| Effects of alirocumab on cardiovascular and metabolic outcomes after acute coronary syndrome in patients with or without diabetes: a prespecified analysis of the ODYSSEY … KK Ray, HM Colhoun, M Szarek, M Baccara-Dinet, DL Bhatt, VA Bittner, ... The lancet Diabetes & endocrinology 7 (8), 618-628, 2019 | 247 | 2019 |
| A learning automata based solution for preventing distributed denial of service in internet of things S Misra, PV Krishna, H Agarwal, A Saxena, MS Obaidat 2011 international conference on internet of things and 4th international …, 2011 | 136 | 2011 |
| BSIM6: Analog and RF compact model for bulk MOSFET YS Chauhan, S Venugopalan, MA Chalkiadaki, MAU Karim, H Agarwal, ... IEEE Transactions on Electron Devices 61 (2), 234-244, 2013 | 132 | 2013 |
| Engineering negative differential resistance in NCFETs for analog applications H Agarwal, P Kushwaha, JP Duarte, YK Lin, AB Sachid, MY Kao, ... IEEE Transactions on Electron Devices 65 (5), 2033-2039, 2018 | 99 | 2018 |
| BSIM-CMG: Standard FinFET compact model for advanced circuit design JP Duarte, S Khandelwal, A Medury, C Hu, P Kushwaha, H Agarwal, ... ESSCIRC Conference 2015-41st European Solid-State Circuits Conference …, 2015 | 93 | 2015 |
| First Industrial Revolution and Second Industrial Revolution: Technological differences and the differences in banking and financing of the firms H Agarwal, R Agarwal Saudi Journal of Humanities and Social Sciences 2 (11), 1062-1066, 2017 | 82 | 2017 |
| Proposal for capacitance matching in negative capacitance field-effect transistors H Agarwal, P Kushwaha, YK Lin, MY Kao, YH Liao, A Dasgupta, ... IEEE Electron Device Letters 40 (3), 463-466, 2019 | 79 | 2019 |
| An adaptive learning approach for fault-tolerant routing in Internet of Things S Misra, A Gupta, PV Krishna, H Agarwal, MS Obaidat 2012 IEEE Wireless Communications and Networking Conference (WCNC), 815-819, 2012 | 55 | 2012 |
| BSIM compact model of quantum confinement in advanced nanosheet FETs A Dasgupta, SS Parihar, P Kushwaha, H Agarwal, MY Kao, S Salahuddin, ... IEEE Transactions on Electron Devices 67 (2), 730-737, 2020 | 47 | 2020 |
| Analysis and modeling of inner fringing field effect on negative capacitance FinFETs YK Lin, H Agarwal, P Kushwaha, MY Kao, YH Liao, K Chatterjee, ... IEEE Transactions on Electron Devices 66 (4), 2023-2027, 2019 | 45 | 2019 |
| NCFET design considering maximum interface electric field H Agarwal, P Kushwaha, YK Lin, MY Kao, YH Liao, JP Duarte, ... IEEE Electron Device Letters 39 (8), 1254-1257, 2018 | 41 | 2018 |
| Efficient medium access control for cyber–physical systems with heterogeneous networks S Misra, PV Krishna, V Saritha, H Agarwal, L Shu, MS Obaidat IEEE systems journal 9 (1), 22-30, 2013 | 41 | 2013 |
| Spacer engineering in negative capacitance FinFETs YK Lin, H Agarwal, MY Kao, J Zhou, YH Liao, A Dasgupta, P Kushwaha, ... IEEE Electron Device Letters 40 (6), 1009-1012, 2019 | 39 | 2019 |
| Variation caused by spatial distribution of dielectric and ferroelectric grains in a negative capacitance field-effect transistor MY Kao, AB Sachid, YK Lin, YH Liao, H Agarwal, P Kushwaha, JP Duarte, ... IEEE Transactions on Electron Devices 65 (10), 4652-4658, 2018 | 39 | 2018 |
| BSIM compact MOSFET models for SPICE simulation YS Chauhan, S Venugopalan, N Paydavosi, P Kushwaha, S Jandhyala, ... Proceedings of the 20th International Conference Mixed Design of Integrated …, 2013 | 38 | 2013 |
| Design optimization techniques in nanosheet transistor for RF applications P Kushwaha, A Dasgupta, MY Kao, H Agarwal, S Salahuddin, C Hu IEEE Transactions on Electron Devices 67 (10), 4515-4520, 2020 | 35 | 2020 |
| Characterization and modeling of flicker noise in FinFETs at advanced technology node P Kushwaha, H Agarwal, YK Lin, A Dasgupta, MY Kao, Y Lu, Y Yue, ... IEEE Electron Device Letters 40 (6), 985-988, 2019 | 34 | 2019 |
| Designing 0.5 V 5-nm HP and 0.23 V 5-nm LP NC-FinFETs With Improved Sensitivity in Presence of Parasitic Capacitance H Agarwal, P Kushwaha, JP Duarte, YK Lin, AB Sachid, HL Chang, ... IEEE Transactions on Electron Devices 65 (3), 1211-1216, 2018 | 33 | 2018 |
| Modeling the impact of substrate depletion in FDSOI MOSFETs P Kushwaha, N Paydavosi, S Khandelwal, C Yadav, H Agarwal, ... Solid-State Electronics 104, 6-11, 2015 | 32 | 2015 |
| Learning automata-based multi-constrained fault-tolerance approach for effective energy management in smart grid communication network S Misra, PV Krishna, V Saritha, H Agarwal, A Ahuja Journal of Network and Computer Applications 44, 212-219, 2014 | 30 | 2014 |
Sudip MisraFIEEE, FAAIA, FNAE, FNASc, FIET, ACM DM, Professor & INAE Abdul Kalam Tech Innovation National確認したメール アドレス: cse.iitkgp.ac.in
