Defect characterization and test generation for spintronic-based compute-in-memory SM Nair, C Münch, MB Tahoori 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 15 | 2020 |
Reliable in-memory neuromorphic computing using spintronics C Münch, R Bishnoi, MB Tahoori Proceedings of the 24th Asia and South Pacific design automation conference …, 2019 | 14 | 2019 |
Special session–emerging memristor based memory and CIM architecture: Test, repair and yield analysis R Bishnoi, L Wu, M Fieback, C Münch, SM Nair, M Tahoori, Y Wang, H Li, ... 2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020 | 9 | 2020 |
Tolerating retention failures in neuromorphic fabric based on emerging resistive memories C Münch, R Bishnoi, MB Tahoori 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 393-400, 2020 | 7 | 2020 |
Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric ST Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori 2022 IEEE European Test Symposium (ETS), 1-2, 2022 | 3 | 2022 |
Testing resistive memory based neuromorphic architectures using reference trimming C Münch, MB Tahoori 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021 | 3 | 2021 |
Multi-bit non-volatile spintronic flip-flop C Münch, R Bishnoi, MB Tahoori 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2018 | 3 | 2018 |
Mbist-supported trim adjustment to compensate thermal behavior of mram C Münch, J Yun, M Keim, MB Tahoori 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 2 | 2021 |
Neuroscrub: Mitigating retention failures using approximate scrubbing in neuromorphic fabric based on resistive memories ST Ahmed, M Hefenbrock, C Münch, MB Tahoori 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 2 | 2021 |
A Novel Oscillation-Based Reconfigurable In-Memory Computing Scheme With Error Correction C Münch, N Sayed, R Bishnoi, M Tahoori IEEE Transactions on Magnetics 57 (2), 1-10, 2020 | 2 | 2020 |
Defect characterization of spintronic-based neuromorphic circuits C Münch, MB Tahoori 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 2 | 2020 |
NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories ST Ahmed, M Hefenbrock, C Münch, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022 | 1 | 2022 |
Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration V Rietz, C Münch, M Mayahinia, M Tahoori it-Information Technology, 2023 | | 2023 |
SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation ST Ahmed, K Danouchi, C Münch, G Prenat, L Anghel, MB Tahoori IEEE Journal on Emerging and Selected Topics in Circuits and Systems 13 (1 …, 2023 | | 2023 |
Automatic Test Pattern Generation and Compaction for Deep Neural Networks D Moussa, M Hefenbrock, C Münch, M Tahoori Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | | 2023 |
Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices S Tuhin, K Danouchi, C Münch, G Prenat, L Anghel, MB Tahoori 17th ACM International Symposium on Nanoscale Architectures, 2022 | | 2022 |
A Spintronic 2M/7T Computation-in-Memory Cell A Jafari, C Münch, M Tahoori Journal of Low Power Electronics and Applications 12 (4), 63, 2022 | | 2022 |
MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories A Jafari, M Mayahinia, ST Ahmed, C Münch, MB Tahoori 2022 25th Euromicro Conference on Digital System Design (DSD), 332-339, 2022 | | 2022 |
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory M Fieback, C Münch, A Gebregiorgis, GC Medeiros, M Taouil, S Hamdioui, ... 2022 IEEE European Test Symposium (ETS), 1-6, 2022 | | 2022 |
MBIST-based Trim-Search Test Time Reduction for STT-MRAM C Münch, J Yun, M Keim, MB Tahoori 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | | 2022 |