Daniel Holcomb
Daniel Holcomb
Assistant Professor, University of Massachusetts
Bestätigte E-Mail-Adresse bei engin.umass.edu - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Power-up SRAM state as an identifying fingerprint and source of true random numbers
DE Holcomb, WP Burleson, K Fu
IEEE Transactions on Computers 58 (9), 1198-1210, 2008
6532008
Initial SRAM state as a fingerprint and source of true random numbers for RFID tags
DE Holcomb, WP Burleson, K Fu
Proceedings of the Conference on RFID Security 7 (2), 01, 2007
3462007
PUFs at a glance
U Rührmair, DE Holcomb
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
792014
Low-power sub-threshold design of secure physical unclonable functions
L Lin, D Holcomb, DK Krishnappa, P Shabadi, W Burleson
Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010
782010
Design as you see FIT: System-level soft error analysis of sequential circuits
D Holcomb, W Li, SA Seshia
2009 Design, Automation & Test in Europe Conference & Exhibition, 785-790, 2009
642009
TARDIS: Time and Remanence Decay in SRAM to Implement Secure Protocols on Embedded Devices without Clocks.
A Rahmati, M Salajegheh, DE Holcomb, J Sorber, WP Burleson, K Fu
USENIX Security Symposium, 221-236, 2012
632012
Trajectory model validation using newly developed altitude‐controlled balloons during the International Consortium for Atmospheric Research on Transport and Transformations …
EE Riddle, PB Voss, A Stohl, D Holcomb, D Maczka, K Washburn, ...
Journal of Geophysical Research: Atmospheres 111 (D23), 2006
512006
Physical Design Obfuscation of Hardware: A Comprehensive Investigation of Device-and Logic-Level Techniques
A Vijayakumar, VC Patil, DE Holcomb, C Paar, S Kundu
IEEE Transactions on Information Forensics and Security, 2016
502016
FPGA Side Channel Attacks without Physical Access
C Ramesh, SB Patil, SN Dhanuskodi, G Provelengios, S Pillement, ...
Field-Programmable Custom Computing Machines (FCCM), 2018 IEEE 26th Annual …, 2018
422018
Incremental SAT-based reverse engineering of camouflaged logic circuits
C Yu, X Zhang, D Liu, M Ciesielski, D Holcomb
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
422017
Oracle-Guided Incremental SAT Solving to Reverse Engineer Camouflaged Logic Circuits
D Liu, C Yu, X Zhang, D Holcomb
Proceedings of Design Automation and Test in Europe (DATE '16), 433-438, 2016
402016
Reliable physical unclonable functions using data retention voltage of SRAM cells
X Xu, A Rahmati, DE Holcomb, K Fu, W Burleson
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
392015
Security Evaluation and Enhancement of Bistable Ring PUFs
X Xu, U Rührmair, DE Holcomb, W Burleson
International Workshop on Radio Frequency Identification: Security and …, 2015
372015
Bitline PUF: building native challenge-response PUF capability into any SRAM
DE Holcomb, K Fu
International Workshop on Cryptographic Hardware and Embedded Systems, 510-526, 2014
362014
DRV-Fingerprinting: using data retention voltage of SRAM cells for chip identification
DE Holcomb, A Rahmati, M Salajegheh, WP Burleson, K Fu
International Workshop on Radio Frequency Identification: Security and …, 2012
362012
Probable cause: the deanonymizing effects of approximate DRAM
A Rahmati, M Hicks, DE Holcomb, K Fu
Proceedings of the 42nd Annual International Symposium on Computer …, 2015
312015
Persistent Clocks for Batteryless Sensing Devices
J HESTER, N TOBIAS, A RAHMATI, L SITANAYAH, D HOLCOMB, K FU, ...
ACM Transactions on Embedded Computing Systems (TECS) 15 (4), 77:1--77:28, 2016
282016
Using statistical models to improve the reliability of delay-based PUFs
X Xu, W Burleson, DE Holcomb
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 547-552, 2016
272016
A Design Methodology for Stealthy Parametric Trojans and Its Application to Bug Attacks
S Ghandali, GT Becker, D Holcomb, C Paar
Cryptographic Hardware and Embedded Systems–CHES 2016, 2016
242016
Algorithms for Green Buildings: Learning-Based Techniques for Energy Prediction and Fault Diagnosis
D Holcomb, W Li, SA Seshia
Google Scholar, UCB/EECS-2009-138, 2009
212009
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