| High resolution X-ray diffractometry and topography DK Bowen, BK Tanner CRC press, 1998 | 1045 | 1998 |
| The core structure of ½ (111) screw dislocations in bcc crystals V Vitek, RC Perrin, DK Bowen Philosophical Magazine 21 (173), 1049-1073, 1970 | 562 | 1970 |
| Characterization of structures from X-ray scattering data using genetic algorithms M Wormington, C Panaccione, KM Matney, DK Bowen Philosophical Transactions of the Royal Society of London. Series A …, 1999 | 421 | 1999 |
| Characterization of crystal growth defects by X-ray methods BK Tanner Springer Science & Business Media, 2013 | 267 | 2013 |
| X-ray metrology in semiconductor manufacturing DK Bowen, BK Tanner CRC Press, 2018 | 206 | 2018 |
| The effect of shear stress on the screw dislocation core structure in body-centred cubic lattices MS Duesbery, V Vitek, DK Bowen Proceedings of the Royal Society of London. A. Mathematical and Physical …, 1973 | 202 | 1973 |
| Design and assessment of monolithic high precision translation mechanisms ST Smith, DG Chetwynd, DK Bowen Journal of Physics E: Scientific Instruments 20 (8), 977, 1987 | 193 | 1987 |
| Deformation properties of niobium single crystals DK Bowen, JW Christian, G Taylor Canadian Journal of Physics 45 (2), 903-938, 1967 | 180 | 1967 |
| The calculation of shear stress and shear strain for double glide in tension and compression DK Bowen, JW Christian Philosophical Magazine 12 (116), 369-378, 1965 | 81 | 1965 |
| Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment P Colombi, DK Agnihotri, VE Asadchikov, E Bontempi, DK Bowen, ... Journal of Applied Crystallography 41 (1), 143-152, 2008 | 77 | 2008 |
| On the widths of dislocation images in X-ray topography under low-absorption conditions JEA Miltat, DK Bowen Journal of Applied Crystallography 8 (6), 657-669, 1975 | 76 | 1975 |
| Microscopy of materials DK Bowen, CR Hall | 73 | 1975 |
| A comparison of techniques for nondestructive composition measurements in CdZnTe substrates SP Tobin, JP Tower, PW Norton, D Chandler-Horowitz, PM Amirtharaj, ... Journal of electronic materials 24, 697-705, 1995 | 70 | 1995 |
| Experimental comparison of synchrotron radiation with other modes of excitation of X rays for trace element analysis AJJ Bos, RD Vis, H Verheul, M Prins, ST Davies, DK Bowen, J Makjanić, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1984 | 68 | 1984 |
| Fitting of X-ray scattering data using evolutionary algorithms M Wormington, C Panaccione, KM Matney, DK Bowen US Patent 6,192,103, 2001 | 64 | 2001 |
| Characterization of engineering surfaces by grazing-incidence X-ray reflectivity DK Bowen, BK Tanner Nanotechnology 4 (4), 175, 1993 | 64 | 1993 |
| Gloss and surface topography DJ Whitehouse, DK Bowen, VC Venkatesh, P Lonardo, CA Brown CIRP annals 43 (2), 541-549, 1994 | 63 | 1994 |
| Sub-nanometre displacements calibration using x-ray interferometry DK Bowen, DG Chetwynd, DR Schwarzenberger Measurement Science and Technology 1 (2), 107, 1990 | 60 | 1990 |
| The deformation behaviour of dilute niobium-nitrogen alloys DK Bowen, G Taylor Acta Metallurgica 25 (4), 417-436, 1977 | 56 | 1977 |
| Advanced X-ray scattering techniques for the characterization of semiconducting materials BK Tanner, DK Bowen Journal of crystal growth 126 (1), 1-18, 1993 | 50 | 1993 |
