| Temperature dependence of the force sensitivity of silicon cantilevers U Gysin, S Rast, P Ruff, E Meyer, DW Lee, P Vettiger, C Gerber Physical review B 69 (4), 045403, 2004 | 196 | 2004 |
| Suppression of electronic friction on Nb films in the superconducting state M Kisiel, E Gnecco, U Gysin, L Marot, S Rast, E Meyer Nature materials 10 (2), 119-122, 2011 | 175 | 2011 |
| Dynamics of damped cantilevers S Rast, C Wattinger, U Gysin, E Meyer Review of scientific instruments 71 (7), 2772-2775, 2000 | 100 | 2000 |
| The noise of cantilevers S Rast, C Wattinger, U Gysin, E Meyer Nanotechnology 11 (3), 169, 2000 | 94 | 2000 |
| Using higher flexural modes in non-contact force microscopy O Pfeiffer, C Loppacher, C Wattinger, M Bammerlin, U Gysin, ... Applied surface science 157 (4), 337-342, 2000 | 48 | 2000 |
| Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional … T Wirtz, Y Fleming, M Gerard, U Gysin, T Glatzel, E Meyer, U Wegmann, ... Review of Scientific Instruments 83 (6), 2012 | 39 | 2012 |
| Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene G Fessler, B Eren, U Gysin, T Glatzel, E Meyer Applied Physics Letters 104 (4), 2014 | 38 | 2014 |
| Combined SIMS‐SPM instrument for high sensitivity and high‐resolution elemental 3D analysis T Wirtz, Y Fleming, U Gysin, T Glatzel, U Wegmann, E Meyer, U Maier, ... Surface and interface analysis 45 (1), 513-516, 2013 | 37 | 2013 |
| Force microscopy experiments with ultrasensitive cantilevers S Rast, U Gysin, P Ruff, C Gerber, E Meyer, DW Lee Nanotechnology 17 (7), S189, 2006 | 31 | 2006 |
| Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of Structural Phase Transition M Kisiel, F Pellegrini, GE Santoro, M Samadashvili, R Pawlak, A Benassi, ... Physical review letters 115 (4), 046101, 2015 | 28 | 2015 |
| Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of Structural Phase Transition M Kisiel, F Pellegrini, GE Santoro, M Samadashvili, R Pawlak, A Benassi, ... Physical review letters 115 (4), 046101, 2015 | 28 | 2015 |
| Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy Y Fleming, T Wirtz, U Gysin, T Glatzel, U Wegmann, E Meyer, U Maier, ... Applied surface science 258 (4), 1322-1327, 2011 | 28 | 2011 |
| Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry U Gysin, S Rast, M Kisiel, C Werle, E Meyer Review of scientific instruments 82 (2), 2011 | 26 | 2011 |
| Mechanical dissipation via image potential states on a topological insulator surface D Yildiz, M Kisiel, U Gysin, O Gürlü, E Meyer Nature materials 18 (11), 1201-1206, 2019 | 23 | 2019 |
| Mechanical dissipation from charge and spin transitions in oxygen-deficient SrTiO3 surfaces M Kisiel, OO Brovko, D Yildiz, R Pawlak, U Gysin, E Tosatti, E Meyer Nature communications 9 (1), 2946, 2018 | 23 | 2018 |
| Magnetic properties of nanomagnetic and biomagnetic systems analyzed using cantilever magnetometry U Gysin, S Rast, A Aste, T Speliotis, C Werle, E Meyer Nanotechnology 22 (28), 285715, 2011 | 22 | 2011 |
| Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants DW Lee, JH Kang, U Gysin, S Rast, E Meyer, M Despont, C Gerber Journal of micromechanics and microengineering 15 (11), 2179, 2005 | 16 | 2005 |
| Dopant imaging of power semiconductor device cross sections U Gysin, E Meyer, T Glatzel, G Günzburger, HR Rossmann, TA Jung, ... Microelectronic Engineering 160, 18-21, 2016 | 15 | 2016 |
| Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy B Eren, U Gysin, L Marot, T Glatzel, R Steiner, E Meyer Applied Physics Letters 108 (4), 2016 | 12 | 2016 |
| Kelvin probe force microscopy for material characterization T Glatzel, U Gysin, E Meyer Microscopy 71 (Supplement_1), i165-i173, 2022 | 11 | 2022 |
