Stuart Wright
Stuart Wright
Senior Scientist, EDAX
Verified email at ametek.com
Title
Cited by
Cited by
Year
Electron backscatter diffraction in materials science
AJ Schwartz, M Kumar, BL Adams, DP Field
Springer 2, 403, 2009
17442009
Orientation imaging: the emergence of a new microscopy
BL Adams, SI Wright, K Kunze
Metallurgical and Materials Transactions A 24 (4), 819-831, 1993
11451993
A review of strain analysis using electron backscatter diffraction
SI Wright, MM Nowell, DP Field
Microscopy and Microanalysis 17 (03), 316-329, 2011
6632011
Automatic analysis of electron backscatter diffraction patterns
SI Wright, BL Adams
Metallurgical and Materials Transactions A 23 (3), 759-767, 1992
2831992
EBSD image quality mapping
SI Wright, MM Nowell
Microscopy and microanalysis 12 (1), 72, 2006
2682006
Three-dimensional orientation microscopy in a focused ion beam–scanning electron microscope: A new dimension of microstructure characterization
S Zaefferer, SI Wright, D Raabe
Metallurgical and Materials Transactions A 39 (2), 374-389, 2008
2032008
Advances in automatic EBSP single orientation measurements
K Kunze, SI Wright, BL Adams, DJ Dingley
Texture, Stress, and Microstructure 20 (1-4), 41-54, 1993
168*1993
Analysis of local orientation gradients in deformed single crystals
DP Field, PB Trivedi, SI Wright, M Kumar
Ultramicroscopy 103 (1), 33-39, 2005
1672005
Extracting twins from orientation imaging microscopy scan data
SI Wright, RJ Larsen
Journal of microscopy 205 (3), 245-252, 2002
1542002
A review of automated orientation imaging microscopy(OIM)
SI Wright
Journal of Computer-Assisted Microscopy(USA) 5 (3), 207-221, 1993
1441993
Collaborative group interactions of students from two ethnic backgrounds
S Wright, D Lander
Higher Education Research & Development 22 (3), 237-251, 2003
1362003
Introduction and comparison of new EBSD post-processing methodologies
SI Wright, MM Nowell, SP Lindeman, PP Camus, M De Graef, MA Jackson
Ultramicroscopy 159, 81-94, 2015
1112015
Orientation effects on indexing of electron backscatter diffraction patterns
MM Nowell, SI Wright
Ultramicroscopy 103 (1), 41-58, 2005
1022005
Phase differentiation via combined EBSD and XEDS
MM Nowell, SI Wright
Journal of Microscopy 213 (3), 296-305, 2004
952004
Description of orientation coherence in polycrystalline materials
BL Adams, PR Morris, TT Wang, KS Willden, SI Wright
Acta Metallurgica 35 (12), 2935-2946, 1987
871987
Electron imaging with an EBSD detector
SI Wright, MM Nowell, R de Kloe, P Camus, T Rampton
Ultramicroscopy 148, 132-145, 2015
812015
Application of a new automatic lattice orientation measurement technique to polycrystalline aluminum
SI Wright, BL Adams, K Kunze
Materials Science and Engineering: A 160 (2), 229-240, 1993
661993
Advances in deformation twin characterization using electron backscattered diffraction data
TA Mason, JF Bingert, GC Kaschner, SI Wright, RJ Larsen
Metallurgical and Materials Transactions A 33 (13), 949-954, 2002
632002
A comparison of textures measured using X-ray and electron backscatter diffraction
SI Wright, MM Nowell, JF Bingert
Metallurgical and Materials Transactions A 38 (8), 1845-1855, 2007
622007
An analysis of grain boundaries and grain growth in cemented tungsten carbide using orientation imaging microscopy
V Kumar, ZZ Fang, SI Wright, MM Nowell
Metallurgical and Materials Transactions A 37 (3), 599-607, 2006
622006
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