paolo bernardi
paolo bernardi
Verified email at polito.it - Homepage
Title
Cited by
Cited by
Year
Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs
M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ...
IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003
1422003
Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA
M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ...
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004
1162004
A new hybrid fault detection technique for systems-on-a-chip
P Bernardi, LMV Bolzani, M Rebaudengo, MS Reorda, FL Vargas, ...
IEEE transactions on Computers 55 (2), 185-198, 2006
912006
On the evaluation of SEU sensitiveness in SRAM-based FPGAs
P Bernardi, MS Reorda, L Sterpone, M Violante
Proceedings. 10th IEEE International On-Line Testing Symposium, 115-120, 2004
692004
Simulation-based analysis of SEU effects in SRAM-based FPGAs
M Violante, L Sterpone, M Ceschia, D Bortolato, P Bernardi, MS Reorda, ...
IEEE Transactions on Nuclear Science 51 (6), 3354-3359, 2004
582004
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.
D Appello, P Bernardi, A Fudoli, M Rebaudengo, MS Reorda, V Tancorre, ...
ITC, 379-385, 2003
472003
Development flow for on-line core self-test of automotive microcontrollers
P Bernardi, R Cantoro, S De Luca, E Sánchez, A Sansonetti
IEEE Transactions on Computers 65 (3), 744-754, 2015
392015
Agri-food traceability management using a RFID system with privacy protection
P Bernardi, C Demartini, F Gandino, B Montrucchio, M Rebaudengo, ...
21st International Conference on Advanced Information Networking and …, 2007
352007
An effective technique for the automatic generation of diagnosis-oriented programs for processor cores
P Bernardi, EES Sanchez, M Schillaci, G Squillero, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
342008
System-in-package testing: problems and solutions
D Appello, P Bernardi, M Grosso, MS Reorda
IEEE Design & Test of Computers 23 (3), 203-211, 2006
332006
On-line functionally untestable fault identification in embedded processor cores
P Bernardi, M Bonazza, E Sánchez, MS Reorda, O Ballan
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
312013
An anti-counterfeit mechanism for the application layer in low-cost RFID devices
P Bernardi, F Gandino, F Lamberti, B Montrucchio, M Rebaudengo, ...
2008 4th European Conference on Circuits and Systems for Communications, 227-231, 2008
302008
Using infrastructure IPs to support SW-based self-test of processor cores
P Bernardi, M Rebaudengo, S Reorda
Fifth International Workshop on Microprocessor Test and Verification (MTV'04 …, 2004
292004
An effective technique for minimizing the cost of processor software-based diagnosis in SoCs
P Bernardi, E Sánchez, M Schillaci, G Squillero, MS Reorda
Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006
282006
Embedded memory diagnosis: An industrial workflow
D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ...
2006 IEEE International Test Conference, 1-9, 2006
272006
A pattern ordering algorithm for reducing the size of fault dictionaries
P Bernardi, M Grosso, M Rebaudengo, MS Reorda
24th IEEE VLSI Test Symposium, 6 pp.-391, 2006
272006
On-line software-based self-test of the address calculation unit in RISC processors
P Bernardi, L Ciganda, M de Carvalho, M Grosso, J Lagos-Benites, ...
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
252012
Fault grading of software-based self-test procedures for dependable automotive applications
P Bernardi, M Grosso, E Sánchez, O Ballan
2011 Design, Automation & Test in Europe, 1-2, 2011
242011
A programmable BIST for DRAM testing and diagnosis
P Bernardi, M Grosso, MS Reorda, Y Zhang
2010 IEEE International Test Conference, 1-10, 2010
242010
On the in-field functional testing of decode units in pipelined RISC processors
P Bernardi, R Cantoro, L Ciganda, E Sánchez, MS Reorda, S De Luca, ...
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014
232014
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