| Exploring superior structural materials using multi-objective optimization and formal techniques R Drechsler, S Eggersgluß, N Ellendt, S Huhn, L Madler 2016 Sixth International Symposium on Embedded Computing and System Design …, 2016 | 17 | 2016 |
| Optimization of retargeting for IEEE 1149.1 TAP controllers with embedded compression S Huhn, S Eggersglüß, K Chakrabarty, R Drechsler Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 14 | 2017 |
| SAT-Lancer: a hardware SAT-solver for self-verification B Ustaoglu, S Huhn, D Große, R Drechsler Proceedings of the 2018 on Great Lakes Symposium on VLSI, 479-482, 2018 | 11 | 2018 |
| Power-aware test scheduling for IEEE 1687 networks with multiple power domains P Habiby, S Huhn, R Drechsler 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 10 | 2020 |
| Determining application-specific knowledge for improving robustness of sequential circuits S Huhn, S Frehse, R Wille, R Drechsler IEEE Transactions on very large scale integration (VLSI) systems 27 (4), 875-887, 2019 | 10 | 2019 |
| Revealing properties of structural materials by combining regression-based algorithms and nano indentation measurements S Huhn, H Sonnenberg, S Eggersglüß, B Clausen, R Drechsler 2017 IEEE Symposium Series on Computational Intelligence (SSCI), 1-6, 2017 | 10 | 2017 |
| VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers S Huhn, S Eggersglüß, R Drechsler 2016 21th IEEE European Test Symposium (ETS), 1-6, 2016 | 10 | 2016 |
| Optimization-based test scheduling for IEEE 1687 multi-power domain networks using Boolean satisfiability P Habiby, S Huhn, R Drechsler 2021 16th International Conference on Design & Technology of Integrated …, 2021 | 9 | 2021 |
| Hybrid architecture for embedded test compression to process rejected test patterns S Huhn, D Tille, R Drechsler 2019 IEEE European Test Symposium (ETS), 1-2, 2019 | 9 | 2019 |
| Reconfigurable TAP controllers with embedded compression for large test data volume S Huhn, S Eggersglüß, R Drechsler 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017 | 7 | 2017 |
| Enhancing robustness of sequential circuits using application-specific knowledge and formal methods S Huhn, S Frehse, R Wille, R Drechsler 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 182-187, 2017 | 6 | 2017 |
| Power-aware test scheduling framework for IEEE 1687 multi-power domain networks using formal techniques P Habiby, S Huhn, R Drechsler Microelectronics Reliability 134, 114551, 2022 | 4 | 2022 |
| Quality assessment of RFET-based logic locking protection mechanisms using formal methods M Merten, S Huhn, R Drechsler 2022 IEEE European Test Symposium (ETS), 1-2, 2022 | 4 | 2022 |
| Combining machine learning and formal techniques for small data applications-A framework to explore new structural materials R Drechsler, S Huhn, C Plump 2020 23rd Euromicro Conference on Digital System Design (DSD), 518-525, 2020 | 4 | 2020 |
| A hybrid embedded multichannel test compression architecture for low-pin count test environments in safety-critical systems S Huhn, D Tille, R Drechsler 2019 IEEE International Test Conference in Asia (ITC-Asia), 115-120, 2019 | 4 | 2019 |
| SAT-Hard: A learning-based hardware SAT-solver B Ustaoglu, S Huhn, FS Torres, D Große, R Drechsler 2019 22nd Euromicro Conference on Digital System Design (DSD), 74-81, 2019 | 4 | 2019 |
| A Codeword-Based Compaction Technique for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Ntworks S Huhn, M Merten, S Eggersglüß, R Drechsler Informal Proceedings of the GI/GMM/ITG Workshop für Testmethoden und …, 2018 | 4 | 2018 |
| Design enablement flow for circuits with inherent obfuscation based on reconfigurable transistors J Trommer, N Bhattacharjee, T Mikolajick, S Huhn, M Merten, ... 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 3 | 2023 |
| Enhanced Embedded Test Compression Technique For Processing Incompressible Test Patterns S Huhn, S Eggersglüß, R Drechsler Informal Proceedings of the GI/GMM/ITG Workshop für Testmethoden und …, 2019 | 3 | 2019 |
| Leichtgewichtige Datenkompressions-Architektur für IEEE-1149.1-kompatible Testschnittstellen S Huhn, S Eggersglüß, R Drechsler Informal Proceedings of the GI/GMM/ITG Workshop für Testmethoden und …, 2016 | 3 | 2016 |
