Vishwani Agrawal
Vishwani Agrawal
professor of electrical engineering
Bestätigte E-Mail-Adresse bei eng.auburn.edu
Titel
Zitiert von
Zitiert von
Jahr
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits
M Bushnell, V Agrawal
Springer Science & Business Media, 2004
24992004
A tutorial on built-in self-test. I. Principles
VD Agrawal, CR Kime, KK Saluja
IEEE Design & Test of Computers 10 (1), 73-82, 1993
455*1993
A partial scan method for sequential circuits with feedback
KT Cheng, VD Agrawal
IEEE Transactions on Computers 39 (4), 544-548, 1990
4421990
Scheduling tests for VLSI systems under power constraints
RM Chou, KK Saluja, VD Agrawal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 5 (2), 175-185, 1997
3561997
Fault injection techniques and tools for embedded systems reliability evaluation
A Benso, P Prinetto
Springer Science & Business Media, 2003
2792003
Chip layout optimization using critical path weighting
AE Dunlop, VD Agrawal, DN Deutsch, MF Jukl, P Kozak, M Wiesel
21st Design Automation Conference Proceedings, 133-136, 1984
2501984
PREDICT: Probabilistic estimation of digital circuit testability
SC Seth
Proc. 15th Int. Fault-Tolerant Computer Symp., 220-225, 1985
2441985
A transitive closure algorithm for test generation
ST Chakradhar, VD Agrawal, SG Rothweiler
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1993
2171993
Single event upset: An embedded tutorial
F Wang, VD Agrawal
21st International Conference on VLSI Design (VLSID 2008), 429-434, 2008
2152008
An exact algorithm for selecting partial scan flip-flops
ST Chakradhar, A Balakrishnan, VD Agrawal
Journal of Electronic Testing 7 (1), 83-93, 1995
2071995
Statistical fault analysis
SK Jain, VD Agrawal
IEEE Design & Test of Computers 2 (1), 38-44, 1985
1881985
Robust tests for stuck-open faults in CMOS combinational logic circuits
SM Reddy, MK Reddy, VD Agrawal
Proc. Int. Symp. on Fault-Tolerant Computing, 44-49, 1984
1781984
On mobile viruses exploiting messaging and bluetooth services
A Bose, KG Shin
2006 Securecomm and Workshops, 1-10, 2006
172*2006
Test generation for MOS circuits using D-algorithm
SK Jain, VD Agrawal
20th Design Automation Conference Proceedings, 64-70, 1983
1681983
Designing circuits with partial scan
VD Agrawal, KT Cheng, DD Johnson, TS Lin
IEEE Design & Test of Computers 5 (2), 8-15, 1988
1621988
Segment delay faults: A new fault model
K Heragu, JH Patel, VD Agrawal
Proceedings of 14th VLSI Test Symposium, 32-39, 1996
1431996
Fault coverage requirement in production testing of LSI circuits
VD Agrawal, SC Seth, P Agrawal
IEEE Journal of Solid-State Circuits 17 (1), 57-61, 1982
1431982
Sampling techniques for determining fault coverage in LSI circuits
VD Agrawal
Journal of Digital Systems 5 (3), 189-202, 1981
1341981
Tutorial test generation for VLSI chips
VD Agrawal, SC Seth
IEEE Computer Society, 1988
1321988
Delay fault models and test generation for random logic sequential circuits
TJ Chakraborty, VD Agrawal, ML Bushnell
[1992] Proceedings 29th ACM/IEEE Design Automation Conference, 165-172, 1992
1281992
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