W. Y. Zhang
W. Y. Zhang
Globalfoundries USA, National University of Singapore
Verified email at globalfoundries.com
Cited by
Cited by
Nanostructure of calcium silicate hydrate gels in cement paste
X Zhang, W Chang, T Zhang, CK Ong
Journal of the American Ceramic Society 83 (10), 2600-2604, 2000
Electron-beam assisted platinum deposition as a protective layer for FIB and TEM applications
WY Kwong, WY Zhang
ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 …, 2005
The Einstein-Kähler metric on Cartan-Hartogs domain of the third type
W An, Y Weiping, Z Wenjuan
Advanced in Mathematics (CHINA) 33 (2), 215-228, 2004
Photoluminescence and photoelectron spectroscopic analysis of InGaAsN grown by metalorganic chemical vapor deposition
W Chang, J Lin, W Zhou, SJ Chua, ZC Feng
Applied physics letters 79 (27), 4497-4499, 2001
Application of IR-OBIRCH to the failure analysis of CMOS integrated circuits
L Soon, DTM Ling, M Kuan, KW Yee, D Cheong, G Zhang
Proceedings of the 10th International Symposium on the Physical and Failure …, 2003
Infrared reflection investigation of ion‐implanted and post‐implantation‐annealed epitaxially grown 6H‐SiC
W Chang, ZC Feng, J Lin, R Liu, ATS Wee, K Tone, JH Zhao
Surface and Interface Analysis: An International Journal devoted to the …, 2002
Study of TDDB reliability in misaligned via chain structures
W Liu, YK Lim, JB Tan, WY Zhang, H Liu, SY Siah
2012 IEEE International Reliability Physics Symposium (IRPS), 3A. 4.1-3A. 4.6, 2012
Prediction of grain yield using SIGA-BP neural network
Z Niu, W Li
International Conference on Artificial Intelligence and Computational …, 2011
Research of TOU power price model based on DSM
L Chang, Y Jiangang, Y Wenfeng
Relay 33 (15), 57-61, 2005
Reliability Improvement in Al Metallization: A Combination of Statistical Prediction and Failure Analytical Methodology
G Zhang, CM Tana, KT Tanb, KY Simb, WY Zhangb
Microelectronics Reliability 44, 1843-1848, 2004
Study of electric field—based lifetime projection method in IMD TDDB
W Zhang, X Zeng, W Liu, YK Lim, JF Liu, EC Chua
2010 IEEE International Reliability Physics Symposium, 938-942, 2010
Surface and interface properties of ion implanted 4H-silicon carbide
WY Chang, ZC Feng, J Lin, F Yan, JH Zhao
International Journal of Modern Physics B 16 (01n02), 151-158, 2002
New insight in BEOL TDDB Cu diffusion mechanism: a constant current stress approach
T Shen, H Jiang, W Zhang, T Cahyadi, EC Chua, C Capasso
2014 IEEE International Reliability Physics Symposium, 3A. 5.1-3A. 5.5, 2014
Effect of chemical mechanical polishing scratch on TDDB reliability and its reduction in 45nm BEOL process
W Liu, YK Lim, F Zhang, WY Zhang, CQ Chen, BC Zhang, JB Tan, ...
2009 IEEE International Reliability Physics Symposium, 613-618, 2009
Infrared reflectance study of 3C-SiC grown on Si by chemical vapor deposition
ZC Feng, CW Huang, WY Chang, J Zhao, CC Tin, WJ Lu, WE Collins
Materials science forum 527, 695-698, 2006
SAR image enhancement fusion based on improved IHS method
W Zhang, XW Ding, HL Chen
J Marine Sci 25 (1), 73-79, 2007
Highly sensitive tunable diode laser absorption spectroscopy of CO2 around 1.31 microm
J Shao, XM Gao, Y Yang, W Huang, SX Pei, YQ Yuan, SK Zhou, ...
Guang pu xue yu guang pu fen xi= Guang pu 26 (2), 213, 2006
Optical characterization of ion-implanted 4H-SiC
ZC Feng, F Yan, WY Chang, JH Zhao, J Lin
Materials Science Forum 389, 647-650, 2002
Oxide particle induced leakage in flash memory endurance test
W Zhang, SH Tan
2006 IEEE International Reliability Physics Symposium Proceedings, 608-610, 2006
An Investigation of Dielectric thickness scaling on BEOL TDDB
T Shen, W Zhang, KB Yeap, J Tan, W Yao, P Justison
Intl. Reliability Physics Symposium, 2015
The system can't perform the operation now. Try again later.
Articles 1–20