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Fabien Prégaldiny
Fabien Prégaldiny
Télécom Physique Strasbourg
Bestätigte E-Mail-Adresse bei unistra.fr
Titel
Zitiert von
Zitiert von
Jahr
Charge-based modeling of junctionless double-gate field-effect transistors
JM Sallese, N Chevillon, C Lallement, B Iniguez, F Prégaldiny
IEEE Transactions on Electron Devices 58 (8), 2628-2637, 2011
2652011
CNTFET modeling and reconfigurable logic-circuit design
I O'Connor, J Liu, F Gaffiot, F Prégaldiny, C Lallement, C Maneux, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 54 (11), 2365-2379, 2007
2192007
A design oriented charge-based current model for symmetric DG MOSFET and its correlation with the EKV formalism
JM Sallese, F Krummenacher, F Prégaldiny, C Lallement, A Roy, C Enz
Solid-State Electronics 49 (3), 485-489, 2005
2102005
A simple efficient model of parasitic capacitances of deep-submicron LDD MOSFETs
F Prégaldiny, C Lallement, D Mathiot
Solid-State Electronics 46 (12), 2191-2198, 2002
742002
Accounting for quantum mechanical effects from accumulation to inversion, in a fully analytical surface-potential-based MOSFET model
F Prégaldiny, C Lallement, D Mathiot
Solid-State Electronics 48 (5), 781-787, 2004
702004
Explicit compact model for symmetric double-gate MOSFETs including solutions for small-geometry effects
B Diagne, F Prégaldiny, C Lallement, JM Sallese, F Krummenacher
Solid-State Electronics 52 (1), 99-106, 2008
692008
Design-oriented compact models for CNTFETs
F Pregaldiny, C Lallement, JB Kammerer
International Conference on Design and Test of Integrated Systems in …, 2006
632006
Generalization of the concept of equivalent thickness and capacitance to multigate MOSFETs modeling
N Chevillon, JM Sallese, C Lallement, F Prégaldiny, M Madec, J Sedlmeir, ...
IEEE Transactions on Electron Devices 59 (1), 60-71, 2011
542011
An advanced explicit surface potential model physically accounting for the quantization effects in deep-submicron MOSFETs
F Prégaldiny, C Lallement, R van Langevelde, D Mathiot
Solid-State Electronics 48 (3), 427-435, 2004
532004
Physics-based compact model for ultra-scaled FinFETs
A Yesayan, F Prégaldiny, N Chevillon, C Lallement, JM Sallese
Solid-State Electronics 62 (1), 165-173, 2011
522011
Compact modeling and applications of CNTFETs for analog and digital circuit design
F Pregaldiny, JB Kammerer, C Lallement
2006 13th IEEE International Conference on Electronics, Circuits and Systems …, 2006
382006
Explicit compact model for ultranarrow body FinFETs
M Tang, F Prégaldiny, C Lallement, JM Sallese
IEEE transactions on electron devices 56 (7), 1543-1547, 2009
332009
The equivalent-thickness concept for doped symmetric DG MOSFETs
JM Sallese, N Chevillon, F Pregaldiny, C Lallement, B Iniguez
IEEE transactions on electron devices 57 (11), 2917-2924, 2010
312010
Explicit modelling of the double‐gate MOSFET with VHDL‐AMS
F Prégaldiny, F Krummenacher, B Diagne, F Pêcheux, JM Sallese, ...
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING: electronic networks, devices …, 2006
302006
Compact modeling of magnetic tunnel junction
M Madec, JB Kammerer, F Pregaldiny, L Hebrard, C Lallement
2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems …, 2008
282008
An explicit quasi-static charge-based compact model for symmetric DG MOSFET
F Prégaldiny, F Krummenacher, JM Sallese, B Diagne, C Lallement
Proc. NSTI-Nanotech, 686-691, 2006
192006
Explicit drain current model of junctionless double-gate field-effect transistors
A Yesayan, F Prégaldiny, JM Sallese
Solid-state electronics 89, 134-138, 2013
172013
Compact modeling of emerging technologies with VHDL-AMS
F Prégaldiny, C Lallement, B Diagne, JM Sallese, F Krummenacher
Advances in Design and Specification Languages for Embedded Systems …, 2007
172007
FinFET compact modeling and parameter extraction
N Chevillon, M Tang, F Prégaldiny, C Lallement, M Madec
2009 MIXDES-16th International Conference Mixed Design of Integrated …, 2009
152009
Etude et modélisation du comportement électrique des transistors MOS fortement submicroniques
F Prégaldiny
Université Louis Pasteur-Strasbourg I, 2003
112003
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