Frederik Steib
Frederik Steib
University of Technology Braunschweig
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Cited by
Production of vertical nanowire resonators by cryogenic-ICP–DRIE
S Merzsch, F Steib, HS Wasisto, A Stranz, P Hinze, T Weimann, E Peiner, ...
Microsystem technologies 20 (4-5), 759-767, 2014
High Aspect Ratio GaN Fin Microstructures with Nonpolar Sidewalls by Continuous Mode Metalorganic Vapor Phase Epitaxy
J Hartmann, F Steib, H Zhou, J Ledig, S Fündling, F Albrecht, ...
Crystal Growth & Design 16 (3), 1458-1462, 2016
Vertical silicon nanowire array-patterned microcantilever resonators for enhanced detection of cigarette smoke aerosols
HS Wasisto, S Merzsch, F Steib, A Waag, E Peiner
Micro & Nano Letters 9 (10), 676-679, 2014
Study of 3D-growth conditions for selective area MOVPE of high aspect ratio GaN fins with non-polar vertical sidewalls
J Hartmann, F Steib, H Zhou, J Ledig, L Nicolai, S Fündling, T Schimpke, ...
Journal of Crystal Growth 476, 90-98, 2017
Electron beam lithography for contacting single nanowires on non-flat suspended substrates
J Samà, G Domènech-Gil, I Gràcia, X Borrisé, C Cané, S Barth, F Steib, ...
Sensors and Actuators B: Chemical, 2019
3D GaN Fins as a Versatile Platform for a‐Plane‐Based Devices
J Hartmann, I Manglano Clavero, L Nicolai, C Margenfeld, H Spende, ...
physica status solidi (b), 2019
Defect generation by nitrogen during pulsed sputter deposition of GaN
F Steib, T Remmele, J Gülink, S Fündling, A Behres, HH Wehmann, ...
Journal of Applied Physics 124 (17), 175701, 2018
In-plane-excited silicon nanowire arrays-patterned cantilever sensors for enhanced airborne particulate matter exposure detection
HS Wasisto, S Merzsch, F Steib, A Waag, E Peiner
Nano/Micro Engineered and Molecular Systems (NEMS), 2014 9th IEEE …, 2014
Electro-optical characterization of single InGaN/GaN core-shell LEDs inside an SEM
J Ledig, G Scholz, M Popp, F Steib, A Fahl, X Wang, J Hartmann, M Mandl, ...
Surface-enhanced silicon resonant cantilever sensors with vertical nanowires
HS Wasisto, S Merzsch, F Steib, E Uhde, A Waag, E Peiner
Sensors and Measuring Systems 2014; 17. ITG/GMA Symposium; Proceedings of, 1-6, 2014
Correlative ECCI and CL of single GaN microstructures obtained using ECP by beam rocking on small areas
J Ledig, F Steib, J Hartmann, S Fündling, HH Wehmann, A Waag
European Microscopy Congress 2016: Proceedings, 0
Function-in-the-Loop Simulation of Electromechanical Steering Systems—Concept, Implementation, and Use Cases
F Achilles, F Steib, C Nippold, R Henze
SAE Technical Paper, 2023
Semiconductor device for transmitting electromagnetic radiation and method for production thereof
S Fündling, F Steib, A Waag
US Patent App. 16/978,641, 2022
Optoelectronic semiconductor chip and method of manufacturing the same
AS Avramescu, T Varghese, M Strassburg, HJ Lugauer, S Fündling, ...
US Patent 11,069,835, 2021
Recent developments of 3D GaN core shell architectures towards solid state lighting
A Waag, J Hartmann, H Zhou, S Fündling, J Ledig, F Steib, M Mohajerani, ...
Photonics Society Summer Topical Meeting Series (SUM), 2016 IEEE, 40-40, 2016
Article type: Full Paper
J Hartmann, IM Clavero, L Nicolai, C Margenfeld, H Spende, J Ledig, ...
High aspect ratio GaN fin microstructures with non-polar sidewalls by continuous mode MOVPE
J Hartmann, F Steib, H Zhou, J Ledig, S Fündling, F Albrecht, T Schimpke, ...
SEM based electro‐optical characterization of core‐shell LEDs and simulation of imaging including CL and EBIC excitation inside ensembles
J Ledig, CG Frase, F Steib, J Hartmann, HH Wehmann, A Waag
European Microscopy Congress 2016: Proceedings, 0
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Articles 1–18