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Kisub Kim
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FaCoY: a code-to-code search engine
K Kim, D Kim, TF Bissyandé, E Choi, L Li, J Klein, YL Traon
Proceedings of the 40th International Conference on Software Engineering …, 2018
1552018
On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs
K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ...
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
1442020
Learning to spot and refactor inconsistent method names
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019
1292019
LSRepair: Live search of fix ingredients for automated program repair
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018
762018
Augmenting and structuring user queries to support efficient free-form code search
R Sirres, TF Bissyandé, D Kim, D Lo, J Klein, K Kim, YL Traon
Proceedings of the 40th international conference on software engineering …, 2018
742018
Where were the repair ingredients for defects4j bugs? exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems
D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ...
Empirical Software Engineering 26, 1-33, 2021
222021
Learning to spot and refactor inconsistent method names. In 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE)
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
IEEE, 1ś12, 2019
152019
Representation learning for stack overflow posts: How far are we?
J He, X Zhou, B Xu, T Zhang, K Kim, Z Yang, F Thung, IC Irsan, D Lo
ACM Transactions on Software Engineering and Methodology 33 (3), 1-24, 2024
142024
LSRepair: Live search of fix ingredients for automated program repair. In 2018 25th Asia-Pacific Software Engineering Conference (APSEC)
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
IEEE, 2018
142018
Exploring parameter-efficient fine-tuning techniques for code generation with large language models
M Weyssow, X Zhou, K Kim, D Lo, H Sahraoui
arXiv preprint arXiv:2308.10462, 2023
132023
Generation-based code review automation: how far are weƒ
X Zhou, K Kim, B Xu, DG Han, J He, D Lo
2023 IEEE/ACM 31st International Conference on Program Comprehension (ICPC …, 2023
112023
The devil is in the tails: How long-tailed code distributions impact large language models
X Zhout, K Kim, B Xu, J Liu, DG Han, D Lo
2023 38th IEEE/ACM International Conference on Automated Software …, 2023
82023
Patchzero: Zero-shot automatic patch correctness assessment
X Zhou, B Xu, K Kim, DG Han, T Le-Cong, J He, B Le, D Lo
arXiv preprint arXiv:2303.00202, 2023
82023
On the usage of continual learning for out-of-distribution generalization in pre-trained language models of code
M Weyssow, X Zhou, K Kim, D Lo, H Sahraoui
Proceedings of the 31st ACM Joint European Software Engineering Conference …, 2023
52023
DigBug—Pre/post-processing operator selection for accurate bug localization
K Kim, S Ghatpande, K Liu, A Koyuncu, D Kim, TF Bissyandé, J Klein, ...
Journal of Systems and Software 189, 111300, 2022
52022
Dexbert: effective, task-agnostic and fine-grained representation learning of Android bytecode
T Sun, K Allix, K Kim, X Zhou, D Kim, D Lo, TF Bissyandé, J Klein
IEEE Transactions on Software Engineering, 2023
42023
Multi-modal api recommendation
IC Irsan, T Zhang, F Thung, K Kim, D Lo
2023 IEEE International Conference on Software Analysis, Evolution and …, 2023
42023
Collaborative agents for software engineering
D Tang, Z Chen, K Kim, Y Song, H Tian, S Ezzini, Y Huang, ...
arXiv preprint arXiv:2402.02172, 2024
32024
Just-in-Time Security Patch Detection--LLM At the Rescue for Data Augmentation
X Tang, Z Chen, K Kim, H Tian, S Ezzini, J Klein
arXiv preprint arXiv:2312.01241, 2023
32023
Are we ready to embrace generative AI for software Q&A?
B Xu, TD Nguyen, T Le-Cong, T Hoang, J Liu, K Kim, C Gong, C Niu, ...
2023 38th IEEE/ACM International Conference on Automated Software …, 2023
32023
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