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Daan Hein Alsem
Daan Hein Alsem
Hummingbird Scientific
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Zitiert von
Jahr
Tough, bio-inspired hybrid materials
E Munch, ME Launey, DH Alsem, E Saiz, AP Tomsia, RO Ritchie
Science 322 (5907), 1516-1520, 2008
18452008
Origin and hysteresis of lithium compositional spatiodynamics within battery primary particles
J Lim, Y Li, DH Alsem, H So, SC Lee, P Bai, DA Cogswell, X Liu, N Jin, ...
Science 353 (6299), 566-571, 2016
4502016
Correlative operando microscopy of oxygen evolution electrocatalysts
JT Mefford, AR Akbashev, M Kang, CL Bentley, WE Gent, HD Deng, ...
Nature 593 (7857), 67-73, 2021
3892021
Designing highly toughened hybrid composites through nature-inspired hierarchical complexity
ME Launey, E Munch, DH Alsem, HB Barth, E Saiz, AP Tomsia, ...
Acta Materialia 57 (10), 2919-2932, 2009
3242009
A novel biomimetic approach to the design of high-performance ceramic–metal composites
ME Launey, E Munch, DH Alsem, E Saiz, AP Tomsia, RO Ritchie
Journal of the Royal Society Interface 7 (46), 741-753, 2010
3042010
Mechanisms for fatigue of micron‐scale silicon structural films
DH Alsem, ON Pierron, EA Stach, CL Muhlstein, RO Ritchie
Advanced Engineering Materials 9 (1‐2), 15-30, 2007
1282007
Direct Visualization of Solid Electrolyte Interphase Formation in Lithium-Ion Batteries with In Situ Electrochemical Transmission Electron Microscopy
RR Unocic, XG Sun, RL Sacci, LA Adamczyk, DH Alsem, S Dai, ...
Microscopy and Microanalysis 20 (4), 1029-1037, 2014
1002014
In Situ TEM Study of Catalytic Nanoparticle Reactions in Atmospheric Pressure Gas Environment
HL Xin, K Niu, DH Alsem, H Zheng
Microscopy and Microanalysis 19 (6), 1558-1568, 2013
842013
Fatigue-induced grain coarsening in nanocrystalline platinum films
RA Meirom, DH Alsem, AL Romasco, T Clark, RG Polcawich, ...
Acta Materialia 59 (3), 1141-1149, 2011
682011
Very high-cycle fatigue failure in micron-scale polycrystalline silicon films: Effects of environment and surface oxide thickness
DH Alsem, R Timmerman, BL Boyce, EA Stach, JTM De Hosson, ...
Journal of applied physics 101 (1), 2007
672007
Fatigue failure in thin-film polycrystalline silicon is due to subcritical cracking within the oxide layer
DH Alsem, EA Stach, CL Muhlstein, RO Ritchie
Applied Physics Letters 86 (4), 2005
632005
Micron-scale friction and sliding wear of polycrystalline silicon thin structural films in ambient air
DH Alsem, MT Dugger, EA Stach, RO Ritchie
Journal of microelectromechanical systems 17 (5), 1144-1154, 2008
612008
Electrochemical measurements in in situ TEM experiments
E Fahrenkrug, DH Alsem, N Salmon, S Maldonado
Journal of The Electrochemical Society 164 (6), H358, 2017
542017
Interfacial insight from operando XAS/TEM for magnesium metal deposition with borohydride electrolytes
TS Arthur, PA Glans, N Singh, O Tutusaus, K Nie, YS Liu, F Mizuno, J Guo, ...
Chemistry of Materials 29 (17), 7183-7188, 2017
512017
Further considerations on the high-cycle fatigue of micron-scale polycrystalline silicon
DH Alsem, CL Muhlstein, EA Stach, RO Ritchie
Scripta Materialia 59 (9), 931-935, 2008
482008
An electron microscopy study of wear in polysilicon microelectromechanical systems in ambient air
DH Alsem, EA Stach, MT Dugger, M Enachescu, RO Ritchie
Thin Solid Films 515 (6), 3259-3266, 2007
442007
Effect of post-release sidewall morphology on the fracture and fatigue properties of polycrystalline silicon structural films
DH Alsem, BL Boyce, EA Stach, RO Ritchie
Sensors and Actuators A: Physical 147 (2), 553-560, 2008
352008
In Situ Transmission Electron Microscopy Measurements of Ge Nanowire Synthesis with Liquid Metal Nanodroplets in Water
Q Cheek, E Fahrenkrug, S Hlynchuk, DH Alsem, NJ Salmon, ...
ACS nano 14 (3), 2869-2879, 2020
252020
Wear mechanisms and friction parameters for sliding wear of micron-scale polysilicon sidewalls
DH Alsem, R Van Der Hulst, EA Stach, MT Dugger, JTM De Hosson, ...
Sensors and Actuators A: Physical 163 (1), 373-382, 2010
252010
In-situ TEM Characterization of Electrochemical Processes in Energy Storage Systems
R Unocic, L Adamczyk, N Dudney, D Alsem, N Salmon, K More
Microscopy and Microanalysis 17 (S2), 1564-1565, 2011
182011
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