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Muhammad Awais Bin AltafLahore University of Management Sciences (LUMS)Verified email at lums.edu.pk
Seulki LeeSenior Researcher, imec The Netherlands/Holst CentreVerified email at imec.nl
Hyejung KimIntelVerified email at intel.com
Jeong Hoan ParkStaff Engineer, Samsung ElectronicsVerified email at samsung.com
Anantha ChandrakasanDean of Engineering, Massachusetts Institute of TechnologyVerified email at mit.edu
Dina R. El-DamakAssistant Professor, University of Science and Technology at Zewail CityVerified email at zewailcity.edu.eg
Tao TangPI, Zhejiang LabVerified email at zhejianglab.com
Wala SaadehAssistant Professor, Electrical Engineering Department, Lahore University of Management SciencesVerified email at lums.edu.pk
Ibrahim (Abe) M ElfadelProfessor, Khalifa University, Abu Dhabi, UAEVerified email at ku.ac.ae
Haneen AlsuradiPhD Candidate, Tandon School of Engineering, New York UniversityVerified email at nyu.edu
Kyomin SohnSamsung ElectronicsVerified email at samsung.com
Ng Kian AnnSingaporeVerified email at ieee.org
Liwei LinProfessor of Mechanical Engineering, University of California at BerkeleyVerified email at me.berkeley.edu
Yonatan KifleLinköping UniversityVerified email at liu.se
Massimo AliotoNational University of SingaporeVerified email at ieee.org
Nachiket DesaiResearch Scientist, Intel LabsVerified email at intel.com
Shih-Cheng YenNational University of SingaporeVerified email at nus.edu.sg
Benjamin E. EovinoUniversity of California, BerkeleyVerified email at berkeley.edu
Ghim Wei HoAssociate Professor, National University of SingaporeVerified email at nus.edu.sg
Hun-Seok KimUniversity of MichiganVerified email at umich.edu