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Stefan Schrunner
Stefan Schrunner
Verified email at infineon.com
Title
Cited by
Cited by
Year
Rent—repeated elastic net technique for feature selection
A Jenul, S Schrunner, KH Liland, UG Indahl, CM Futsæther, O Tomic
IEEE Access 9, 152333-152346, 2021
332021
Feature extraction from analog wafermaps: A comparison of classical image processing and a deep generative model
T Santos, S Schrunner, BC Geiger, O Pfeiler, A Zernig, A Kaestner, R Kern
IEEE Transactions on Semiconductor Manufacturing 32 (2), 190-198, 2019
272019
RENT: A Python package for repeated elastic net feature selection
A Jenul, S Schrunner, BN Huynh, O Tomic
Journal of Open Source Software 6 (63), 3323, 2021
142021
A comparison of supervised approaches for process pattern recognition in analog semiconductor wafer test data
S Schrunner, O Bluder, A Zernig, A Kaestner, R Kern
2018 17th IEEE International Conference on Machine Learning and Applications …, 2018
122018
A generative semi-supervised classifier for datasets with unknown classes
S Schrunner, BC Geiger, A Zernig, R Kern
Proceedings of the 35th Annual ACM Symposium on Applied Computing, 1066-1074, 2020
102020
A user-guided Bayesian framework for ensemble feature selection in life science applications (UBayFS)
A Jenul, S Schrunner, J Pilz, O Tomic
Machine Learning, 2022
92022
An explicit solution for image restoration using Markov random fields
M Pleschberger, S Schrunner, J Pilz
Journal of Signal Processing Systems 92 (2), 257-267, 2020
92020
A health factor for process patterns enhancing semiconductor manufacturing by pattern recognition in analog wafermaps
S Schrunner, A Jenul, M Scheiber, A Zernig, A Kaestner, R Kern
2019 IEEE International Conference on Systems, Man and Cybernetics (SMC …, 2019
62019
Pattern Recognition in Analog Wafer Test Data - A Health Factor for Process Patterns
S Schrunner
Graz University of Technology, 2019
52019
Markov random fields for pattern extraction in analog wafer test data
S Schrunner, O Bluder, A Zernig, A Kaestner, R Kern
2017 Seventh International Conference on Image Processing Theory, Tools and …, 2017
52017
Simulated analog wafer test data for pattern recognition
M Pleschberger, M Scheiber, S Schrunner
Google Scholar Google Scholar Cross Ref Cross Ref, 2019
42019
UBayFS: An R package for user guided feature selection
A Jenul, S Schrunner
Journal of Open Source Software 8 (81), 4848, 2023
22023
Principal component-based image segmentation: a new approach to outline in vitro cell colonies
D Arous, S Schrunner, I Hanson, N Frederike Jeppesen Edin, E Malinen
Computer Methods in Biomechanics and Biomedical Engineering: Imaging …, 2023
22023
Ranking Feature-Block Importance in Artificial Multiblock Neural Networks
A Jenul, S Schrunner, BN Huynh, R Helin, CM Futsæther, KH Liland, ...
International Conference on Artificial Neural Networks, 163-175, 2022
22022
Learning from limited temporal data: Dynamically sparse historical functional linear models with applications to Earth science
J Janssen, S Meng, A Haris, S Schrunner, J Cao, WJ Welch, N Kunz, ...
arXiv preprint arXiv:2303.06501, 2023
12023
Multiblock-Networks: A Neural Network Analog to Component Based Methods for Multi-Source Data
A Jenul, S Schrunner, R Helin, KH Liland, CM Futsaether, O Tomic
arXiv preprint arXiv:2109.10279, 2021
12021
Novel ensemble feature selection techniques applied to high-grade gastroenteropancreatic neuroendocrine neoplasms for the prediction of survival
A Jenul, HL Stokmo, S Schrunner, GO Hjortland, ME Revheim, O Tomic
Computer Methods and Programs in Biomedicine 244, 107934, 2024
2024
A Gaussian Sliding Windows Regression Model for Hydrological Inference
S Schrunner, J Janssen, A Jenul, J Cao, AA Ameli, WJ Welch
arXiv preprint arXiv:2306.00453, 2023
2023
Towards Understanding the Survival of Patients with High-Grade Gastroenteropancreatic Neuroendocrine Neoplasms: An Investigation of Ensemble Feature Selection in the Prediction …
A Jenul, HL Stokmo, S Schrunner, ME Revheim, GO Hjortland, O Tomic
arXiv preprint arXiv:2302.10106, 2023
2023
Component Based Pre-filtering of Noisy Data for Improved Tsetlin Machine Modelling
A Jenul, B Bhattarai, KH Liland, L Jiao, S Schrunner, C Futsaether, ...
2022 International Symposium on the Tsetlin Machine (ISTM), 57-64, 2022
2022
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