| Solid-state imaging with charge-coupled devices AJ Theuwissen Springer Science & Business Media, 2005 | 555 | 2005 |
| CMOS image sensors: State-of-the-art AJP Theuwissen Solid-State Electronics 52 (9), 1401-1406, 2008 | 247 | 2008 |
| Multiple-ramp column-parallel ADC architectures for CMOS image sensors MF Snoeij, AJP Theuwissen, KAA Makinwa, JH Huijsing IEEE Journal of Solid-State Circuits 42 (12), 2968-2977, 2007 | 215 | 2007 |
| An image sensor which captures 100 consecutive frames at 1000000 frames/s TG Etoh, D Poggemann, G Kreider, H Mutoh, AJP Theuwissen, ... IEEE Transactions on electron devices 50 (1), 144-151, 2003 | 207 | 2003 |
| Single-photon imaging P Seitz, AJP Theuwissen Springer, 2011 | 178 | 2011 |
| Leakage current modeling of test structures for characterization of dark current in CMOS image sensors NV Loukianova, HO Folkerts, JPV Maas, DWE Verbugt, AJ Mierop, ... IEEE Transactions on Electron Devices 50 (1), 77-83, 2003 | 144 | 2003 |
| Random telegraph signal in CMOS image sensor pixels X Wang, PR Rao, A Mierop, AJP Theuwissen 2006 International Electron Devices Meeting, 1-4, 2006 | 140 | 2006 |
| A CCD image sensor of 1 Mframes/s for continuous image capturing 103 frames TG Etoh, D Poggemann, A Ruckelshausen, A Theuwissen, G Kreider, ... 2002 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2002 | 127 | 2002 |
| CMOS image sensors: State-of-the-art and future perspectives A Theuwissen ESSDERC 2007-37th European Solid State Device Research Conference, 21-27, 2007 | 99 | 2007 |
| A CMOS imager with column-level ADC using dynamic column fixed-pattern noise reduction MF Snoeij, AJP Theuwissen, KAA Makinwa, JH Huijsing IEEE Journal of Solid-State Circuits 41 (12), 3007-3015, 2006 | 96 | 2006 |
| A 0.7e−rms-temporal-readout-noise CMOS image sensor for low-light-level imaging Y Chen, Y Xu, Y Chae, A Mierop, X Wang, A Theuwissen 2012 IEEE International Solid-State Circuits Conference, 384-386, 2012 | 94 | 2012 |
| Integrated polarization analyzing CMOS image sensor for material classification M Sarkar, DSSSS Bello, C Van Hoof, A Theuwissen IEEE Sensors Journal 11 (8), 1692-1703, 2010 | 92 | 2010 |
| A CMOS image sensor with a buried-channel source follower X Wang, MF Snoeij, PR Rao, A Mierop, AJP Theuwissen 2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008 | 74 | 2008 |
| A CMOS image sensor with a column-level multiple-ramp single-slope ADC MF Snoeij, P Donegan, AJP Theuwissen, KAA Makinwa, JH Huijsing 2007 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2007 | 73 | 2007 |
| Biologically inspired CMOS image sensor for fast motion and polarization detection M Sarkar, DSS Bello, C van Hoof, AJP Theuwissen IEEE Sensors Journal 13 (3), 1065-1073, 2012 | 63 | 2012 |
| Column-parallel digital correlated multiple sampling for low-noise CMOS image sensors Y Chen, Y Xu, AJ Mierop, AJP Theuwissen IEEE Sensors Journal 12 (4), 793-799, 2011 | 63 | 2011 |
| A CMOS image sensor with in-pixel buried-channel source follower and optimized row selector Y Chen, X Wang, AJ Mierop, AJP Theuwissen IEEE transactions on electron devices 56 (11), 2390-2397, 2009 | 60 | 2009 |
| Degradation of CMOS image sensors in deep-submicron technology due to γ-irradiation PR Rao, X Wang, AJP Theuwissen Solid-State Electronics 52 (9), 1407-1413, 2008 | 60 | 2008 |
| Negative offset operation of four-transistor CMOS image pixels for increased well capacity and suppressed dark current B Mheen, YJ Song, AJP Theuwissen IEEE electron device letters 29 (4), 347-349, 2008 | 57 | 2008 |
| Influence of terrestrial cosmic rays on the reliability of CCD image sensors—Part 1: Experiments at room temperature AJP Theuwissen IEEE Transactions on Electron Devices 54 (12), 3260-3266, 2007 | 54 | 2007 |
