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Christopher Münch
Christopher Münch
Bestätigte E-Mail-Adresse bei kit.edu
Titel
Zitiert von
Zitiert von
Jahr
Reliable in-memory neuromorphic computing using spintronics
C Münch, R Bishnoi, MB Tahoori
Proceedings of the 24th Asia and South Pacific design automation conference …, 2019
142019
Defect characterization and test generation for spintronic-based compute-in-memory
SM Nair, C Münch, MB Tahoori
2020 IEEE European Test Symposium (ETS), 1-6, 2020
132020
Special session–emerging memristor based memory and CIM architecture: Test, repair and yield analysis
R Bishnoi, L Wu, M Fieback, C Münch, SM Nair, M Tahoori, Y Wang, H Li, ...
2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020
82020
Tolerating retention failures in neuromorphic fabric based on emerging resistive memories
C Münch, R Bishnoi, MB Tahoori
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 393-400, 2020
62020
Multi-bit non-volatile spintronic flip-flop
C Münch, R Bishnoi, MB Tahoori
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2018
32018
Neuroscrub: Mitigating retention failures using approximate scrubbing in neuromorphic fabric based on resistive memories
ST Ahmed, M Hefenbrock, C Münch, MB Tahoori
2021 IEEE European Test Symposium (ETS), 1-6, 2021
22021
Testing resistive memory based neuromorphic architectures using reference trimming
C Münch, MB Tahoori
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021
22021
Defect characterization of spintronic-based neuromorphic circuits
C Münch, MB Tahoori
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
22020
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM
C Münch, J Yun, M Keim, MB Tahoori
2021 IEEE European Test Symposium (ETS), 1-6, 2021
12021
SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
ST Ahmed, K Danouchi, C Münch, G Prenat, L Anghel, MB Tahoori
TechRxiv, 2022
2022
NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
ST Ahmed, M Hefenbrock, C Münch, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022
2022
Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
ST Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori
2022 IEEE European Test Symposium (ETS), 1-2, 2022
2022
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
M Fieback, C Münch, A Gebregiorgis, GC Medeiros, M Taouil, S Hamdioui, ...
2022 IEEE European Test Symposium (ETS), 1-6, 2022
2022
MBIST-based Trim-Search Test Time Reduction for STT-MRAM
C Münch, J Yun, M Keim, MB Tahoori
2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022
2022
Special Session: STT-MRAMs: Technology, Design and Test
A Gebregiorgis, L Wu, C Münch, S Rao, MB Tahoori, S Hamdioui
2022 IEEE 40th VLSI Test Symposium (VTS), 1-10, 2022
2022
Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
M Mayahinia, C Münch, MB Tahoori
2021 IEEE International Test Conference (ITC), 268-277, 2021
2021
A Novel Oscillation-Based Reconfigurable In-Memory Computing Scheme With Error Correction
C Münch, N Sayed, R Bishnoi, M Tahoori
IEEE Transactions on Magnetics 57 (2), 1-10, 2020
2020
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