Elham Amini
Elham Amini
Bestätigte E-Mail-Adresse bei sect.tu-berlin.de
Titel
Zitiert von
Zitiert von
Jahr
From IC debug to hardware security risk: The power of backside access and optical interaction
C Boit, S Tajik, P Scholz, E Amini, A Beyreuther, H Lohrke, JP Seifert
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis …, 2016
172016
Sensitive, fast, solution-processed ultraviolet detectors based on passivated zinc oxide nanorods
A Rostami, M Dolatyari, E Amini, H Rasooli, H Baghban, S Miri
Chem Phys Chem 14, 554, 2013
122013
Solution-processed photoconductive UV detectors based on ZnO nanosheets
E Amini, M Dolatyari, A Rostami, H Shekari, H Baghban, H Rasooli, S Miri
IEEE Photonics Technology Letters 24 (22), 1995-1997, 2012
122012
Assessment of a chip backside protection
E Amini, A Beyreuther, N Herfurth, A Steigert, B Szyszka, C Boit
Journal of Hardware and Systems Security 2 (4), 345-352, 2018
102018
Backside protection structure for security sensitive ics
E Amini, R Muydinov, B Szyszka, C Boit
Proceedings from the 43rd international symposium for testing and failure …, 2017
72017
Fabrication of fast and sensitive IR‐detectors based on PbS quantum dots passivated by organic ligands
S Miri, A Rostami, M Dolatyari, H Baghban, H Rasooli, E Amini
physica status solidi (a) 210 (2), 420-424, 2013
72013
IC security and quality improvement by protection of chip backside against hardware attacks
E Amini, A Beyreuther, N Herfurth, A Steigert, R Muydinov, B Szyszka, ...
Microelectronics Reliability 88, 22-25, 2018
32018
Photon emission as a characterization tool for bipolar parasitics in FinFET technology
A Beyreuther, N Herfurth, E Amini, T Nakamura, I De Wolf, C Boit
Microelectronics Reliability 88, 273-276, 2018
32018
EOFM for contactless parameter extraction of low k dielectric MIS structures
N Herfurth, E Amini, A Beyreuther, T Nakamura, S Keil, C Boit
2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019
12019
Generation and Tracking of Optical Signals inside the IC to Improve Device Security and Failure Analysis
E Amini, N Herfurth, A Beyreuther, JP Seifert, C Boit
2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019
2019
EOFM measurements of lateral and vertical Bipolar Transistors in Silicon and SiGe: C Technologies
A Beyreuther, N Herfurth, E Amini, T Nakamura, GG Fischer, S Keil, C Boit
2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019
2019
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis
N Herfurth, A Beyreuther, E Amini, C Boit, M Simon-Najasek, S Hübner, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2019
2019
Zinc oxide nanoplates for ultraviolet radiation detection
M Dolatyari, E Amini, H Shekari, A Bakhtiari, A Rostami
Asia Communications and Photonics Conference and Exhibition, 830820, 2011
2011
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