Greg Denbeaux
Greg Denbeaux
SUNY Polytechnic Institute, College of Nanoscale Science and Engineering
Verified email at sunypoly.edu - Homepage
Title
Cited by
Cited by
Year
Magnetization reversal of Co∕ Pt multilayers: Microscopic origin of high-field magnetic irreversibility
JE Davies, O Hellwig, EE Fullerton, G Denbeaux, JB Kortright, K Liu
Physical Review B 70 (22), 224434, 2004
2682004
High resolution protein localization using soft X‐ray microscopy
W Meyer‐Ilse, D Hamamoto, A Nair, SA Lelievre, G Denbeaux, L Johnson, ...
Journal of Microscopy 201 (3), 395-403, 2001
2012001
High-resolution imaging of fast magnetization dynamics in magnetic nanostructures
H Stoll, A Puzic, B Van Waeyenberge, P Fischer, J Raabe, M Buess, ...
Applied Physics Letters 84 (17), 3328-3330, 2004
1632004
Nanofabrication and diffractive optics for high-resolution x-ray applications
EH Anderson, DL Olynick, B Harteneck, E Veklerov, G Denbeaux, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
1542000
Evaluation of EUV resist materials for use at the 32 nm half-pitch node
T Wallow, C Higgins, R Brainard, K Petrillo, W Montgomery, CS Koay, ...
Emerging Lithographic Technologies XII 6921, 69211F, 2008
1212008
A soft X-ray microscope investigation into the effects of calcium chloride on tricalcium silicate hydration
MCG Juenger, PJM Monteiro, EM Gartner, GP Denbeaux
Cement and Concrete Research 35 (1), 19-25, 2005
1142005
X-ray studies of aligned magnetic stripe domains in perpendicular multilayers
O Hellwig, GP Denbeaux, JB Kortright, EE Fullerton
Physica B: Condensed Matter 336 (1-2), 136-144, 2003
1042003
Soft-x-ray small-angle scattering as a sensitive probe of magnetic and charge heterogeneity
JB Kortright, SK Kim, GP Denbeaux, G Zeltzer, K Takano, EE Fullerton
Physical Review B 64 (9), 092401, 2001
1022001
Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy
P Fischer, T Eimüller, G Schütz, G Denbeaux, A Pearson, L Johnson, ...
Review of Scientific Instruments 72 (5), 2322-2324, 2001
972001
20-nm-resolution soft x-ray microscopy demonstrated by use of multilayer test structures
W Chao, E Anderson, GP Denbeaux, B Harteneck, JA Liddle, DL Olynick, ...
Optics letters 28 (21), 2019-2021, 2003
722003
Polarization effects in coherent scattering from magnetic specimen: Implications for x-ray holography, lensless imaging, and correlation spectroscopy
S Eisebitt, M Lörgen, W Eberhardt, J Lüning, J Stöhr, CT Rettner, ...
Physical Review B 68 (10), 104419, 2003
652003
Dynamical x-ray microscopy investigation of electromigration in passivated inlaid Cu interconnect structures
G Schneider, G Denbeaux, EH Anderson, B Bates, A Pearson, MA Meyer, ...
Applied physics letters 81 (14), 2535-2537, 2002
562002
An analysis of EUV-resist outgassing measurements
KR Dean, I Nishiyama, H Oizumi, A Keen, H Cao, W Yueh, T Watanabe, ...
Advances in Resist Materials and Processing Technology XXIV 6519, 65191P, 2007
522007
Soft X-ray microscopy to 25 nm with applications to biology and magnetic materials
G Denbeaux, E Anderson, W Chao, T Eimüller, L Johnson, M Köhler, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
522001
Study of in-plane magnetic domains with magnetic transmission X-ray microscopy
P Fischer, T Eimüller, G Schütz, M Köhler, G Bayreuther, G Denbeaux, ...
Journal of Applied Physics 89 (11), 7159-7161, 2001
482001
Secondary electrons in EUV lithography
J Torok, R Del Re, H Herbol, S Das, I Bocharova, A Paolucci, LE Ocola, ...
Journal of Photopolymer Science and Technology 26 (5), 625-634, 2013
452013
Magnetic imaging of ion-irradiation patterned Co/Pt multilayers using complementary electron and photon probes
GJ Kusinski, KM Krishnan, G Denbeaux, G Thomas, BD Terris, D Weller
Applied Physics Letters 79 (14), 2211-2213, 2001
422001
Resolution, line-edge roughness, sensitivity tradeoff, and quantum yield of high photo acid generator resists for extreme ultraviolet lithography
CD Higgins, CR Szmanda, A Antohe, G Denbeaux, J Georger, ...
Japanese Journal of Applied Physics 50 (3R), 036504, 2011
382011
Direct observation of cement hydration by soft X-ray transmission microscopy
MCG Juenger, VHR Lamour, PJM Monteiro, EM Gartner, GP Denbeaux
Journal of materials science letters 22 (19), 1335-1337, 2003
382003
The high resolution X-ray microscope, XM-1
W Meyer-Ilse, G Denbeaux, LE Johnson, W Bates, A Lucero, ...
AIP Conference Proceedings 507 (1), 129-134, 2000
322000
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Articles 1–20