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Zirong Peng
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Atomic-scale grain boundary engineering to overcome hot-cracking in additively-manufactured superalloys
P Kontis, E Chauvet, Z Peng, J He, AK da Silva, D Raabe, C Tassin, ...
Acta Materialia 177, 209-221, 2019
1982019
Effect of ruthenium on the precipitation of topologically close packed phases in Ni-based superalloys of 3rd and 4th generation
K Matuszewski, R Rettig, H Matysiak, Z Peng, I Povstugar, P Choi, ...
Acta materialia 95, 274-283, 2015
1462015
Phase nucleation through confined spinodal fluctuations at crystal defects evidenced in Fe-Mn alloys
A Kwiatkowski da Silva, D Ponge, Z Peng, G Inden, Y Lu, A Breen, B Gault, ...
Nature communications 9 (1), 1137, 2018
1252018
Segregation-driven grain boundary spinodal decomposition as a pathway for phase nucleation in a high-entropy alloy
L Li, Z Li, AK da Silva, Z Peng, H Zhao, B Gault, D Raabe
Acta Materialia 178, 1-9, 2019
1242019
On the effect of Re addition on microstructural evolution of a CoNi-based superalloy
P Pandey, AK Sawant, B Nithin, Z Peng, SK Makineni, B Gault, ...
Acta Materialia 168, 37-51, 2019
812019
On the detection of multiple events in atom probe tomography
Z Peng, F Vurpillot, PP Choi, Y Li, D Raabe, B Gault
Ultramicroscopy 189, 54-60, 2018
772018
Effects of Ru on elemental partitioning and precipitation of topologically close-packed phases in Ni-based superalloys
Z Peng, I Povstugar, K Matuszewski, R Rettig, R Singer, A Kostka, ...
Scripta Materialia 101, 44-47, 2015
552015
Reflections on the analysis of interfaces and grain boundaries by atom probe tomography
BM Jenkins, F Danoix, M Gouné, PAJ Bagot, Z Peng, MP Moody, B Gault
Microscopy and Microanalysis 26 (2), 247-257, 2020
422020
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations
B Gault, AJ Breen, Y Chang, J He, EA Jägle, P Kontis, P Kürnsteiner, ...
Journal of Materials Research 33 (23), 4018-4030, 2018
402018
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations
B Gault, AJ Breen, Y Chang, J He, EA Jägle, P Kontis, P Kürnsteiner, ...
Journal of Materials Research 33 (23), 4018-4030, 2018
402018
Atom probe tomography analysis of the reference zircon gj-1: An interlaboratory study
F Exertier, A La Fontaine, C Corcoran, S Piazolo, E Belousova, Z Peng, ...
Chemical Geology 495, 27-35, 2018
372018
Unraveling the Metastability of Cn2+ (n = 2–4) Clusters
Z Peng, D Zanuttini, B Gervais, E Jacquet, I Blum, PP Choi, D Raabe, ...
The journal of physical chemistry letters 10 (3), 581-588, 2019
312019
Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide
Z Peng, M Rohwerder, PP Choi, B Gault, T Meiners, M Friedrichs, ...
Corrosion Science 120, 1-13, 2017
262017
Evaluation of analysis conditions for laser-pulsed atom probe tomography: Example of cemented tungsten carbide
Z Peng, PP Choi, B Gault, D Raabe
Microscopy and Microanalysis 23 (2), 431-442, 2017
262017
PtIr protective coating system for precision glass molding tools: design, evaluation and mechanism of degradation
M Friedrichs, Z Peng, T Grunwald, M Rohwerder, B Gault, T Bergs
Surface and Coatings Technology 385, 125378, 2020
232020
An automated computational approach for complete in-plane compositional interface analysis by atom probe tomography
Z Peng, Y Lu, C Hatzoglou, A Kwiatkowski da Silva, F Vurpillot, D Ponge, ...
Microscopy and Microanalysis 25 (2), 389-400, 2019
232019
Quantitative analysis of grain boundary diffusion, segregation and precipitation at a sub-nanometer scale
Z Peng, T Meiners, Y Lu, CH Liebscher, A Kostka, D Raabe, B Gault
Acta Materialia 225, 117522, 2022
182022
3D nanostructural characterisation of grain boundaries in atom probe data utilising machine learning methods
Y Wei, Z Peng, M Kühbach, A Breen, M Legros, M Larranaga, F Mompiou, ...
PLoS One 14 (11), e0225041, 2019
152019
Sulfur–induced embrittlement in high-purity, polycrystalline copper
T Meiners, Z Peng, B Gault, CH Liebscher, G Dehm
Acta Materialia 156, 64-75, 2018
142018
Variable chemical decoration of extended defects in Cu-poor thin films
T Schwarz, A Redinger, S Siebentritt, Z Peng, B Gault, D Raabe, PP Choi
Physical Review Materials 3 (3), 035402, 2019
82019
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