| Spindrop: Dropout-based bayesian binary neural networks with spintronic implementation ST Ahmed, K Danouchi, C Münch, G Prenat, L Anghel, MB Tahoori IEEE Journal on Emerging and Selected Topics in Circuits and Systems 13 (1 …, 2023 | 11 | 2023 |
| Binary bayesian neural networks for efficient uncertainty estimation leveraging inherent stochasticity of spintronic devices S Tuhin Ahmed, K Danouchi, C Münch, G Prenat, A Lorena, M B. Tahoori Proceedings of the 17th ACM International Symposium on Nanoscale …, 2022 | 7 | 2022 |
| Compact functional test generation for memristive deep learning implementations using approximate gradient ranking ST Ahmed, MB Tahoori 2022 IEEE International Test Conference (ITC), 239-248, 2022 | 6 | 2022 |
| Process and runtime variation robustness for spintronic-based neuromorphic fabric ST Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori 2022 IEEE European Test Symposium (ETS), 1-2, 2022 | 6 | 2022 |
| SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures ST Ahmed, K Danouchi, M Hefenbrock, G Prenat, L Anghel, MB Tahoori ACM Transactions on Embedded Computing Systems 22 (5s), 1-25, 2023 | 5 | 2023 |
| Neuroscrub+: Mitigating retention faults using flexible approximate scrubbing in neuromorphic fabric based on resistive memories ST Ahmed, M Hefenbrock, C Münch, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 5 | 2022 |
| Scalable spintronics-based bayesian neural network for uncertainty estimation ST Ahmed, K Danouchi, M Hefenbrock, G Prenat, L Anghel, MB Tahoori 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 4 | 2023 |
| NeuroScrub: Mitigating retention failures using approximate scrubbing in Neuromorphic fabric based on resistive memories ST Ahmed, M Hefenbrock, C Münch, MB Tahoori 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 4 | 2021 |
| Scale-dropout: Estimating uncertainty in deep neural networks using stochastic scale ST Ahmed, K Danouchi, M Hefenbrock, G Prenat, L Anghel, MB Tahoori arXiv preprint arXiv:2311.15816, 2023 | 3 | 2023 |
| One-shot online testing of deep neural networks based on distribution shift detection ST Ahmed, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024 | 2 | 2024 |
| Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation ST Ahmed, R Rakhmatullin, MB Tahoori 2023 IEEE European Test Symposium (ETS), 1-4, 2023 | 2 | 2023 |
| Design and Implementation of Intelligent Refrigerator MS Rahman, F Rahman, MH Ali, T Ahmed, MR Islam Journal of Electronics, Computer Networking and Applied Mathematics 3 (01 …, 2023 | 2 | 2023 |
| Tahoori Mehdi B.. 2022 AS Tuhin, D Kamal, M Christopher, P Guillaume, A Lorena SpinDrop: Dropout-based bayesian binary neural networks with spintronic …, 2023 | 2 | 2023 |
| Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture ST Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori ACM Journal on Emerging Technologies in Computing Systems 20 (1), 2023 | 2 | 2023 |
| Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations ST Ahmed, K Danouchi, G Prenat, L Anghel, MB Tahoori arXiv preprint arXiv:2401.12416, 2024 | 1 | 2024 |
| Fault-tolerant Neuromorphic Computing with Memristors Using Functional ATPG for Efficient Re-calibration ST Ahmed, MB Tahoori IEEE Design & Test, 2023 | 1 | 2023 |
| Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration ST Ahmed, MB Tahoori 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | 1 | 2022 |
| Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning ST Ahmed arXiv preprint arXiv:2401.07145, 2024 | | 2024 |
| NeuSpin: Design of a Reliable Edge Neuromorphic System Based on Spintronics for Green AI ST Ahmed, K Danouchi, G Prenat, L Anghel, MB Tahoori arXiv preprint arXiv:2401.06195, 2024 | | 2024 |
| Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks ST Ahmed, M Hefenbrock, G Prenat, L Anghel, MB Tahoori arXiv preprint arXiv:2401.04744, 2024 | | 2024 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, GermanyBestätigte E-Mail-Adresse bei kit.edu
