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Ilia Polian
Ilia Polian
University of Stuttgart
Bestätigte E-Mail-Adresse bei polian.de - Startseite
Titel
Zitiert von
Zitiert von
Jahr
A definition and classification of timing anomalies
J Reineke, B Wachter, S Thesing, R Wilhelm, I Polian, J Eisinger, ...
6th International Workshop on Worst-Case Execution Time Analysis (WCET'06), 2006
2762006
A family of logical fault models for reversible circuits
I Polian, T Fiehn, B Becker, JP Hayes
14th Asian Test Symposium (ATS'05), 422-427, 2005
1482005
Testing for missing-gate faults in reversible circuits
JP Hayes, I Polian, B Becker
13th Asian test symposium, 100-105, 2004
1362004
X-masking during logic BIST and its impact on defect coverage
Y Tang, HJ Wunderlich, H Vranken, F Hapke, M Wittke, P Engelke, ...
2004 International Conferce on Test, 442-451, 2004
1292004
Simulating resistive-bridging and stuck-at faults
P Engelke, I Polian, M Renovell, B Becker
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006
1032006
Parametric trojans for fault-injection attacks on cryptographic hardware
R Kumar, P Jovanovic, W Burleson, I Polian
2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, 18-28, 2014
822014
A fault attack on the LED block cipher
P Jovanovic, M Kreuzer, I Polian
Constructive Side-Channel Analysis and Secure Design: Third International …, 2012
822012
Adaptive voltage over-scaling for resilient applications
PK Krause, I Polian
2011 Design, Automation & Test in Europe, 1-6, 2011
802011
An analysis framework for transient-error tolerance
JP Hayes, I Polian, B Becker
25th IEEE VLSI Test Symposium (VTS'07), 249-255, 2007
782007
Power droop testing
I Polian, A Czutro, S Kundu, B Becker
2006 International Conference on Computer Design, 243-250, 2006
752006
Fault-tolerant, high-level quantum circuits: form, compilation and description
A Paler, I Polian, K Nemoto, SJ Devitt
Quantum Science and Technology 2 (2), 025003, 2017
712017
Analysis and optimization of fault-tolerant embedded systems with hardened processors
V Izosimov, I Polian, P Pop, P Eles, Z Peng
2009 Design, Automation & Test in Europe Conference & Exhibition, 682-687, 2009
712009
Selective hardening: Toward cost-effective error tolerance
I Polian, JP Hayes
IEEE Design & Test of Computers 28 (3), 54-63, 2010
662010
A simulator of small-delay faults caused by resistive-open defects
A Czutro, N Houarche, P Engelke, I Polian, M Comte, M Renovell, ...
2008 13th European Test Symposium, 113-118, 2008
662008
Small-delay-fault ATPG with waveform accuracy
M Sauer, A Czutro, I Polian, B Becker
Proceedings of the International Conference on Computer-Aided Design, 30-36, 2012
602012
Functional constraints vs. test compression in scan-based delay testing
I Polian, H Fujiwara
Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006
602006
Automatic test pattern generation for interconnect open defects
S Spinner, I Polian, P Engelke, B Becker, M Keim, WT Cheng
26th IEEE VLSI Test Symposium (vts 2008), 181-186, 2008
582008
Resistive bridge fault model evolution from conventional to ultra deep submicron
I Polian, P Engelke, B Becker, S Kundu, JM Galliere, M Renovell
23rd IEEE VLSI Test Symposium (VTS'05), 343-348, 2005
582005
Selective hardening in early design steps
CG Zoellin, HJ Wunderlich, I Polian, B Becker
2008 13th European test symposium, 185-190, 2008
532008
Modeling and mitigating transient errors in logic circuits
I Polian, JP Hayes, SM Reddy, B Becker
IEEE Transactions on Dependable and Secure Computing 8 (4), 537-547, 2011
522011
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