 |
| Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction N Darowski, K Paschke, U Pietsch, K Wang, A Forchel, D Lübbert, ... Physica B: Condensed Matter 248 (1-4), 104-108, 1998 | 22 | 1998 |
