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Sunhong Jun
Sunhong Jun
Samsung Memory
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Year
Efficient hybrid colloidal quantum dot/organic solar cells mediated by near-infrared sensitizing small molecules
SW Baek, S Jun, B Kim, AH Proppe, O Ouellette, O Voznyy, C Kim, J Kim, ...
Nature Energy 4 (11), 969-976, 2019
1272019
Ultrafast charge transfer coupled with lattice phonons in two-dimensional covalent organic frameworks
TW Kim, S Jun, Y Ha, RK Yadav, A Kumar, CY Yoo, I Oh, HK Lim, JW Shin, ...
Nature Communications 10 (1), 1873, 2019
1082019
Photochemistry of HgBr 2 in methanol investigated using time-resolved X-ray liquidography
S Jun, JH Lee, J Kim, J Kim, KH Kim, Q Kong, TK Kim, ML Russo, M Wulff, ...
Physical Chemistry Chemical Physics 12 (37), 11536-11547, 2010
382010
Structural dynamics of 1, 2-diiodoethane in cyclohexane probed by picosecond X-ray liquidography
J Kim, JH Lee, J Kim, S Jun, KH Kim, TW Kim, M Wulff, H Ihee
The Journal of Physical Chemistry A 116 (11), 2713-2722, 2012
292012
Coherent oscillations in chlorosome elucidated by two-dimensional electronic spectroscopy
S Jun, C Yang, M Isaji, H Tamiaki, J Kim, H Ihee
The journal of physical chemistry letters 5 (8), 1386-1392, 2014
272014
Combined probes of X-ray scattering and optical spectroscopy reveal how global conformational change is temporally and spatially linked to local structural perturbation in …
TW Kim, C Yang, Y Kim, JG Kim, J Kim, YO Jung, S Jun, SJ Lee, S Park, ...
Physical Chemistry Chemical Physics 18 (13), 8911-8919, 2016
252016
Sub-100-ps structural dynamics of horse heart myoglobin probed by time-resolved X-ray solution scattering
KY Oang, KH Kim, J Jo, Y Kim, JG Kim, TW Kim, S Jun, J Kim, H Ihee
Chemical physics 442, 137-142, 2014
242014
A Colloidal‐Quantum‐Dot‐Based Self‐Charging System via the Near‐Infrared Band
SW Baek, J Cho, JS Kim, C Kim, K Na, SH Lee, S Jun, JH Song, S Jeong, ...
Advanced Materials 30 (25), 1707224, 2018
192018
Role of thermal excitation in ultrafast energy transfer in chlorosomes revealed by two-dimensional electronic spectroscopy
S Jun, C Yang, TW Kim, M Isaji, H Tamiaki, H Ihee, J Kim
Physical Chemistry Chemical Physics 17 (27), 17872-17879, 2015
152015
Density Functional and ab Initio Investigation of CF2ICF2I and CF2CF2I Radicals in Gas and Solution Phases
J Kim, S Jun, J Kim, H Ihee
The Journal of Physical Chemistry A 113 (41), 11059-11066, 2009
142009
Enhancement of Energy Transfer Efficiency with Structural Control of Multichromophore Light‐Harvesting Assembly
I Oh, H Lee, TW Kim, CW Kim, S Jun, C Kim, EH Choi, YM Rhee, J Kim, ...
Advanced Science 7 (20), 2001623, 2020
102020
Global Analysis for Time and Spectrally Resolved Multidimensional Microscopy: Application to CH3NH3PbI3 Perovskite Thin Films
X Jiang, S Jun, J Hoffman, MG Kanatzidis, E Harel
The Journal of Physical Chemistry A 124 (23), 4837-4847, 2020
72020
Exciton delocalization length in chlorosomes investigated by lineshape dynamics of two-dimensional electronic spectra
S Jun, C Yang, S Choi, M Isaji, H Tamiaki, H Ihee, J Kim
Physical Chemistry Chemical Physics 23 (42), 24111-24117, 2021
62021
Density Functional and Ab Initio Investigation of CF2ICF2I and CF2CF2I radical in Gas and Solution Phases
J Kim, S Jun, J Kim, H Ihee
3*
A study on the detection and monitoring of weak areas in wafer using massive 2D and 3D measurement data
S Ryu, DH Kim, S Jun, S Ryu, JH Ahn, H Lee, KE Kim, Y Yang, Y Sohn
Metrology, Inspection, and Process Control XXXVI 12053, 1205302, 2022
22022
Ultrafast energy transfer in chlorosome probed by femtosecond pump-probe polarization anisotropy
S Jun, TW Kim, C Yang, M Isaji, H Tamiaki, H Ihee, J Kim
Bulletin of the Korean Chemical Society 35 (3), 703-704, 2014
12014
DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARATUS AND METHOD USING THE SPECTROMETER
S Jun, J Kim, Y Sohn
US Patent App. 18/118,816, 2024
2024
Characterization of interface charge traps in PE-TEOS and HDP oxide with different annealing temperatures using time-dependent second-harmonic generation
I Kim, S Park, M Seo, S Jun, S Ryu, S Bae, N Koo, Y Yang
Nonlinear Optics and Applications XIII 12569, 9-12, 2023
2023
Semiconductor device metrology for detecting defective chip due to high-aspect ratio-based structures using hyperspectral imaging and deep learning
S Jun, W Choi, DH Kim, H Park, D Kyeon, K Lee, YJ Jeon, C Lee, K Kim, ...
Metrology, Inspection, and Process Control XXXVII 12496, 388-394, 2023
2023
Detection of defective areas and hidden weak patterns in the wafer using massive measurement data
DH Kim, S Ryu, S Jun, H Han, W Choi, YJ Jeon, H Lee, S Kim, Y Sohn
Metrology, Inspection, and Process Control XXXVII 12496, 525-529, 2023
2023
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